Showing 1–21 of 21 results for author: Dresselhaus-Marais, L

Laser, Vacuum, and Gas Reaction Chamber for Operando Measurements at NSLS-II's 28-ID-2

Authors: Lauren Y. Moghimi, Patrik Johansson, Subhechchha Paul, Yifan Wang, Sara Irvine, Remington Graham, Zane Taylor, Angel A. Martinez, John T. Markert, John Trunk, Hui Zhong, Jianming Bai, Sanjit Ghose, Leora Dresselhaus-Marais

Abstract: We present a laser reaction chamber that we developed for in-situ/operando X-ray diffraction measurements at the NSLS-II 28-ID-2 XPD (X-Ray Powder Diffraction) beamline. This chamber allows for rapid and dynamic sample heating under specialized gas environments, spanning ambient conditions down to vacuum pressures. We demonstrate the capabilities of this setup through two applications: laser-drive… ▽ More We present a laser reaction chamber that we developed for in-situ/operando X-ray diffraction measurements at the NSLS-II 28-ID-2 XPD (X-Ray Powder Diffraction) beamline. This chamber allows for rapid and dynamic sample heating under specialized gas environments, spanning ambient conditions down to vacuum pressures. We demonstrate the capabilities of this setup through two applications: laser-driven heating in polycrystalline iron oxide and in single crystal WTe2. Our measurements reveal the ability to resolve chemical reaction kinetics over minutes with 1-s time resolution. This setup advances opportunities for in-situ/operando XRD studies in both bulk and single crystal materials. △ Less

Submitted 15 May, 2025; originally announced May 2025.

Oblique diffraction geometry for the observation of several non-coplanar Bragg reflections under identical illumination

Authors: C. Detlefs, A. Henningsson, B. Kanesalingam, A. A. W. Cretton, C. Corley-Wiciak, F. T. Frankus, D. Pal, S. Irvine, S. Borgi, H. F. Poulsen, C. Yildirim, L. E. Dresselhaus-Marais

Abstract: We present a method to determine the strain tensor and local lattice rotation with Dark Field X-ray Microscopy. Using a set of at least 3 non-coplanar, symmetry-equivalent Bragg reflections, the illuminated volume of the sample can be kept constant for all reflections, facilitating easy registration of the measured lattice variations. This requires an oblique diffraction geometry, i.e.~the diffrac… ▽ More We present a method to determine the strain tensor and local lattice rotation with Dark Field X-ray Microscopy. Using a set of at least 3 non-coplanar, symmetry-equivalent Bragg reflections, the illuminated volume of the sample can be kept constant for all reflections, facilitating easy registration of the measured lattice variations. This requires an oblique diffraction geometry, i.e.~the diffraction plane is neither horizontal nor vertical. We derive a closed, analytical expression that allows determination of the strain and lattice rotation from the deviation of experimental observables (e.g.~goniometer angles) from their nominal position for an unstrained lattice. △ Less

Submitted 11 April, 2025; originally announced April 2025.

Comments: 8 pages, 1 figure. Submitted to Journal of Applied Crystallography

Analytical model for balling defects in laser melting using rivulet theory and solidification

Authors: Zane Taylor, Tharun Reddy, Maureen Fitzpatrick, Kwan Kim, Wei Li, Chu Lun Alex Leung, Peter D. Lee, Kaila M. Bertsch, Leora Dresselhaus-Marais

Abstract: In the laser welding and additive manufacturing (AM) communities, the balling defect is primarily attributed to the action of fluid instabilities with a few authors suggesting other mechanisms. Without commenting on the validity of the fluid instability driven \textit{mechanism} of balling in AM, this work intends to present the most realistic analytical discussion of the balling defect driven pur… ▽ More In the laser welding and additive manufacturing (AM) communities, the balling defect is primarily attributed to the action of fluid instabilities with a few authors suggesting other mechanisms. Without commenting on the validity of the fluid instability driven \textit{mechanism} of balling in AM, this work intends to present the most realistic analytical discussion of the balling defect driven purely by fluid instabilities. Synchrotron-based X-ray radiography of thin samples indicate that fluid instability growth rates and solidification can be comparable in magnitude and thus compete. Neglecting the action of fluid flows and heat transport, this work presents an analytical formalism which accounts for fluid instabilities and solidification competition, giving a continuous transition from balling to non-balling which is lacking in current literature. We adapt a Rivulet instability model from the fluid physics community to account for the stabilizing effects of the substrate which the Plateau-Rayleigh instability model does not account for, and estimate the instability growth rate. Our model predicts instability growth at higher wavelengths and shallower melt pool depths relative to width, as well as strong sensitivity to the solidification front curvature. Deviations between model predictions and our experimental results demonstrate the importance of fluid flows and heat transport in the balling process. Our experiments further demonstrate at least one mechanism by which the melt pool length and balling wavelength are not equivalent, as commonly claimed. △ Less

