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Presence of a Spatially Varying Electric Field at Lipid-Water Interface with Na/K ratio in Water
Authors:
Biplab Bawali,
Shubhadip Chowdhury,
Smita Mukherjee,
Angelo Giglia,
Nicola Mahne,
Stefano Nannarone,
Mrinmay Mukhopadhyay,
Jayashree Saha,
Alokmay Datta
Abstract:
The ion-lipid interface in Langmuir monolayers of Dipalmitoylphosphatidylcholine (DPPC) on pure water and 10 mM solutions of Na+ and K+ at different [K+]/[Na+] (a), atom/atom ratios, were studied initially by Surface Pressure (p) versus Specific Molecular Area (A) isotherms. The values of a were chosen as 0 (no K+), 0.43 ([K+]:[Na+] = 30:70) and 1.0 ([K+]:[Na+] = 50:50) These monolayers were studi…
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The ion-lipid interface in Langmuir monolayers of Dipalmitoylphosphatidylcholine (DPPC) on pure water and 10 mM solutions of Na+ and K+ at different [K+]/[Na+] (a), atom/atom ratios, were studied initially by Surface Pressure (p) versus Specific Molecular Area (A) isotherms. The values of a were chosen as 0 (no K+), 0.43 ([K+]:[Na+] = 30:70) and 1.0 ([K+]:[Na+] = 50:50) These monolayers were studied through X-Ray Reflectivity (XRR) and Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy at the O K-edge. The two-dimensional rigidity of the monolayer was found to increase with Na+ ions with respect to the pristine monolayer but fall drastically and non-linearly below the pristine value with introduction of the K+ ions, as a was increased. Analysis of the XRR profiles provided the thickness, average electron density (aed) and the interfacial roughness of the phosphatidylcholine head group and the two hydrocarbon tails of the monolayers on Si (001), from which the angle (f) between the head and the tails was determined. This was also follow the same as former one. From NEXAFS, it was found that a linear increase in the cation ratio towards K led to a nonlinear variation in the P=O bond energy and a weakening of the P-O bond energy, the latter becoming more pronounced with K ions, consistent with Fajans rule. Also a split in the C=O p-bond peak was observed at a = 1.0. These results cannot be explained with the model of a uniform electric field due to the cations, which would fall linearly with increase in the K+ proportion, and rather suggest a structured field due a spatial variation in charge density in an interfacial layer of high ion concentration assembled by the counterionic attraction of the phosphatidylcholine head groups. Our results have important implications for the cell membrane, where such mixtures at high concentrations constitute the norm.
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Submitted 27 September, 2024;
originally announced September 2024.
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X-ray fluorescence induced by standing waves in the grazing-incidence and grazing-exit modes: study of the Mg--Co--Zr system
Authors:
Yuchun Tu,
Yanyan Yuan,
Karine Le Guen,
Jean-Michel André,
Jingtao Zhu,
Zhanshan Wang,
Françoise Bridou,
Angelo Giglia,
Philippe Jonnard
Abstract:
We present the characterization of Mg-Co-Zr tri-layer stacks by using x-ray fluorescence induced by x-ray standing waves, both in the grazing incidence (GI) and grazing exit (GE) modes. The introduction of a slit in the direction of the detector improves the angular resolution by a factor 2 and significantly the sensitivity of the technique for the chemical characterization of the buried interface…
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We present the characterization of Mg-Co-Zr tri-layer stacks by using x-ray fluorescence induced by x-ray standing waves, both in the grazing incidence (GI) and grazing exit (GE) modes. The introduction of a slit in the direction of the detector improves the angular resolution by a factor 2 and significantly the sensitivity of the technique for the chemical characterization of the buried interfaces. By observing the intensity variations of the Mg Kalpha and Co Lalpha characteristic emissions as a function of the incident (GI mode) or detection (GE mode) angle, we show that the interfaces of the Si/[Mg/Co/Zr] x30 multilayer are abrupt, whereas in the Si/[Mg/Zr/Co] x30 multilayer a strong intermixing occurs at the Co-on-Zr interfaces. The explanation of this opposite behaviour of the Co-on-Zr and Zr-on-Co interfacesis given by the calculation of the mixing enthalpies of the Co-Mg, Co-Zr and Mg-Zr systems, which shows that the Co-Zr system presents anegative value and the two others positive values. Together with the difference of the surface free energies of Zr and Co, this leads us to consider the Mg/Zr/Co system as aMg/Co x Zr y bi-layer stack, with x/y estimated around 3.5.
