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Model validation and error attribution for a drifting qubit
Authors:
Malick A. Gaye,
Dylan Albrecht,
Steve Young,
Tameem Albash,
N. Tobias Jacobson
Abstract:
Qubit performance is often reported in terms of a variety of single-value metrics, each providing a facet of the underlying noise mechanism limiting performance. However, the value of these metrics may drift over long time-scales, and reporting a single number for qubit performance fails to account for the low-frequency noise processes that give rise to this drift. In this work, we demonstrate how…
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Qubit performance is often reported in terms of a variety of single-value metrics, each providing a facet of the underlying noise mechanism limiting performance. However, the value of these metrics may drift over long time-scales, and reporting a single number for qubit performance fails to account for the low-frequency noise processes that give rise to this drift. In this work, we demonstrate how we can use the distribution of these values to validate or invalidate candidate noise models. We focus on the case of randomized benchmarking (RB), where typically a single error rate is reported but this error rate can drift over time when multiple passes of RB are performed. We show that using a statistical test as simple as the Kolmogorov-Smirnov statistic on the distribution of RB error rates can be used to rule out noise models, assuming the experiment is performed over a long enough time interval to capture relevant low frequency noise. With confidence in a noise model, we show how care must be exercised when performing error attribution using the distribution of drifting RB error rate.
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Submitted 12 March, 2025; v1 submitted 27 November, 2024;
originally announced November 2024.
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Characterization of individual charge fluctuators in Si/SiGe quantum dots
Authors:
Feiyang Ye,
Ammar Ellaboudy,
Dylan Albrecht,
Rohith Vudatha,
N. Tobias Jacobson,
John M. Nichol
Abstract:
Electron spins in silicon quantum dots are excellent qubits due to their long coherence times, scalability, and compatibility with advanced semiconductor technology. Although high gate fidelities can be achieved with spin qubits, charge noise in the semiconductor environment still hinders further improvements. Despite the importance of charge noise, key questions about the specific nature of the f…
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Electron spins in silicon quantum dots are excellent qubits due to their long coherence times, scalability, and compatibility with advanced semiconductor technology. Although high gate fidelities can be achieved with spin qubits, charge noise in the semiconductor environment still hinders further improvements. Despite the importance of charge noise, key questions about the specific nature of the fluctuators that cause charge noise remain unanswered. Here, we probe individual two-level fluctuators (TLFs) in Si/SiGe quantum dots through simple quantum-dot transport measurements and analyses based on the Allan variance and factorial hidden Markov modeling. We find that the TLF switching times depend sensitively on gate voltages, decrease with temperature, and depend on the current through a nearby quantum dot. A model for the data of the primary TLF we study indicates that it may be a bistable charge dipole near the plunger gate electrode, heated by current through the sensor dot, and experiencing state transitions driven not by direct electron-phonon coupling but through some other mechanism such as coupling to electrons passing through the sensor dot.
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Submitted 12 December, 2024; v1 submitted 25 January, 2024;
originally announced January 2024.
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A comparison of a commercial hydrodynamics TCAD solver and Fermi kinetics transport convergence for GaN HEMTs
Authors:
Ashwin Tunga,
Kexin Li,
Nicholas C. Miller,
Matt Grupen,
John D. Albrecht,
Shaloo Rakheja
Abstract:
Various simulations of a GaN HEMT are used to study the behaviors of two different energy-transport models: the Fermi kinetics transport model and a hydrodynamics transport model as it is implemented in the device simulator Sentaurus from Synopsys. The electron transport and heat flow equations of the respective solvers are described in detail. The differences in the description of electron flux a…
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Various simulations of a GaN HEMT are used to study the behaviors of two different energy-transport models: the Fermi kinetics transport model and a hydrodynamics transport model as it is implemented in the device simulator Sentaurus from Synopsys. The electron transport and heat flow equations of the respective solvers are described in detail. The differences in the description of electron flux and the discretization methods are highlighted. Next, the transport models are applied to the same simulated device structure using identical meshes, boundary conditions, and material parameters. Static simulations show the numerical convergence of Fermi kinetics to be consistently quadratic or faster, whereas the hydrodynamic model is often sub-quadratic. Further comparisons of large signal transient simulations reveal the hydrodynamic model produces certain anomalous electron ensemble behaviors within the transistor structure. The fundamentally different electron dynamics produced by the two models suggest an underlying cause for their different numerical convergence characteristics.
