Showing 1–1 of 1 results for author: Chiou, K L

Scanning gate microscopy of current-annealed single layer graphene

Authors: M. R. Connolly, K. L. Chiou, C. G. Smith, D. Anderson, G. A. C. Jones, A. Lombardo, A. Fasoli, A. C. Ferrari

Abstract: We have used scanning gate microscopy to explore the local conductivity of a current-annealed graphene flake. A map of the local neutrality point (NP) after annealing at low current density exhibits micron-sized inhomogeneities. Broadening of the local e-h transition is also correlated with the inhomogeneity of the NP. Annealing at higher current density reduces the NP inhomogeneity, but we stil… ▽ More We have used scanning gate microscopy to explore the local conductivity of a current-annealed graphene flake. A map of the local neutrality point (NP) after annealing at low current density exhibits micron-sized inhomogeneities. Broadening of the local e-h transition is also correlated with the inhomogeneity of the NP. Annealing at higher current density reduces the NP inhomogeneity, but we still observe some asymmetry in the e-h conduction. We attribute this to a hole doped domain close to one of the metal contacts combined with underlying striations in the local NP. △ Less

Submitted 20 November, 2009; v1 submitted 19 November, 2009; originally announced November 2009.

Comments: 8 pages, 4 figures

Journal ref: Appl. Phys. Lett. 96, 113501 (2010)