Low Temperature Penetration depth of κ-(ET)_2Cu[N(CN)_2]Br and κ-(ET)_2Cu(NCS)_2
Authors:
A. Carrington,
I. J. Bonalde,
R. Prozorov,
R. W. Giannetta,
A. M. Kini,
J. Schlueter,
H. H. Wang,
U. Geiser,
J. M. Williams
Abstract:
We present high precision measurements of the penetration depth λof single crystals of κ-(ET)_2Cu[N(CN)2]Br and κ-(ET)_2Cu(NCS)_2 at temperature down to 0.4 K. We find that, at low temperatures, the in-plane penetration depth varies as a fractional power law, λ\sim T^1.5. W hilst this may be taken as evidence for novel bose excitation processes, we show that the data are also consistent with a q…
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We present high precision measurements of the penetration depth λof single crystals of κ-(ET)_2Cu[N(CN)2]Br and κ-(ET)_2Cu(NCS)_2 at temperature down to 0.4 K. We find that, at low temperatures, the in-plane penetration depth varies as a fractional power law, λ\sim T^1.5. W hilst this may be taken as evidence for novel bose excitation processes, we show that the data are also consistent with a quasi-linear variation of the superfluid density, as is expected for a d-wave superconductor with impurities. Our data for the interplane penetration depth show similar features and give a direct measurement of the absolute value, λ(0)=100\pm 20 μm.
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Submitted 27 August, 1999; v1 submitted 4 June, 1999;
originally announced June 1999.