Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers
Authors:
Leora E. Dresselhaus-Marais,
Bernard Kozioziemski,
Theodor S. Holstad,
Trygve Magnus Ræder,
Matthew Seaberg,
Daewoong Nam,
Sangsoo Kim,
Sean Breckling,
Seonghyuk Choi,
Matthieu Chollet,
Philip K. Cook,
Eric Folsom,
Eric Galtier,
Arnulfo Gonzalez,
Tais Gorhover,
Serge Guillet,
Kristoffer Haldrup,
Marylesa Howard,
Kento Katagiri,
Seonghan Kim,
Sunam Kim,
Sungwon Kim,
Hyunjung Kim,
Erik Bergback Knudsen,
Stephan Kuschel
, et al. (18 additional authors not shown)
Abstract:
The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the str…
▽ More
The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, Dark Field X-ray Microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $10^{12}$ photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.
△ Less
Submitted 5 September, 2023; v1 submitted 15 October, 2022;
originally announced October 2022.
In-Situ Visualization of Long-Range Defect Interactions at the Edge of Melting
Authors:
Leora E. Dresselhaus-Marais,
Grethe Winther,
Marylesa Howard,
Arnulfo Gonzalez,
Sean R. Breckling,
Can Yildirim,
Philip K. Cook,
Mustafacan Kutsal,
Hugh Simons,
Carsten Detlefs,
Jon H. Eggert,
Henning Friis Poulsen
Abstract:
Connecting a bulk material's microscopic defects to its macroscopic properties is an age-old problem in materials science. Long-range interactions between dislocations (line defects) are known to play a key role in how materials deform or melt, but we lack the tools to connect these dynamics to the macroscopic properties. We introduce time-resolved dark-field X-ray microscopy to directly visualize…
▽ More
Connecting a bulk material's microscopic defects to its macroscopic properties is an age-old problem in materials science. Long-range interactions between dislocations (line defects) are known to play a key role in how materials deform or melt, but we lack the tools to connect these dynamics to the macroscopic properties. We introduce time-resolved dark-field X-ray microscopy to directly visualize how dislocations move and interact over hundreds of micrometers, deep inside bulk aluminum. With real-time movies, we reveal the thermally-activated motion and interactions of dislocations that comprise a boundary, and show how weakened binding forces inhomogeneously destabilize the structure at 99% of the melting temperature. Connecting dynamics of the microstructure to its stability, we provide important opportunities to guide and validate multiscale models that are yet untested.
△ Less
Submitted 14 September, 2020; v1 submitted 10 September, 2020;
originally announced September 2020.
