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Showing 1–5 of 5 results for author: Fortmann, J D

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  1. arXiv:2411.12660  [pdf, other

    cond-mat.mes-hall physics.ins-det

    Implementation and performance of a fiber-coupled CMOS camera in an ultrafast reflective high-energy electron diffraction experiment

    Authors: Jonas D. Fortmann, Alexander Kaßen, Christian Brand, Thomas Duden, Michael Horn-von Hoegen

    Abstract: The implementation of a monolithic fiber-optically coupled CMOS-based TemCam-XF416 camera into our ultra-high vacuum (UHV) ultrafast reflection high-energy electron diffraction setup is reported. A combination of a pumpable gate valve and a self-built cooling collar allows UHV conditions to be reached without the need to remove the heat-sensitive device. The water-cooled collar is mounted to the c… ▽ More

    Submitted 19 November, 2024; originally announced November 2024.

    Comments: 7 pages, 6 figures. arXiv admin note: text overlap with arXiv:2311.10010

  2. arXiv:2311.10010  [pdf, other

    physics.ins-det cond-mat.mes-hall

    Cool Cooling Collar for Bake-Out of Temperature-Sensitive Devices

    Authors: Jonas D. Fortmann, Christian Brand, Michael Horn-von Hoegen

    Abstract: A combination of a pumpable gate valve and a self-built cooling collar permits bake-out of an ultra-high vacuum chamber without having to dismount sensitive equipment. A small pump port on the closed gate valve maintains ultra-high vacuum conditions for a TVIPS TemCam-XF416 imaging electron detector in the case of venting the main chamber. The water-cooled collar mounted to the detector housing pr… ▽ More

    Submitted 22 November, 2023; v1 submitted 16 November, 2023; originally announced November 2023.

    Comments: 3 pages, 2 figures

  3. arXiv:2310.15740  [pdf

    cond-mat.mes-hall

    Non-Equilibrium Pathways for Excitation of Bulk and Surface Phonons through Anharmonic Coupling

    Authors: C. Brand, V. Tinnemann, A. Hanisch-Blicharski, M. Tajik, J. D. Fortmann, A. Kaßen, F. Thiemann, M. Horn-von Hoegen

    Abstract: Upon impulsive optical excitation of solid-state materials, the non-equilibrium flow of energy from the excited electronic system to the lattice degrees of freedom typically happens in a few picoseconds. Here we identified the surface of thin Bi films grown on Si(001) as an additional subsystem which is excited much slower on a 100 ps timescale that is caused by decoupling due to mismatched phonon… ▽ More

    Submitted 7 March, 2024; v1 submitted 24 October, 2023; originally announced October 2023.

  4. Critical behavior of the dimerized Si(001) surface: Continuous order-disorder phase transition in the two-dimensional Ising universality class

    Authors: Christian Brand, Alfred Hucht, Hamid Mehdipour, Giriraj Jnawali, Jonas D. Fortmann, Mohammad Tajik, Rüdiger Hild, Björn Sothmann, Peter Kratzer, Ralf Schützhold, Michael Horn-von Hoegen

    Abstract: The critical behavior of the order-disorder phase transition in the buckled dimer structure of the Si(001) surface is investigated both theoretically by means of first-principles calculations and experimentally by spot profile analysis low-energy electron diffraction (SPA-LEED). We use density functional theory (DFT) with three different functionals commonly used for Si to determine the coupling c… ▽ More

    Submitted 6 March, 2024; v1 submitted 16 October, 2023; originally announced October 2023.

    Journal ref: Phys. Rev. B 109, 134104 (2024)

  5. Dimer Coupling Energies of the Si(001) Surface

    Authors: Christian Brand, Alfred Hucht, Giriraj Jnawali, Jonas D. Fortmann, Björn Sothmann, Hamid Mehdipour, Peter Kratzer, Ralf Schützhold, Michael Horn-von Hoegen

    Abstract: The coupling energies between the buckled dimers of the Si(001) surface were determined through analysis of the anisotropic critical behavior of its order-disorder phase transition. Spot profiles in high-resolution low-energy electron diffraction as a function of temperature were analyzed within the framework of the anisotropic two-dimensional Ising model. The validity of this approach is justifie… ▽ More

    Submitted 3 February, 2023; originally announced February 2023.

    Comments: Accepted for publication at Physical Review Letters on 02Feb23

    Journal ref: Phys. Rev. Lett. 130, 126203 (2023)