Submitted 21 April, 2025; v1 submitted 18 February, 2025; originally announced February 2025.

Formalism to Image the Dynamics of Coherent and Incoherent Phonon with Dark-Field X-ray Microscopy using Kinematic Diffraction Theory

Authors: Darshan Chalise, Yifan Wang, Mariano Trigo, Leora E. Dresselhaus-Marais

Abstract: Dark-field X-ray microscopy (DFXM) is a novel X-ray imaging technique developed at synchrotrons to image along the diffracted beam with a real space resolution of ~100 nm and reciprocal space resolution of $10^{-4}$. Recent implementations of DFXM at X-ray free electron lasers (XFELs) have demonstrated DFXM's ability to visualize the real-time evolution of coherent GHz phonons produced by ultrafas… ▽ More Dark-field X-ray microscopy (DFXM) is a novel X-ray imaging technique developed at synchrotrons to image along the diffracted beam with a real space resolution of ~100 nm and reciprocal space resolution of $10^{-4}$. Recent implementations of DFXM at X-ray free electron lasers (XFELs) have demonstrated DFXM's ability to visualize the real-time evolution of coherent GHz phonons produced by ultrafast laser excitation of metal transducers. Combining this with DFXM's ability to visualize strain fields due to dislocations makes it possible to study the interaction of GHz coherent phonons with the strain fields of dislocations, along with studying the damping of coherent phonons due to interactions with thermal phonons. For quantitative analysis of phonon-dislocation interactions and phonon damping, a formalism is required to relate phonon dynamics to the strains measured by DFXM. In this work, we use kinematic diffraction theory to simulate DFXM images of the specific coherent phonons in diamond that are generated by the ultrafast laser excitation of a metal transducer. We extend this formalism to also describe imaging of incoherent phonons of sufficiently high frequency, which are relevant for thermal transport, offering future opportunities for DFXM to image signals produced by thermal diffuse scattering. For both coherent and incoherent phonons, we discuss the optimal sampling of real space, reciprocal space and time, and the opportunities offered by the advances in DFXM optics. △ Less

Submitted 9 October, 2024; originally announced October 2024.

Comment on "Comments regarding "Transonic dislocation propagation in diamond" by Katagiri, et al. (Science 382, 69-72, 2023)" by Hawreliak, et al. (arXiv:2401.04213)

Authors: Kento Katagiri, Tatiana Pikuz, Lichao Fang, Bruno Albertazzi, Shunsuke Egashira, Yuichi Inubushi, Genki Kamimura, Ryosuke Kodama, Michel Koenig, Bernard Kozioziemski, Gooru Masaoka, Kohei Miyanishi, Hirotaka Nakamura, Masato Ota, Gabriel Rigon, Youichi Sakawa, Takayoshi Sano, Frank Schoofs, Zoe J. Smith, Keiichi Sueda, Tadashi Togashi, Tommaso Vinci, Yifan Wang, Makina Yabashi, Toshinori Yabuuchi , et al. (2 additional authors not shown)

Abstract: In their comment (1), Hawreliak et al. claims that our observation of stacking fault formation and transonic dislocation propagation in diamond (2) is not valid as they interpret the observed features as cracks. In this response letter, we describe our rationale for interpreting the observed features as stacking faults. We also address other points raised in their comments, including the clarifica… ▽ More In their comment (1), Hawreliak et al. claims that our observation of stacking fault formation and transonic dislocation propagation in diamond (2) is not valid as they interpret the observed features as cracks. In this response letter, we describe our rationale for interpreting the observed features as stacking faults. We also address other points raised in their comments, including the clarifications of how the results of Makarov et al. (3) are not in conflict with our study. △ Less

Submitted 9 September, 2024; originally announced September 2024.