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Submitted 5 November, 2015;
originally announced November 2015.
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Determination of the magnetization profile of Co/Mg periodic multilayers by magneto-optic Kerr effect and X-ray magnetic resonant reflectivity
Authors:
Philippe Jonnard,
K. Le Guen,
Jean-Michel André,
Renaud Delaunay,
N. Mahne,
Angelo Giglia,
S. Nannarone,
A. Verna,
Z. -S. Wang,
J. -T. Zhu,
S. -K. Zhou
Abstract:
The resonant magnetic reflectivity of Co/Mg multilayers around the Co L2,3 absorption edge is simulated then measured on a specifically designed sample. The dichroic signal is obtained when making the difference between the two reflectivities measured with the magnetic field applied in two opposite directions parallel to the sample surface. The simulations show that the existence of magnetic dead…
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The resonant magnetic reflectivity of Co/Mg multilayers around the Co L2,3 absorption edge is simulated then measured on a specifically designed sample. The dichroic signal is obtained when making the difference between the two reflectivities measured with the magnetic field applied in two opposite directions parallel to the sample surface. The simulations show that the existence of magnetic dead layers at the interfaces between the Co and Mg layers leads to an important increase of the dichroic signal measured in the vicinity of the third Bragg peak that otherwise should be negligible. The measurements are in agreement with the model introducing 0.25 nm thick dead layers. This is attributed to the Co atoms in contact with the Mg layers and thus we conclude that the Co-Mg interfaces are abrupt from the magnetic point of view.
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Submitted 18 March, 2013;
originally announced March 2013.
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Analysis of periodic Mo/Si multilayers: influence of the Mo thickness
Authors:
H. Maury,
Jean-Michel André,
Karine Le Guen,
N. Mahne,
Angela Giglia,
S. Nannarone,
Françoise Bridou,
Franck Delmotte,
Philippe Jonnard
Abstract:
A set of Mo/Si periodic multilayers is studied by non destructive analysis methods. The thickness of the Si layers is 5 nm while the thickness of the Mo layers changes from one multilayer to another, from 2 to 4 nm. This enables us to probe the effect of the transition between the amorphous to crystalline state of the Mo layers near the interfaces with Si on the optical performances of the multila…
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A set of Mo/Si periodic multilayers is studied by non destructive analysis methods. The thickness of the Si layers is 5 nm while the thickness of the Mo layers changes from one multilayer to another, from 2 to 4 nm. This enables us to probe the effect of the transition between the amorphous to crystalline state of the Mo layers near the interfaces with Si on the optical performances of the multilayers. This transition results in the variation of the refractive index (density variation) of the Mo layers, as observed by x-ray reflectivity (XRR) at a wavelength of 0.154 nm. Combining x-ray emission spectroscopy and XRR, the parameters (composition, thickness and roughness) of the interfacial layers formed by the interaction between the Mo and Si layers are determined. However, these parameters do not evolve significantly as a function of the Mo thickness. It is observed by diffuse scattering at 1.33 nm that the lateral correlation length of the roughness strongly decreases when the Mo thickness goes from 2 to 3 nm. This is due to the development of Mo crystallites parallel to the multilayer surface.
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Submitted 6 December, 2012;
originally announced December 2012.
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Investigation of the thermal stability of Mg/Co periodic multilayers for EUV applications
Authors:
M. -H. Hu,
K. Le Guen,
Jean-Michel André,
S. -K. Zhou,
H. -C. Li,
J. -T. Zhu,
Z. -S. Wang,
C. Meny,
N. Mahne,
Angela Giglia,
S. Nannarone,
I. Esteve,
M. Walls,
Philippe Jonnard
Abstract:
We present the results of the characterization of Mg/Co periodic multilayers and their thermal stability for the EUV range. The annealing study is performed up to a temperature of 400\degree C. Images obtained by scanning transmission electron microscopy and electron energy loss spectroscopy clearly show the good quality of the multilayer structure. The measurements of the EUV reflectivity around…
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We present the results of the characterization of Mg/Co periodic multilayers and their thermal stability for the EUV range. The annealing study is performed up to a temperature of 400\degree C. Images obtained by scanning transmission electron microscopy and electron energy loss spectroscopy clearly show the good quality of the multilayer structure. The measurements of the EUV reflectivity around 25 nm (~49 eV) indicate that the reflectivity decreases when the annealing temperature increases above 300\degreeC. X-ray emission spectroscopy is performed to determine the chemical state of the Mg atoms within the Mg/Co multilayer. Nuclear magnetic resonance used to determine the chemical state of the Co atoms and scanning electron microscopy images of cross sections of the Mg/Co multilayers reveal changes in the morphology of the stack from an annealing temperature of 305\degreee;C. This explains the observed reflectivity loss.
