Showing 1–3 of 3 results for author: Bielefeldt, H

Large grain boundary area superconductors

Authors: G. Hammerl, H. Bielefeldt, S. Leitenmeier, A. Schmehl, C. W. Schneider, A. Weber, J. Mannhart

Abstract: For many applications of polycrystalline high-Tc superconductors the small critical currents of the grain boundaries pose a severe problem. To solve this problem we derive novel designs for the microstructure of coated conductors. For many applications of polycrystalline high-Tc superconductors the small critical currents of the grain boundaries pose a severe problem. To solve this problem we derive novel designs for the microstructure of coated conductors. △ Less

Submitted 1 July, 2002; originally announced July 2002.

Comments: 11 pages, 4 figures

Journal ref: Eur. Phys. J. B, 27, 299-301 (2002)

Coated conductors containing grains with big aspect ratios

Authors: S. Leitenmeier, H. Bielefeldt, G. Hammerl, A. Schmehl, C. W. Schneider, J. Mannhart

Abstract: It is shown that the critical currents of high-Tc superconducting tapes fabricated by the coated conductor technologies are enhanced considerably if grain arrangements with large effective grain boundary areas are used. Increasing the aspect ratios of the grains reduces the deleterious effects of the grain boundaries. A practical road to competitive high-Tc cables is proposed. It is shown that the critical currents of high-Tc superconducting tapes fabricated by the coated conductor technologies are enhanced considerably if grain arrangements with large effective grain boundary areas are used. Increasing the aspect ratios of the grains reduces the deleterious effects of the grain boundaries. A practical road to competitive high-Tc cables is proposed. △ Less

Submitted 21 June, 2002; originally announced June 2002.

Comments: 8 pages, 5 figures included, to be published in Annalen der Physik

Imaging of atomic orbitals with the Atomic Force Microscope - experiments and simulations

Authors: F. J. Giessibl, H. Bielefeldt, S. Hembacher, J. Mannhart

Abstract: Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable symmetries of the images of single atoms are observed. These symmetries are related to the nature of the interatomic forces. The Si(111)-(7x7) surface is studied… ▽ More Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable symmetries of the images of single atoms are observed. These symmetries are related to the nature of the interatomic forces. The Si(111)-(7x7) surface is studied by AFM with various tips and AFM images are simulated with chemical and electrostatic model forces. The calculation of images from the tip-sample forces is explained in detail and the implications of the imaging parameters are discussed. Because the structure of the Si(111)-(7x7) surface is known very well, the shape of the adatom images is used to determine the tip structure. The observability of atomic orbitals by AFM and scanning tunneling microscopy is discussed. △ Less

Submitted 10 July, 2001; originally announced July 2001.

Comments: 21 pages, 17 figures

Journal ref: Ann. Phys. Leipzig, 10 2001 887