Comments: Comment on arXiv:2401.04213. 10 pages, 2 figures

Computing virtual dark-field X-ray microscopy images of complex discrete dislocation structures from large-scale molecular dynamics simulations

Authors: Yifan Wang, Nicolas Bertin, Dayeeta Pal, Sara J. Irvine, Kento Katagiri, Robert E. Rudd, Leora E. Dresselhaus-Marais

Abstract: Dark-field X-ray Microscopy (DFXM) is a novel diffraction-based imaging technique that non-destructively maps the local deformation from crystalline defects in bulk materials. While studies have demonstrated that DFXM can spatially map 3D defect geometries, it is still challenging to interpret DFXM images of the high dislocation density systems relevant to macroscopic crystal plasticity. This work… ▽ More Dark-field X-ray Microscopy (DFXM) is a novel diffraction-based imaging technique that non-destructively maps the local deformation from crystalline defects in bulk materials. While studies have demonstrated that DFXM can spatially map 3D defect geometries, it is still challenging to interpret DFXM images of the high dislocation density systems relevant to macroscopic crystal plasticity. This work develops a scalable forward model to calculate virtual DFXM images for complex discrete dislocation (DD) structures obtained from atomistic simulations. Our new DD-DFXM model integrates a non-singular formulation for calculating the local strain from the DD structures and an efficient geometrical optics algorithm for computing the DFXM image from the strain. We apply the model to complex DD structures obtained from a large-scale molecular dynamics (MD) simulation of compressive loading on a single-crystal silicon. Simulated DFXM images exhibit prominent feature contrast for dislocations between the multiple slip systems, demonstrating the DFXM's potential to resolve features from dislocation multiplication. The integrated DD-DFXM model provides a toolbox for DFXM experimental design and image interpretation in the context of bulk crystal plasticity for the breadth of measurements across shock plasticity and the broader materials science community. △ Less

Submitted 20 September, 2024; v1 submitted 2 September, 2024; originally announced September 2024.

Measuring the Burgers Vector of Dislocations with Dark-Field X-ray Microscopy

Authors: Dayeeta Pal, Yifan Wang, Ramya Gurunathan, Leora Dresselhaus-Marais

Abstract: The behavior of dislocations is essential to understand material properties, but their subsurface dynamics that are representative of bulk phenomena cannot be resolved by conventional transmission electron microscopy (TEM). Dark field X-ray microscope (DFXM) was recently demonstrated to image hierarchical structures of bulk dislocations by imaging lattice distortions along the transmitted X-ray di… ▽ More The behavior of dislocations is essential to understand material properties, but their subsurface dynamics that are representative of bulk phenomena cannot be resolved by conventional transmission electron microscopy (TEM). Dark field X-ray microscope (DFXM) was recently demonstrated to image hierarchical structures of bulk dislocations by imaging lattice distortions along the transmitted X-ray diffracted beam using an objective lens. While today's DFXM can effectively map the line vector of dislocations, it still cannot quantify the Burgers vector required to understand dislocation interactions, structures, and energies. Our study formulates a theoretical model of how DFXM images collected along specific scans can be used to directly measure the Burgers vector of a dislocation. By revisiting the "invisibility criteria" from TEM theory, we re-solve this formalism for DFXM and extend it to the geometric-optics model developed for DFXM to evaluate how the images acquired from different scans about a single {hkl} diffraction peak encode the Burgers vector within them. We demonstrate this for edge, screw, and mixed dislocations and discuss the observed symmetries. This work advances our understanding of DFXM to establish its capabilities to connect bulk experiments to dislocation theory and mechanics. △ Less

Submitted 22 May, 2024; originally announced May 2024.

X-ray induced grain boundary formation and grain rotation in Bi2Se3

Authors: Kento Katagiri, Bernard Kozioziemski, Eric Folsom, Sebastian Göde, Yifan Wang, Karen Appel, Darshan Chalise, Philip K. Cook, Jon Eggert, Marylesa Howard, Sungwon Kim, Zuzana Konôpková, Mikako Makita, Motoaki Nakatsutsumi, Martin M. Nielsen, Alexander Pelka, Henning F. Poulsen, Thomas R. Preston, Tharun Reddy, Jan-Patrick Schwinkendorf, Frank Seiboth, Hugh Simons, Bihan Wang, Wenge Yang, Ulf Zastrau , et al. (2 additional authors not shown)