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Submitted 9 February, 2012; v1 submitted 6 December, 2011;
originally announced December 2011.
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Introduction of Zr in nanometric periodic Mg/Co multilayers
Authors:
K. Le Guen,
M. -H. Hu,
J. -M. André,
Philippe Jonnard,
S. -K. Zhou,
H. -C. Li,
J. -T. Zhu,
Z. -S. Wang,
N. Mahne,
Angela Giglia,
S. Nannarone
Abstract:
We study the introduction of a third material, namely Zr, within a nanometric periodic Mg/Co structure designed to work as optical component in the extreme UV (EUV) spectral range. Mg/Co, Mg/Zr/Co, Mg/Co/Zr and Mg/Zr/Co/Zr multilayers are designed, then characterized in terms of structural quality and optical performances through X-ray and EUV reflectometry measurements respectively. For the Mg/Co…
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We study the introduction of a third material, namely Zr, within a nanometric periodic Mg/Co structure designed to work as optical component in the extreme UV (EUV) spectral range. Mg/Co, Mg/Zr/Co, Mg/Co/Zr and Mg/Zr/Co/Zr multilayers are designed, then characterized in terms of structural quality and optical performances through X-ray and EUV reflectometry measurements respectively. For the Mg/Co/Zr structure, the reflectance value is equal to 50% at 25.1 nm and 45deg of grazing incidence and reaches 51.3% upon annealing at 200deg C. Measured EUV reflectivity values of tri-layered systems are discussed in terms of material order within a period and compared to the predictions of the theoretical model of Larruquert. Possible applications are pointed out.
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Submitted 19 November, 2011;
originally announced November 2011.
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Measuring magnetic profiles at manganite surfaces with monolayer resolution
Authors:
A. Verna,
B. A. Davidson,
Y. Szeto,
A. Yu. Petrov,
A. Mirone,
A. Giglia,
N. Mahne,
S. Nannarone
Abstract:
The performance of manganite-based magnetic tunnel junctions (MTJs) has suffered from reduced magnetization present at the junction interfaces that is ultimately responsible for the spin polarization of injected currents; this behavior has been attributed to a magnetic "dead layer" that typically extends a few unit cells into the manganite. X-ray magnetic scattering in resonant conditions (XRMS)…
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The performance of manganite-based magnetic tunnel junctions (MTJs) has suffered from reduced magnetization present at the junction interfaces that is ultimately responsible for the spin polarization of injected currents; this behavior has been attributed to a magnetic "dead layer" that typically extends a few unit cells into the manganite. X-ray magnetic scattering in resonant conditions (XRMS) is one of the most innovative and effective techniques to extract surface or interfacial magnetization profiles with subnanometer resolution, and has only recently been applied to oxide heterostructures. Here we present our approach to characterizing the surface and interfacial magnetization of such heterostructures using the XRMS technique, conducted at the BEAR beamline (Elettra synchrotron, Trieste). Measurements were carried out in specular reflectivity geometry, switching the left/right elliptical polarization of light as well the magnetization direction in the scattering plane. Spectra were collected across the Mn L2,3 edge for at least four different grazing angles in order to better analyse the interference phenomena. The resulting reflectivity spectra have been carefully fit to obtain the magnetization profiles, minimizing the number of free parameters as much as possible. Optical constants of the samples (real and imaginary part of the refractive index) in the interested frequency range are obtained through absorption measurements in two magnetization states and subsequent Kramers-Kronig transformation, allowing quantitative fits of the magnetization profile at different temperatures. We apply this method to the study of air-exposed surfaces of epitaxial La2/3Sr1/3MnO3 (001) films grown on SrTiO3 (001) substrates.
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Submitted 19 May, 2009;
originally announced May 2009.
