Controlling the thermal contact resistance of a carbon nanotube heat spreader
Authors:
Kamal H. Baloch,
Norvik Voskanian,
John Cumings
Abstract:
The ability to tune the thermal resistance of carbon nanotube mechanical supports from insulating to conducting could permit the next generation of thermal management devices. Here, we demonstrate fabrication techniques for carbon nanotube supports that realize either weak or strong thermal coupling, selectively. Direct imaging by in-situ electron thermal microscopy shows that the thermal contact…
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The ability to tune the thermal resistance of carbon nanotube mechanical supports from insulating to conducting could permit the next generation of thermal management devices. Here, we demonstrate fabrication techniques for carbon nanotube supports that realize either weak or strong thermal coupling, selectively. Direct imaging by in-situ electron thermal microscopy shows that the thermal contact resistance of a nanotube weakly-coupled to its support is greater than 250 K*m/W and that this value can be reduced to 4.2(+5.6/-2.1) K*m/W by imbedding the nanotube in metal contacts.
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Submitted 25 July, 2010;
originally announced July 2010.
Electron Thermal Microscopy
Authors:
Todd Brintlinger,
Yi Qi,
Kamal H. Baloch,
David Goldhaber-Gordon,
John Cumings
Abstract:
The progress of semiconductor electronics toward ever-smaller length scales and associated higher power densities brings a need for new high-resolution thermal microscopy techniques. Traditional thermal microscopy is performed by detecting infrared radiation with far-field optics, where the resolution is limited by the wavelength of the light. By adopting a serial, local-probe approach, near-fie…
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The progress of semiconductor electronics toward ever-smaller length scales and associated higher power densities brings a need for new high-resolution thermal microscopy techniques. Traditional thermal microscopy is performed by detecting infrared radiation with far-field optics, where the resolution is limited by the wavelength of the light. By adopting a serial, local-probe approach, near-field and scanned-probe microscopies can surpass this limit but sacrifice imaging speed. In the same way that electron microscopy was invented to overcome the resolution limits of light microscopy, we here demonstrate a thermal imaging technique that uses an electron microscope to overcome the limits of infrared thermal microscopy, without compromising imaging speed. With this new technique, which we call electron thermal microscopy, temperature is resolved by detecting the liquid-solid transition of arrays of nanoscale islands, producing thermal maps in real-time (30 thermal images per second over a 16um^2 field-of-view). The experimental demonstration is supported by combined electrical and thermal modeling.
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Submitted 20 August, 2007; v1 submitted 10 August, 2007;
originally announced August 2007.