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Submitted 6 August, 2022;
originally announced August 2022.
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Deconstructing Superconductivity
Authors:
Dylan Albrecht,
Christopher D. Carone,
Joshua Erlich
Abstract:
We present a dimensionally deconstructed model of an s-wave holographic superconductor. The 2+1 dimensional model includes multiple charged Cooper pair fields and neutral exciton fields that have interactions governed by hidden local symmetries. We derive AdS/CFT-like relations for the current and charge density in the model, and we analyze properties of the Cooper pair condensates and the complex…
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We present a dimensionally deconstructed model of an s-wave holographic superconductor. The 2+1 dimensional model includes multiple charged Cooper pair fields and neutral exciton fields that have interactions governed by hidden local symmetries. We derive AdS/CFT-like relations for the current and charge density in the model, and we analyze properties of the Cooper pair condensates and the complex conductivity.
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Submitted 21 August, 2012; v1 submitted 13 August, 2012;
originally announced August 2012.
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Energy levels in polarization superlattices: a comparison of continuum strain models
Authors:
B. Jogai,
J. D. Albrecht,
E. Pan
Abstract:
A theoretical model for the energy levels in polarization superlattices is presented. The model includes the effect of strain on the local polarization-induced electric fields and the subsequent effect on the energy levels. Two continuum strain models are contrasted. One is the standard strain model derived from Hooke's law that is typically used to calculate energy levels in polarization superl…
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A theoretical model for the energy levels in polarization superlattices is presented. The model includes the effect of strain on the local polarization-induced electric fields and the subsequent effect on the energy levels. Two continuum strain models are contrasted. One is the standard strain model derived from Hooke's law that is typically used to calculate energy levels in polarization superlattices and quantum wells. The other is a fully-coupled strain model derived from the thermodynamic equation of state for piezoelectric materials. The latter is more complete and applicable to strongly piezoelectric materials where corrections to the standard model are significant. The underlying theory has been applied to AlGaN/GaN superlattices and quantum wells. It is found that the fully-coupled strain model yields very different electric fields from the standard model. The calculated intersubband transition energies are shifted by approximately 5 -- 19 meV, depending on the structure. Thus from a device standpoint, the effect of applying the fully-coupled model produces a very measurable shift in the peak wavelength. This result has implications for the design of AlGaN/GaN optical switches.
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Submitted 3 November, 2003;
originally announced November 2003.
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Electromechanical coupling in free-standing AlGaN/GaN planar structures
Authors:
B. Jogai,
J. D. Albrecht,
E. Pan
Abstract:
The strain and electric fields present in free-standing AlGaN/GaN slabs are examined theoretically within the framework of fully-coupled continuum elastic and dielectric models. Simultaneous solutions for the electric field and strain components are obtained by minimizing the electric enthalpy. We apply constraints appropriate to pseudomorphic semiconductor epitaxial layers and obtain closed-for…
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The strain and electric fields present in free-standing AlGaN/GaN slabs are examined theoretically within the framework of fully-coupled continuum elastic and dielectric models. Simultaneous solutions for the electric field and strain components are obtained by minimizing the electric enthalpy. We apply constraints appropriate to pseudomorphic semiconductor epitaxial layers and obtain closed-form analytic expressions that take into account the wurtzite crystal anisotropy. It is shown that in the absence of free charges, the calculated strain and electric fields are substantially differently from those obtained using the standard model without electromechanical coupling. It is also shown, however, that when a two-dimensional electron gas is present at the AlGaN/GaN interface, a condition that is the basis for heterojunction field-effect transistors, the electromechanical coupling is screened and the decoupled model is once again a good approximation. Specific cases of these calculations corresponding to transistor and superlattice structures are discussed.
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Submitted 12 June, 2003;
originally announced June 2003.