Abstract: Optimizing grain boundary characteristics in polycrystalline materials can improve their properties. Many processing methods have been developed for grain boundary manipulation, including the use of intense radiation in certain applications. In this work, we used X-ray free electron laser pulses to irradiate single-crystalline bismuth selenide (Bi2Se3) and observed grain boundary formation and sub… ▽ More Optimizing grain boundary characteristics in polycrystalline materials can improve their properties. Many processing methods have been developed for grain boundary manipulation, including the use of intense radiation in certain applications. In this work, we used X-ray free electron laser pulses to irradiate single-crystalline bismuth selenide (Bi2Se3) and observed grain boundary formation and subsequent grain rotation in response to the X-ray radiation. Our observations with simultaneous transmission X-ray microscopy and X-ray diffraction demonstrate how intense X- ray radiation can rapidly change size and texture of grains. △ Less

Submitted 26 October, 2024; v1 submitted 12 March, 2024; originally announced March 2024.

Comments: 37 pages, 11 figures including 6 supplemental figures

Dark-Field X-ray Microscopy for 2D and 3D imaging of Microstructural Dynamics at the European X-ray Free Electron Laser

Authors: Sara J. Irvine, Kento Katagiri, Trygve M. Ræder, Ulrike Boesenberg, Darshan Chalise, Jade I. Stanton, Dayeeta Pal, Jörg Hallmann, Gabriele Ansaldi, Felix Brauße, Jon H. Eggert, Lichao Fang, Eric Folsom, Morten Haubro, Theodor S. Holstad, Anders Madsen, Johannes Möller, Martin M. Nielsen, Henning F. Poulsen, Jan-Etienne Pudell, Angel Rodriguez-Fernandez, Frank Schoofs, Frank Seiboth, Yifan Wang, Wonhyuk Jo , et al. (4 additional authors not shown)

Abstract: Dark field X-ray microscopy (DXFM) can visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve sub-μm spatial resolution and <100 fs time resolution simultaneously. In this paper, we demonstrate ultrafast DFXM measurements at the European XFEL to visualize an optically-driven longitudinal strain wav… ▽ More Dark field X-ray microscopy (DXFM) can visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve sub-μm spatial resolution and <100 fs time resolution simultaneously. In this paper, we demonstrate ultrafast DFXM measurements at the European XFEL to visualize an optically-driven longitudinal strain wave propagating through a diamond single crystal. We also present two DFXM scanning modalities that are new to the XFEL sources: spatially 3D and 2D axial-strain scans with sub-μm spatial resolution. With this progress in XFEL-based DFXM, we discuss new opportunities to study multi-timescale spatio-temporal dynamics of microstructures. △ Less

Submitted 18 September, 2024; v1 submitted 7 November, 2023; originally announced November 2023.

Transonic Dislocation Propagation in Diamond

Authors: Kento Katagiri, Tatiana Pikuz, Lichao Fang, Bruno Albertazzi, Shunsuke Egashira, Yuichi Inubushi, Genki Kamimura, Ryosuke Kodama, Michel Koenig, Bernard Kozioziemski, Gooru Masaoka, Kohei Miyanishi, Hirotaka Nakamura, Masato Ota, Gabriel Rigon, Youichi Sakawa, Takayoshi Sano, Frank Schoofs, Zoe J. Smith, Keiichi Sueda, Tadashi Togashi, Tommaso Vinci, Yifan Wang, Makina Yabashi, Toshinori Yabuuchi , et al. (2 additional authors not shown)

Abstract: The motion of line defects (dislocations) has been studied for over 60 years but the maximum speed at which they can move is unresolved. Recent models and atomistic simulations predict the existence of a limiting velocity of dislocation motions between the transonic and subsonic ranges at which the self-energy of dislocation diverges, though they do not deny the possibility of the transonic disloc… ▽ More The motion of line defects (dislocations) has been studied for over 60 years but the maximum speed at which they can move is unresolved. Recent models and atomistic simulations predict the existence of a limiting velocity of dislocation motions between the transonic and subsonic ranges at which the self-energy of dislocation diverges, though they do not deny the possibility of the transonic dislocations. We use femtosecond x-ray radiography to track ultrafast dislocation motion in shock-compressed single-crystal diamond. By visualizing stacking faults extending faster than the slowest sound wave speed of diamond, we show the evidence of partial dislocations at their leading edge moving transonically. Understanding the upper limit of dislocation mobility in crystals is essential to accurately model, predict, and control the mechanical properties of materials under extreme conditions. △ Less

Submitted 6 October, 2023; v1 submitted 7 March, 2023; originally announced March 2023.

