Origin of Pressure-Induced Structural Instability in CsPbX$_3$ Photovoltaic Perovskites
Authors:
Sizhan Liu,
Sandun Amarasinghe,
Mo Li,
Stella Chariton,
Vitali Prakapenka,
Sanjit K. Ghose,
Yong Yan,
Joshua Young,
Trevor A. Tyson
Abstract:
Under external stimuli, lead halide perovskites exhibit large atomic fluctuations, impacting optical and electron transport properties that affect device performance in operational settings. However, a thorough understanding of the atomic basis for the underlying structural instability is still absent. Focusing on the model material CsPbBr$_3$, the inherent lattice softness of halide perovskites i…
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Under external stimuli, lead halide perovskites exhibit large atomic fluctuations, impacting optical and electron transport properties that affect device performance in operational settings. However, a thorough understanding of the atomic basis for the underlying structural instability is still absent. Focusing on the model material CsPbBr$_3$, the inherent lattice softness of halide perovskites is elucidated at the atomic level through in-situ single-crystal X-ray diffraction measurements under pressure complemented by atomic level simulations. We identify and explore the nature of the first-order phase transition to a distorted P21/c phase at 1.3 GPa, induced by the sudden Cs-Br bonds breaking. Unlike classical transition metal oxide perovskites, where the internal energy term dominates, we show explicitly that pressure primarily influences the Gibbs free energy for halide perovskites through the pressure-volume term. As such, strategically mitigating bond strains from volume shrinkage is the key to suppressing the first-order behavior for maintaining the coordinates of PbX$_6$ polyhedral upon external perturbation. Our thermodynamic calculation reveals the demand for high entropy in the -T*del-S term, which can be achieved by exploring a broader spectrum of doped A site and B sites in ABX$_3$ systems, enabling continuous structural changes that facilitate recovery from mechanical damage in practical applications.
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Submitted 29 December, 2024;
originally announced December 2024.
X-ray standing wave and reflectometric characterization of multilayer structures
Authors:
S. K. Ghose,
B. N. Dev
Abstract:
Microstructural characterization of synthetic periodic multilayers by x-ray standing waves have been presented. It has been shown that the analysis of multilayers by combined x-ray reflectometry (XRR) and x-ray standing wave (XSW) techniques can overcome the deficiencies of the individual techniques in microstructural analysis. While interface roughnesses are more accurately determined by the XR…
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Microstructural characterization of synthetic periodic multilayers by x-ray standing waves have been presented. It has been shown that the analysis of multilayers by combined x-ray reflectometry (XRR) and x-ray standing wave (XSW) techniques can overcome the deficiencies of the individual techniques in microstructural analysis. While interface roughnesses are more accurately determined by the XRR technique, layer composition is more accurately determined by the XSW technique where an element is directly identified by its characteristic emission. These aspects have been explained with an example of a 20 period Pt/C multilayer. The composition of the C-layers due to Pt dissolution in the C-layers, Pt$_{x}$C$_{1-x}$, has been determined by the XSW technique. In the XSW analysis when the whole amount of Pt present in the C-layers is assumed to be within the broadened interface, it l eads to larger interface roughness values, inconsistent with those determined by the XRR technique. Constraining the interface roughness values to those determined by the XRR technique, requires an additional amount of dissolved Pt in the C-layers to expl ain the Pt fluorescence yield excited by the standing wave field. This analysis provides the average composition Pt$_{x}$C$_{1-x}$ of the C-layers .
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Submitted 16 January, 2001;
originally announced January 2001.
