Showing 1–4 of 4 results for author: Folsom, E

X-ray induced grain boundary formation and grain rotation in Bi2Se3

Authors: Kento Katagiri, Bernard Kozioziemski, Eric Folsom, Sebastian Göde, Yifan Wang, Karen Appel, Darshan Chalise, Philip K. Cook, Jon Eggert, Marylesa Howard, Sungwon Kim, Zuzana Konôpková, Mikako Makita, Motoaki Nakatsutsumi, Martin M. Nielsen, Alexander Pelka, Henning F. Poulsen, Thomas R. Preston, Tharun Reddy, Jan-Patrick Schwinkendorf, Frank Seiboth, Hugh Simons, Bihan Wang, Wenge Yang, Ulf Zastrau , et al. (2 additional authors not shown)

Abstract: Optimizing grain boundary characteristics in polycrystalline materials can improve their properties. Many processing methods have been developed for grain boundary manipulation, including the use of intense radiation in certain applications. In this work, we used X-ray free electron laser pulses to irradiate single-crystalline bismuth selenide (Bi2Se3) and observed grain boundary formation and sub… ▽ More Optimizing grain boundary characteristics in polycrystalline materials can improve their properties. Many processing methods have been developed for grain boundary manipulation, including the use of intense radiation in certain applications. In this work, we used X-ray free electron laser pulses to irradiate single-crystalline bismuth selenide (Bi2Se3) and observed grain boundary formation and subsequent grain rotation in response to the X-ray radiation. Our observations with simultaneous transmission X-ray microscopy and X-ray diffraction demonstrate how intense X- ray radiation can rapidly change size and texture of grains. △ Less

Submitted 26 October, 2024; v1 submitted 12 March, 2024; originally announced March 2024.

Comments: 37 pages, 11 figures including 6 supplemental figures

Dark-Field X-ray Microscopy for 2D and 3D imaging of Microstructural Dynamics at the European X-ray Free Electron Laser

Authors: Sara J. Irvine, Kento Katagiri, Trygve M. Ræder, Ulrike Boesenberg, Darshan Chalise, Jade I. Stanton, Dayeeta Pal, Jörg Hallmann, Gabriele Ansaldi, Felix Brauße, Jon H. Eggert, Lichao Fang, Eric Folsom, Morten Haubro, Theodor S. Holstad, Anders Madsen, Johannes Möller, Martin M. Nielsen, Henning F. Poulsen, Jan-Etienne Pudell, Angel Rodriguez-Fernandez, Frank Schoofs, Frank Seiboth, Yifan Wang, Wonhyuk Jo , et al. (4 additional authors not shown)

Abstract: Dark field X-ray microscopy (DXFM) can visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve sub-μm spatial resolution and <100 fs time resolution simultaneously. In this paper, we demonstrate ultrafast DFXM measurements at the European XFEL to visualize an optically-driven longitudinal strain wav… ▽ More Dark field X-ray microscopy (DXFM) can visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve sub-μm spatial resolution and <100 fs time resolution simultaneously. In this paper, we demonstrate ultrafast DFXM measurements at the European XFEL to visualize an optically-driven longitudinal strain wave propagating through a diamond single crystal. We also present two DFXM scanning modalities that are new to the XFEL sources: spatially 3D and 2D axial-strain scans with sub-μm spatial resolution. With this progress in XFEL-based DFXM, we discuss new opportunities to study multi-timescale spatio-temporal dynamics of microstructures. △ Less

Submitted 18 September, 2024; v1 submitted 7 November, 2023; originally announced November 2023.

Real-time imaging of acoustic waves in bulk materials with X-ray microscopy

Authors: Theodor S. Holstad, Leora E. Dresselhaus-Marais, Trygve Magnus Ræder, Bernard Kozioziemski, Tim van Driel, Matthew Seaberg, Eric Folsom, Jon H. Eggert, Erik Bergbäck Knudsen, Martin Meedom Nielsen, Hugh Simons, Kristoffer Haldrup, Henning Friis Poulsen

Abstract: Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determine properties. Today, 3D movies with ~100-nm resolution of crystalline structure are regularly acquired in minutes to hours using X-ray diffraction based imaging. We present an X-ray microscope that improves this time res… ▽ More Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determine properties. Today, 3D movies with ~100-nm resolution of crystalline structure are regularly acquired in minutes to hours using X-ray diffraction based imaging. We present an X-ray microscope that improves this time resolution to <100 femtoseconds, with images attainable even from a single X-ray pulse. Using this, we resolve the propagation of 18-km/s acoustic waves in mm-sized diamond crystals, and demonstrate how mechanical energy thermalizes from picosecond to microsecond timescales. Our approach unlocks a vast range of new experiments of materials phenomena with intricate structural dynamics at ultrafast timescales. △ Less

Submitted 14 November, 2022; v1 submitted 2 November, 2022; originally announced November 2022.

Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers

Authors: Leora E. Dresselhaus-Marais, Bernard Kozioziemski, Theodor S. Holstad, Trygve Magnus Ræder, Matthew Seaberg, Daewoong Nam, Sangsoo Kim, Sean Breckling, Seonghyuk Choi, Matthieu Chollet, Philip K. Cook, Eric Folsom, Eric Galtier, Arnulfo Gonzalez, Tais Gorhover, Serge Guillet, Kristoffer Haldrup, Marylesa Howard, Kento Katagiri, Seonghan Kim, Sunam Kim, Sungwon Kim, Hyunjung Kim, Erik Bergback Knudsen, Stephan Kuschel , et al. (18 additional authors not shown)

Abstract: The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the str… ▽ More The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, Dark Field X-ray Microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $10^{12}$ photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics. △ Less

Submitted 5 September, 2023; v1 submitted 15 October, 2022; originally announced October 2022.

Journal ref: Scientific Reports, 13, 17573 (2023)