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A Nexafs Study of Nitric Oxide Layers Adsorbed from a nitrite Solution onto a Pt(111) Surface
Authors:
M. Pedio,
E. Casero,
S. Nannarone,
A. Giglia,
N. Mahne,
K. Hayakawa,
M. Benfatto,
K. Hatada,
R. Felici,
J. I. Cerda',
C. Alonso,
J. A. Martin-Gago
Abstract:
NO molecules adsorbed on a Pt(111) surface from dipping in an acidic nitrite solution are studied by near edge X-ray absorption fine structure spectroscopy (NEXAFS), X-ray photoelectron spectroscopy (XPS), low energy electron diffraction (LEED) and scanning tunnelling microscopy (STM) techniques. LEED patterns and STM images show that no long range ordered structures are formed after NO adsorpti…
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NO molecules adsorbed on a Pt(111) surface from dipping in an acidic nitrite solution are studied by near edge X-ray absorption fine structure spectroscopy (NEXAFS), X-ray photoelectron spectroscopy (XPS), low energy electron diffraction (LEED) and scanning tunnelling microscopy (STM) techniques. LEED patterns and STM images show that no long range ordered structures are formed after NO adsorption on a Pt(111) surface. Although the total NO coverage is very low, spectroscopic features in N K-edge and O K-edge absorption spectra have been singled out and related to the different species induced by this preparation method. From these measurements it is concluded that the NO molecule is adsorbed trough the N atom in an upright conformation. The maximum saturation coverage is about 0.3 monolayers, and although nitric oxide is the major component, nitrite and nitrogen species are slightly co-adsorbed on the surface. The results obtained from this study are compared with those previously reported in the literature for NO adsorbed on Pt(111) under UHV conditions.
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Submitted 12 March, 2008;
originally announced March 2008.
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Confinement Induced Polarization effects in Valence and Inner-shell Spectra of Atactic Polystyrene
Authors:
Sudeshna Chattopadhyay,
A. Datta,
A. Giglia,
N. Mahne,
S. Nannarone
Abstract:
Vacuum ultraviolet (VUV) transmission spectra show a clear polarization effect in pi electronic transition in spin coated atactic polystyrene (aPS) films of thickness below 4Rg, where Rg (~20.4nm) is the radius of gyration of the polymer. This transition associated with pendant benzene rings in polystyrene. The polarization effect clearly indicates pendant benzene ring alignment on a macroscopic…
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Vacuum ultraviolet (VUV) transmission spectra show a clear polarization effect in pi electronic transition in spin coated atactic polystyrene (aPS) films of thickness below 4Rg, where Rg (~20.4nm) is the radius of gyration of the polymer. This transition associated with pendant benzene rings in polystyrene. The polarization effect clearly indicates pendant benzene ring alignment on a macroscopic scale. Study of core electron (1s) transition through near edge x-ray absorption fine structure (NEXAFS) spectroscopy confirms the ordering and shows that the rings are oriented towards out-of-plane direction with a tilt angle ~63 degree with the sample plane, which is consistent with the observed in-plane (sample surface) VUV polarization. These results indicate the transition of a common polymer, like polystyrene, inherently disordered in the bulk, to an orientationally ordered phase under a certain degree of confinement.
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Submitted 18 September, 2007; v1 submitted 17 September, 2007;
originally announced September 2007.
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Nanoconfined Polystyrene: A New Phase
Authors:
Sudeshna Chattopadhyay,
Alokmay Datta,
Avijit Das,
Angelo Giglia,
Stefano Nannarone,
Nicola Mahne
Abstract:
Transverse layering of molecular gyration spheres in spin-coated atactic polystyrene ($aPS$) films, for film thickness $R \leq$ 4$R_g$ ($R_g$ = unperturbed gyration radius), causes an increase in free energy that does not follow the $(R_g/R)^{-2}$ dependence of planar confinement and is explained by invoking a fixed-range, repulsive, modified Pöschl-Teller intermolecular potential, its strength…
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Transverse layering of molecular gyration spheres in spin-coated atactic polystyrene ($aPS$) films, for film thickness $R \leq$ 4$R_g$ ($R_g$ = unperturbed gyration radius), causes an increase in free energy that does not follow the $(R_g/R)^{-2}$ dependence of planar confinement and is explained by invoking a fixed-range, repulsive, modified Pöschl-Teller intermolecular potential, its strength decreasing with increase in $R$. Vacuum ultraviolet spectroscopy reveals a change in 'physical dimers' of adjacent pendant benzene rings of $aPS$ from 'oblique' to 'head-to-tail' configuration as film thickness goes from 9$R_{g}$ to 2$R_{g}$. This reduces cohesion by reducing dimer dipole moment. Thus a new phase of $aPS$, the nanoconfined phase, ordered but with lower cohesion than bulk, is formed.
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Submitted 5 October, 2006;
originally announced October 2006.