Correlating Chemical Reaction and Mass Transport in Hydrogen-based Direct Reduction of Iron Oxide

Authors: Xueli Zheng, Subhechchha Paul, Lauren Moghimi, Yifan Wang, Rafael A. Vilá, Fan Zhang, Xin Gao, Junjing Deng, Yi Jiang, Xin Xiao, Chaolumen Wu, Louisa C. Greenburg, Yufei Yang, Yi Cui, Arturas Vailionis, Ivan Kuzmenko, Jan llavsky, Yadong Yin, Yi Cui, Leora Dresselhaus-Marais

Abstract: Steelmaking contributes 8% to the total CO2 emissions globally, primarily due to coal-based iron ore reduction. Clean hydrogen-based ironmaking has variable performance because the dominant gas-solid reduction mechanism is set by the defects and pores inside the mm-nm sized oxide particles that change significantly as the reaction progresses. While these governing dynamics are essential to establi… ▽ More Steelmaking contributes 8% to the total CO2 emissions globally, primarily due to coal-based iron ore reduction. Clean hydrogen-based ironmaking has variable performance because the dominant gas-solid reduction mechanism is set by the defects and pores inside the mm-nm sized oxide particles that change significantly as the reaction progresses. While these governing dynamics are essential to establish continuous flow of iron and its ores through reactors, the direct link between agglomeration and chemistry is still contested due to missing measurements. In this work, we directly measure the connection between chemistry and agglomeration in the smallest iron oxides relevant to magnetite ores. Using synthesized spherical 10-nm magnetite particles reacting in H2, we resolve the formation and consumption of wüstite (FeO) - the step most commonly attributed to agglomeration. Using X-ray scattering and microscopy, we resolve crystallographic anisotropy in the rate of the initial reaction, which becomes isotropic as the material sinters. Complementing with imaging, we demonstrate how the particles self-assemble, subsequently react and sinter into ~100x oblong grains. Our insights into how morphologically uniform iron oxide particles react and agglomerate H2 reduction enable future size-dependent models to effectively describe the multiscale iron ore reduction. △ Less

Submitted 5 March, 2023; v1 submitted 27 February, 2023; originally announced February 2023.

Journal ref: PNAS, 120 (43) e2305097120 (2023)

Automating Dislocation Characterization in 3D Dark Field X-ray Microscopy

Authors: Pin-Hua Huang, Ryan Coffee, Leora Dresselhaus-Marais

Abstract: Mechanical properties in crystals are strongly correlated to the arrangement of 1D line defects, termed dislocations. Recently, Dark field X-ray Microscopy (DFXM) has emerged as a new tool to image and interpret dislocations within crystals using multidimensional scans. However, the methods required to reconstruct meaningful dislocation information from high-dimensional DFXM scans are still nascen… ▽ More Mechanical properties in crystals are strongly correlated to the arrangement of 1D line defects, termed dislocations. Recently, Dark field X-ray Microscopy (DFXM) has emerged as a new tool to image and interpret dislocations within crystals using multidimensional scans. However, the methods required to reconstruct meaningful dislocation information from high-dimensional DFXM scans are still nascent and require significant manual oversight (i.e. \textit{supervision}). In this work, we present a new relatively unsupervised method that extracts dislocation-specific information (features) from a 3D dataset ($x$, $y$, $φ$) using Gram-Schmidt orthogonalization to represent the large dataset as an array of 3-component feature vectors for each position, corresponding to the weak-beam conditions and the strong-beam condition. This method offers key opportunities to significantly reduce dataset size while preserving only the crystallographic information that is important for data reconstruction. △ Less

Submitted 15 March, 2024; v1 submitted 9 November, 2022; originally announced November 2022.

