Isolation and characterization of atomically thin mica phyllosilicates
Authors:
Kristine L. Haley,
Noah F. Lee,
Vergil M. Schreiber,
Nicholas T. Pereira,
Randy M. Sterbentz,
Timothy Y. Chung,
Joshua O. Island
Abstract:
One of the roadblocks to employing two-dimensional (2D) materials in next generation devices is the lack of high quality insulators. Insulating layered materials with inert and atomically flat surfaces are ideal for high performance transistors and this has been exemplified with commonly used boron nitride. While the list of insulating 2D materials is limited, the earth-abundant phyllosilicates ar…
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One of the roadblocks to employing two-dimensional (2D) materials in next generation devices is the lack of high quality insulators. Insulating layered materials with inert and atomically flat surfaces are ideal for high performance transistors and this has been exemplified with commonly used boron nitride. While the list of insulating 2D materials is limited, the earth-abundant phyllosilicates are particularly attractive candidates. Here, we investigate the properties of atomically thin biotite and muscovite, the most common and commercially important micas from the rock-forming minerals. From a group of five natural bulk samples, energy dispersive X-ray spectroscopy is used to classify exfoliated flakes into three types of biotite, including the phlogopite endmember, and two muscovites. We provide a catalog of RGB contrast values for exfoliated flakes ranging from bilayer to approximately 175 nm. Additionally, we report the complex index of refraction for all investigated materials based on micro-reflectance measurements. Our findings suggest that earth-abundant phyllosilicates could serve as scalable insulators for logic devices employing 2D materials, potentially overcoming current limitations in the field.
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Submitted 23 August, 2024;
originally announced August 2024.
Fabrication and Low Temperature Thermoelectric Properties of Na_xCoO_2 (x = 0.68 and 0.75) Epitaxial Films by the Reactive Solid-Phase Epitaxy
Authors:
W. J. Chang,
C. C. Hsieh,
T. Y. Chung,
S. Y. Hsu,
K. H. Wu,
T. M. Uen,
J. -Y. Lin,
J. J. Lin,
C. H. Hsu,
Y. K. Kuo,
H. L. Liu,
M. H. Hsu,
Y. S. Gou,
J. Y. Juang
Abstract:
We have fabricated Na_xCoO_2 thin films via lateral diffusion of sodium into Co_3O_4 (111) epitaxial films (reactive solid-phase epitaxy: Ref. 4). The environment of thermal diffusion is key to the control of the sodium content in thin films. From the results of x-ray diffraction and in-plane resistivity, the epitaxial growth and the sodium contents of these films were identified. The thermoelec…
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We have fabricated Na_xCoO_2 thin films via lateral diffusion of sodium into Co_3O_4 (111) epitaxial films (reactive solid-phase epitaxy: Ref. 4). The environment of thermal diffusion is key to the control of the sodium content in thin films. From the results of x-ray diffraction and in-plane resistivity, the epitaxial growth and the sodium contents of these films were identified. The thermoelectric measurements show a large thermoelectric power similar to that observed in single crystals. The quasiparticle scattering rate is found to approach zero at low temperatures, consistent with the small residual resistivity, indicating high quality of the Na_xCoO_2 thin films.
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Submitted 19 January, 2007;
originally announced January 2007.
