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Showing 1–3 of 3 results for author: Guillous, S

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  1. arXiv:2412.09374  [pdf, other

    cond-mat.mtrl-sci physics.ins-det

    Molten salt ion source using glass capillaries as emitter

    Authors: M. Leger, E. Giglio, S. Guillous, A. Houel

    Abstract: A proof of concept of an ion source using a molten salt mixture rich in Cs and O ions, able to emit an ion current both in positive and negative polarities, is presented. Similar to liquid metal ion sources, the ions of the salt are emitted by field evaporation from a Taylor cone formed under the influence of an intense electric field. In contrast to an "open" source design in which the conducting… ▽ More

    Submitted 9 April, 2025; v1 submitted 12 December, 2024; originally announced December 2024.

  2. arXiv:1310.6233  [pdf, other

    cond-mat.mtrl-sci

    Damage in graphene due to electronic excitation induced by highly charged ions

    Authors: J. Hopster, R. Kozubek, B. Ban-d'Etat, S. Guillous, H. Lebius, M. Schleberger

    Abstract: Graphene is expected to be rather insensitive to ionizing particle radiation. We demonstrate that single layers of exfoliated graphene sustain significant damage from irradiation with slow highly charged ions. We have investigated the ion induced changes of graphene after irradiation with highly charged ions of different charge states (q = 28-42) and kinetic energies E_kin = 150-450 keV. Atomic fo… ▽ More

    Submitted 23 October, 2013; originally announced October 2013.

  3. arXiv:1112.2832  [pdf

    cond-mat.mtrl-sci

    Online in-situ X-ray diffraction setup for structural modification studies during swift heavy ion irradiation

    Authors: C. Grygiel, H. Lebius, S. Bouffard, A. Quentin, J. M. Ramillon, T. Madi, S. Guillous, T. Been, P. Guinement, D. Lelievre, I. Monnet

    Abstract: The high energy density of electronic excitations due to the impact of swift heavy ions can induce structural modifications in materials. We present a X-ray diffractometer called ALIX, which has been set up at the low-energy IRRSUD beamline of the GANIL facility, to allow the study of structural modification kinetics as a function of the ion fluence. The X-ray setup has been modified and optimized… ▽ More

    Submitted 6 January, 2012; v1 submitted 13 December, 2011; originally announced December 2011.

    Comments: 12 pages, 8 figures, Accepted to Review of Scientific Instruments

    Journal ref: Rev. Sci. Instrum. Volume 83, Issue 1, 013902 (2012)