Journal ref: Integrating Materials and Manufacturing Innovation, 12, 83-91 (2023)

Real-time imaging of acoustic waves in bulk materials with X-ray microscopy

Authors: Theodor S. Holstad, Leora E. Dresselhaus-Marais, Trygve Magnus Ræder, Bernard Kozioziemski, Tim van Driel, Matthew Seaberg, Eric Folsom, Jon H. Eggert, Erik Bergbäck Knudsen, Martin Meedom Nielsen, Hugh Simons, Kristoffer Haldrup, Henning Friis Poulsen

Abstract: Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determine properties. Today, 3D movies with ~100-nm resolution of crystalline structure are regularly acquired in minutes to hours using X-ray diffraction based imaging. We present an X-ray microscope that improves this time res… ▽ More Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determine properties. Today, 3D movies with ~100-nm resolution of crystalline structure are regularly acquired in minutes to hours using X-ray diffraction based imaging. We present an X-ray microscope that improves this time resolution to <100 femtoseconds, with images attainable even from a single X-ray pulse. Using this, we resolve the propagation of 18-km/s acoustic waves in mm-sized diamond crystals, and demonstrate how mechanical energy thermalizes from picosecond to microsecond timescales. Our approach unlocks a vast range of new experiments of materials phenomena with intricate structural dynamics at ultrafast timescales. △ Less

Submitted 14 November, 2022; v1 submitted 2 November, 2022; originally announced November 2022.

Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers

Authors: Leora E. Dresselhaus-Marais, Bernard Kozioziemski, Theodor S. Holstad, Trygve Magnus Ræder, Matthew Seaberg, Daewoong Nam, Sangsoo Kim, Sean Breckling, Seonghyuk Choi, Matthieu Chollet, Philip K. Cook, Eric Folsom, Eric Galtier, Arnulfo Gonzalez, Tais Gorhover, Serge Guillet, Kristoffer Haldrup, Marylesa Howard, Kento Katagiri, Seonghan Kim, Sunam Kim, Sungwon Kim, Hyunjung Kim, Erik Bergback Knudsen, Stephan Kuschel , et al. (18 additional authors not shown)

Abstract: The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the str… ▽ More The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, Dark Field X-ray Microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $10^{12}$ photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics. △ Less

Submitted 5 September, 2023; v1 submitted 15 October, 2022; originally announced October 2022.

Journal ref: Scientific Reports, 13, 17573 (2023)

Extensive 3D Mapping of Dislocation Structures in Bulk Aluminum

Authors: Can Yildirim, Henning F. Poulsen, Grethe Winther, Carsten Detlefs, Pin H. Huang, Leora E. Dresselhaus-Marais

Abstract: Thermomechanical processing such as annealing is one of the main methods to tailor the mechanical properties of materials, however, much is unknown about the reorganization of dislocation structures deep inside macroscopic crystals that give rise to those changes. Here, we demonstrate the self-organization of dislocation structures upon high-temperature annealing in a mm-sized single crystal of al… ▽ More Thermomechanical processing such as annealing is one of the main methods to tailor the mechanical properties of materials, however, much is unknown about the reorganization of dislocation structures deep inside macroscopic crystals that give rise to those changes. Here, we demonstrate the self-organization of dislocation structures upon high-temperature annealing in a mm-sized single crystal of aluminum. We map a large embedded 3D volume ($100\times300\times300$ $μ$m$^3$) of dislocation structures using dark field x-ray microscopy (DFXM), a diffraction-based imaging technique. Over the wide field of view, DFXM's high angular resolution allows us to identify subgrains, separated by dislocation boundaries, which we identify and characterize down to the single-dislocation level using computer-vision methods. We demonstrate how even after long annealing times at high temperatures, the remaining low density of dislocations still pack into well-defined, straight dislocation boundaries (DBs) that lie on specific crystallographic planes. In contrast to conventional grain growth models, our results show that the dihedral angles at the triple junctions are not the predicted 120$\degree$, suggesting additional complexities in the boundary stabilization mechanisms. Mapping the local misorientation and lattice strain around these boundaries shows that the observed strain is shear, imparting an average misorientation around the DB of $\approx 0.003-0.006 \degree{}$ △ Less

Submitted 30 August, 2022; originally announced August 2022.

