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Characterization and formation of NV centers in 3C, 4H and 6H SiC: an \emph{ab initio} study
Authors:
A. Csóré,
H. J. von Bardeleben,
J. L. Cantin,
A. Gali
Abstract:
Fluorescent paramagnetic defects in solids have become attractive systems for quantum information processing in the recent years. One of the leading contenders is the negatively charged nitrogen-vacancy defect in diamond with visible emission but alternative solution in technologically mature host is an immediate quest for many applications in this field. It has been recently found that various po…
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Fluorescent paramagnetic defects in solids have become attractive systems for quantum information processing in the recent years. One of the leading contenders is the negatively charged nitrogen-vacancy defect in diamond with visible emission but alternative solution in technologically mature host is an immediate quest for many applications in this field. It has been recently found that various polytypes of silicon carbide (SiC), that are standard semiconductors with wafer scale technology, can host nitrogen-vacancy defect (NV) that could be an alternative qubit candidate with emission in the near infrared region. However, it is much less known about this defect than its counterpart in diamond. The inequivalent sites within a polytype and the polytype variations offer a family of NV defects. However, there is an insufficient knowledge on the magneto-optical properties of these configurations. Here we carry out density functional theory calculations, in order to characterize the numerous forms of NV defects in the most common polytypes of SiC including 3C, 4H and 6H, and we also provide new experimental data in 4H SiC. Our calculations mediate the identification of individual NV qubits in SiC polytypes. In addition, we discuss the formation of NV defects in SiC with providing detailed ionization energies of NV defect in SiC which reveals the critical optical excitation energies for ionizing this qubits in SiC. Our calculations unravel the challenges to produce NV defects in SiC with a desirable spin bath.
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Submitted 11 August, 2017; v1 submitted 17 May, 2017;
originally announced May 2017.
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Phosphorous alloying: controlling the magnetic anisotropy in ferromagnetic (Ga,Mn)(As,P) Layers
Authors:
M. Cubukcu,
H. J. von Bardeleben,
Kh. Khazen,
J. L. Cantin,
O. Mauguin,
L. Largeau,
A. Lemaitre
Abstract:
Phosphorous alloying of GaMnAs thin films has been used for the manipulation of the magnetic anisotropies in ferromagnetic Ga0.93Mn0.07As1-yPy layers. We have determined the anisotropy constants as a function of temperature for phosphorous alloying levels between 0 and 8.8 at % for a Mn doping level of ~ 7at%. We show that it is possible to obtain layers with robust ferromagnetism and either in-…
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Phosphorous alloying of GaMnAs thin films has been used for the manipulation of the magnetic anisotropies in ferromagnetic Ga0.93Mn0.07As1-yPy layers. We have determined the anisotropy constants as a function of temperature for phosphorous alloying levels between 0 and 8.8 at % for a Mn doping level of ~ 7at%. We show that it is possible to obtain layers with robust ferromagnetism and either in-plane or out-of plane easy axes with small barriers for magnetization reorientation by phosphorous alloying with y< 6at% or y> 6at%. The critical temperatures are not significantly increased by the P alloying.
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Submitted 10 August, 2009; v1 submitted 1 August, 2009;
originally announced August 2009.
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Damping and magnetic anisotropy of ferromagnetic GaMnAs thin films
Authors:
Kh. Khazen,
H. J. von Bardeleben,
M. Cubukcu,
J. L. Cantin,
V. Novak,
K. Olejnik,
M. Cukr,
L. Thevenard,
A. Lemaitre
Abstract:
The magnetic properties of annealed, epitaxial Ga0.93Mn0.07As layers under tensile and compressive stress have been investigated by X-band (9GHz) and Q-band (35GHz) ferromagnetic resonance (FMR) spectroscopy. From the analysis of the linewidths of the uniform mode spectra the FMR Gilbert damping factor "alpha" has been determined. At T=4K we obtain a minimum damping factor of "alpha" = 0.003 for…
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The magnetic properties of annealed, epitaxial Ga0.93Mn0.07As layers under tensile and compressive stress have been investigated by X-band (9GHz) and Q-band (35GHz) ferromagnetic resonance (FMR) spectroscopy. From the analysis of the linewidths of the uniform mode spectra the FMR Gilbert damping factor "alpha" has been determined. At T=4K we obtain a minimum damping factor of "alpha" = 0.003 for the compressively stressed layer. Its value is not isotropic. It has a minimum value for the easy axes orientations of the magnetic field and increases with the measuring temperature. Its average value is for both type of films of the order of 0.01 in spite of strong differences in the inhomogeneous linewidth which vary between 20 Oe and 600 Oe for the layers grown on GaAs and GaInAs substrates respectively.
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Submitted 30 September, 2008; v1 submitted 26 September, 2008;
originally announced September 2008.