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The effect of electromechanical coupling on the strain in AlGaN/GaN heterojunction field effect transistors
Authors:
B. Jogai,
J. D. Albrecht,
E. Pan
Abstract:
The strain in AlGaN/GaN heterojunction field-effect transistors (HFETs) is examined theoretically in the context of the fully-coupled equation of state for piezoelectric materials. Using a simple analytical model, it is shown that, in the absence of a two-dimensional electron gas (2DEG), the out-of-plane strain obtained without electromechanical coupling is in error by about 30% for an Al fracti…
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The strain in AlGaN/GaN heterojunction field-effect transistors (HFETs) is examined theoretically in the context of the fully-coupled equation of state for piezoelectric materials. Using a simple analytical model, it is shown that, in the absence of a two-dimensional electron gas (2DEG), the out-of-plane strain obtained without electromechanical coupling is in error by about 30% for an Al fraction of 0.3. This result has consequences for the calculation of quantities that depend directly on the strain tensor. These quantities include the eigenstates and electrostatic potential in AlGaN/GaN heterostructures. It is shown that for an HFET, the electromechanical coupling is screened by the 2DEG. Results for the electromechanical model, including the 2DEG, indicate that the standard (decoupled) strain model is a reasonable approximation for HFET calculataions. The analytical results are supported by a self-consistent Schrödinger-Poisson calculation that includes the fully-coupled equation of state together with the charge-balance equation.
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Submitted 11 June, 2003;
originally announced June 2003.
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Spin-Polarized Electron Transport at Ferromagnet/Semiconductor Schottky Contacts
Authors:
J. D. Albrecht,
D. L. Smith
Abstract:
We theoretically investigate electron spin injection and spin-polarization sensitive current detection at Schottky contacts between a ferromagnetic metal and an n-type or p-type semiconductor. We use spin-dependent continuity equations and transport equations at the drift-diffusion level of approximation. Spin-polarized electron current and density in the semiconductor are described for four sce…
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We theoretically investigate electron spin injection and spin-polarization sensitive current detection at Schottky contacts between a ferromagnetic metal and an n-type or p-type semiconductor. We use spin-dependent continuity equations and transport equations at the drift-diffusion level of approximation. Spin-polarized electron current and density in the semiconductor are described for four scenarios corresponding to the injection or the collection of spin polarized electrons at Schottky contacts to n-type or p-type semiconductors. The transport properties of the interface are described by a spin-dependent interface resistance, resulting from an interfacial tunneling region. The spin-dependent interface resistance is crucial for achieving spin injection or spin polarization sensitivity in these configurations. We find that the depletion region resulting from Schottky barrier formation at a metal/semiconductor interface is detrimental to both spin injection and spin detection. However, the depletion region can be tailored using a doping density profile to minimize these deleterious effects. For example, a heavily doped region near the interface, such as a delta-doped layer, can be used to form a sharp potential profile through which electrons tunnel to reduce the effective Schottky energy barrier that determines the magnitude of the depletion region. The model results indicate that efficient spin-injection and spin-polarization detection can be achieved in properly designed structures and can serve as a guide for the structure design.
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Submitted 24 February, 2003;
originally announced February 2003.
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Electron Spin Injection at a Schottky Contact
Authors:
J. D. Albrecht,
D. L. Smith
Abstract:
We investigate theoretically electrical spin injection at a Schottky contact between a spin-polarized electrode and a non-magnetic semiconductor. Current and electron density spin-polarizations are discussed as functions of barrier energy and semiconductor doping density. The effect of a spin-dependent interface resistance that results from a tunneling region at the contact/semiconductor interfa…
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We investigate theoretically electrical spin injection at a Schottky contact between a spin-polarized electrode and a non-magnetic semiconductor. Current and electron density spin-polarizations are discussed as functions of barrier energy and semiconductor doping density. The effect of a spin-dependent interface resistance that results from a tunneling region at the contact/semiconductor interface is described. The model can serve as a guide for designing spin-injection experiments with regard to the interface properties and device structure.
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Submitted 7 February, 2002;
originally announced February 2002.