Strength of diamond beyond the elastic limit under dynamic compression

Authors: K. Katagiri, N. Ozaki, L. E. Dresselhaus-Marais, J. H. Eggert, Y. Inubushi, T. Irifune, M. Koenig, T. Matsuoka, K. Miyanishi, H. Nakamura, N. Nishiyama, T. Okuchi, T. Sekine, Y. Seto, K. Sueda, Y. Tange, T. Togashi, Y. Umeda, M. Yabashi, T. Yabuuchi, R. Kodama

Abstract: Extremely high pressures over a million of atmospheres are required to deform diamonds permanently. Under dynamic high-pressure conditions, even such strong materials lose their strengths so rapidly that the initially pristine lattice transforms into complex dynamics. Here, we report femtosecond x-ray diffraction observations that directly resolve how shock waves deform the crystal lattice in the… ▽ More Extremely high pressures over a million of atmospheres are required to deform diamonds permanently. Under dynamic high-pressure conditions, even such strong materials lose their strengths so rapidly that the initially pristine lattice transforms into complex dynamics. Here, we report femtosecond x-ray diffraction observations that directly resolve how shock waves deform the crystal lattice in the isotropic nano-polycrystalline form of diamond. The results show that the nano-grain reinforced diamond retains its strength at shock pressures far beyond its elastic limit until it finally approaches zero at 707 GPa, indicating the existence of brittle-ductile transition of nano-polycrystalline diamond under high-strain rate shock compression. The atomic-level deformation process of the diamond observed in this study is a key benchmark for designing high strength materials and simulating their behavior under extreme conditions. △ Less

Submitted 5 August, 2022; originally announced August 2022.

Analytical Methods for Superresolution Dislocation Identification in Dark-Field X-ray Microscopy

Authors: Michael C. Brennan, Marylesa Howard, Youssef Marzouk, Leora E. Dresselhaus-Marais

Abstract: In this work, we develop several inference methods to estimate the position of dislocations from images generated using dark-field X-ray microscopy (DFXM) -- achieving superresolution accuracy and principled uncertainty quantification. Using the framework of Bayesian inference, we incorporate models of the DFXM contrast mechanism and detector measurement noise, along with initial position estimate… ▽ More In this work, we develop several inference methods to estimate the position of dislocations from images generated using dark-field X-ray microscopy (DFXM) -- achieving superresolution accuracy and principled uncertainty quantification. Using the framework of Bayesian inference, we incorporate models of the DFXM contrast mechanism and detector measurement noise, along with initial position estimates, into a statistical model coupling DFXM images with the dislocation position of interest. We motivate several position estimation and uncertainty quantification algorithms based on this model. We then demonstrate the accuracy of our primary estimation algorithm on synthetic realistic DFXM images of edge dislocations in single crystal aluminum. We conclude with a discussion of our methods' impact on future dislocation studies and possible future research avenues. △ Less

Submitted 10 March, 2022; originally announced March 2022.

Journal ref: Journal of Materials Science, 57, 14890-14904 (2022)

X-ray Free Electron Laser based Dark-Field X-ray Microscopy

Authors: Theodor Secanell Holstad, Trygve Magnus Raeder, Mads Allerup Carlsen, Erik Bergback Knudsen, Leora Dresselhaus-Marais, Kristoffer Haldrup, Hugh Simons, Martin Meedom Nielsen, Henning Friis Poulsen

Abstract: Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three dimensional mapping of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an objective lens in the diffracted beam, giving a magnified projection image. So far, the method has been applied with a time resolution of milliseconds to hours. In th… ▽ More Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three dimensional mapping of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an objective lens in the diffracted beam, giving a magnified projection image. So far, the method has been applied with a time resolution of milliseconds to hours. In this work, we consider the feasibility of DFXM at the picosecond time scale using an X-ray free electron laser source and a pump-probe scheme. We combine thermomechanical strain wave simulations with geometrical optics and wavefront propagation optics to simulate DFXM images of phonon dynamics in a diamond single crystal. Using the specifications of the XCS instrument at the Linac Coherent Light Source (LCLS) as an example results in simulated DFXM images clearly showing the propagation of a strain wave. △ Less

Submitted 2 November, 2021; originally announced November 2021.

Multi-scale characterization of hexagonal Si-4H: a hierarchical nanostructured material

Authors: Silvia Pandolfi, Shiteng Zhao, John Turner, Peter Ercius, Chengyu Song, Rohan Dhall, Nicolas Menguy, Yann Le Godec, Alexandre Courac, Andrew M. Minor, Jon Eggert, Leora E. Dresselhaus-Marais

Abstract: In this work we present a detailed structural characterization of Si-4H, a newly discovered bulk form of hexagonal silicon (Si) with potential optoelectronic applications. Using multi-scale imaging, we reveal a hierarchical structure in the morphology of Si-4H obtained from high-pressure synthesis. We demonstrate discrete structural units, platelets, at an intermediate length-scale between the bul… ▽ More In this work we present a detailed structural characterization of Si-4H, a newly discovered bulk form of hexagonal silicon (Si) with potential optoelectronic applications. Using multi-scale imaging, we reveal a hierarchical structure in the morphology of Si-4H obtained from high-pressure synthesis. We demonstrate discrete structural units, platelets, at an intermediate length-scale between the bulk pellets synthesized at high pressures and the flake-like crystallites inferred in previous studies. Direct observation of the platelets reveals their 2D structure, with planar faces spanning hundreds of nanometers to a few micrometers and thicknesses of only tens of nanometers. We separated and dispersed small packets of quasi-single platelets, which enabled us to analyze the crystalline domains within each grain. With this view, we demonstrate that Si-4H platelets represent the smallest crystalline structural units, which can bend at the single-domain level. Our characterization of the quasi-2D, flexible platelets of hexagonal Si-4H and proof of concept that the platelets can be dispersed and manipulated quite simply demonstrate opportunities to design novel optoelectronic and solar devices. △ Less

Submitted 6 October, 2021; originally announced October 2021.

In-Situ Visualization of Long-Range Defect Interactions at the Edge of Melting

Authors: Leora E. Dresselhaus-Marais, Grethe Winther, Marylesa Howard, Arnulfo Gonzalez, Sean R. Breckling, Can Yildirim, Philip K. Cook, Mustafacan Kutsal, Hugh Simons, Carsten Detlefs, Jon H. Eggert, Henning Friis Poulsen

Abstract: Connecting a bulk material's microscopic defects to its macroscopic properties is an age-old problem in materials science. Long-range interactions between dislocations (line defects) are known to play a key role in how materials deform or melt, but we lack the tools to connect these dynamics to the macroscopic properties. We introduce time-resolved dark-field X-ray microscopy to directly visualize… ▽ More Connecting a bulk material's microscopic defects to its macroscopic properties is an age-old problem in materials science. Long-range interactions between dislocations (line defects) are known to play a key role in how materials deform or melt, but we lack the tools to connect these dynamics to the macroscopic properties. We introduce time-resolved dark-field X-ray microscopy to directly visualize how dislocations move and interact over hundreds of micrometers, deep inside bulk aluminum. With real-time movies, we reveal the thermally-activated motion and interactions of dislocations that comprise a boundary, and show how weakened binding forces inhomogeneously destabilize the structure at 99% of the melting temperature. Connecting dynamics of the microstructure to its stability, we provide important opportunities to guide and validate multiscale models that are yet untested. △ Less

Submitted 14 September, 2020; v1 submitted 10 September, 2020; originally announced September 2020.

Journal ref: Science Advances, 7, 29, abe8311 (2021)

Geometrical Optics Formalism to Model Contrast in Dark-Field X-ray Microscopy

Authors: H. F. Poulsen, L. E. Dresselhaus-Marais, M. A. Carlsen, C. Detlefs, G. Winther

Abstract: Dark-field X-ray microscopy is a new full-field imaging technique that nondestructively maps the structure and local strain inside deeply embedded crystalline elements in three dimensions. Placing an objective lens in the diffracted beam generates a magnified projection image of a local volume. We provide a general formalism based on geometrical optics for the diffraction imaging, valid for any cr… ▽ More Dark-field X-ray microscopy is a new full-field imaging technique that nondestructively maps the structure and local strain inside deeply embedded crystalline elements in three dimensions. Placing an objective lens in the diffracted beam generates a magnified projection image of a local volume. We provide a general formalism based on geometrical optics for the diffraction imaging, valid for any crystallographic space group. This allows simulation of diffraction images based on micro-mechanical models. We present example simulations with the formalism, demonstrating how it may be used to design new experiments or interpret existing ones. In particular, we show how modifications to the experimental design may tailor the reciprocal-space resolution function to map specific components of the deformation gradient tensor. The formalism supports multi-length scale experiments, as it enables DFXM to be interfaced with 3DXRD. The formalism is demonstrated by comparison to experimental images of the strain field around a straight dislocation. △ Less

Submitted 18 July, 2020; originally announced July 2020.

Journal ref: Journal of Applied Crystallography, 54, 6 (2021)