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Single-exposure elemental differentiation and texture-sensitive phase-retrieval imaging with a neutron counting micro-channel plate detector
Authors:
Benedicta D. Arhatari,
David M. Paganin,
Henry Kirkwood,
Anton S. Tremsin,
Timur E. Gureyev,
Alexander M. Korsunsky,
Winfried Kockelmann,
Felix Hofmann,
Eric Huwald,
Shu-Yan Zhang,
Joe Kelleher,
Brian Abbey
Abstract:
Micro-channel plate (MCP) detectors, when used at pulsed-neutron-source instruments, offer the possibility of high spatial resolution and high contrast imaging with pixel-level spectroscopic information. Here we demonstrate the possibility of multimodal analysis including total neutron cross-section spectra measurements, quantitative material differentiation imaging and texture-sensitive in-line p…
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Micro-channel plate (MCP) detectors, when used at pulsed-neutron-source instruments, offer the possibility of high spatial resolution and high contrast imaging with pixel-level spectroscopic information. Here we demonstrate the possibility of multimodal analysis including total neutron cross-section spectra measurements, quantitative material differentiation imaging and texture-sensitive in-line phase imaging, from a single exposure using an MCP detector. This multimodal approach operates in full-field imaging mode, with the neutron transmission spectra acquired at each individual detector pixel. Due to the polychromatic nature of the beam and spectroscopic resolving capability of the detector, no energy scanning is required. Good agreement with the library reference data is demonstrated for neutron cross-section spectra measurements. Two different images corresponding to two selected energy bandwidths are used for elemental differentiation imaging. Moreover, the presence of changes in texture, i.e., preferred grain orientation, in the sample is identified from our phase-retrieval imaging results.
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Submitted 27 April, 2024; v1 submitted 8 November, 2023;
originally announced November 2023.
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Coherent X-ray measurements of ion-implantation-induced lattice strains in nano-crystals
Authors:
Felix Hofmann,
Edmund Tarleton,
Ross J. Harder,
Nicholas W. Phillips,
Jesse N. Clark,
Ian K. Robinson,
Brian Abbey,
Wenjun Liu,
Christian E. Beck
Abstract:
Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. By manipulating a tightly focussed beam of energetic ions, often gallium (Ga+), FIB can sculpt nanostructures via localised sputtering. This ability to cut solid matter on the nano-scale has revolutionised sample preparation across the life-, earth- and materials sciences. For example FIB is central to microchip prototyping, 3D…
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Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. By manipulating a tightly focussed beam of energetic ions, often gallium (Ga+), FIB can sculpt nanostructures via localised sputtering. This ability to cut solid matter on the nano-scale has revolutionised sample preparation across the life-, earth- and materials sciences. For example FIB is central to microchip prototyping, 3D material analysis, targeted electron microscopy sample extraction and the nanotechnology behind size-dependent material properties. Despite its widespread usage, detailed understanding of the functional consequences of FIB-induced structural damage, intrinsic to the technique, remains elusive. Here, we present nano-scale measurements of three-dimensional, FIB-induced lattice strains, probed using Bragg Coherent X-ray Diffraction Imaging (BCDI). We observe that even low gallium ion doses, typical of FIB imaging, cause substantial lattice distortions. At higher doses, extended self-organised defect structures appear, giving rise to stresses far in excess of the bulk yield limit. Combined with detailed numerical calculations, these observations provide fundamental insight into the nature of the damage created and the structural instabilities that lead to a surprisingly inhomogeneous morphology.
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Submitted 30 March, 2016;
originally announced March 2016.
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Femtosecond X-ray Laser induced transient electronic phase change observed in fullerene C60
Authors:
Brian Abbey,
Ruben A. Dilanian,
Connie Darmanin,
Rebecca A. Ryan,
Corey T. Putkunz,
Andrew V. Martin,
Victor Streltsov,
Michael W. M. Jones,
Naylyn Gaffney,
Felix Hofmann,
Garth J. Williams,
Sebastian Boutet,
Marc Messerschmidt,
M. Marvin Siebert,
Sophie Williams,
Evan Curwood,
Eugeniu Balaur,
Andrew G. Peele,
Keith A. Nugent,
Harry M. Quiney
Abstract:
X-ray Free-Electron Lasers (XFELs) deliver X-ray pulses with a coherent flux that is approximately eight orders of magnitude greater than that available from a modern third generation synchrotron source. The power density in an XFEL pulse may be so high that it can modify the electronic properties of a sample on a femtosecond timescale. Exploration of the interaction of intense coherent X-ray puls…
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X-ray Free-Electron Lasers (XFELs) deliver X-ray pulses with a coherent flux that is approximately eight orders of magnitude greater than that available from a modern third generation synchrotron source. The power density in an XFEL pulse may be so high that it can modify the electronic properties of a sample on a femtosecond timescale. Exploration of the interaction of intense coherent X-ray pulses and matter is of both intrinsic scientific interest, and of critical importance to the interpretation of experiments that probe the structures of materials using high-brightness femtosecond XFEL pulses. In this letter, we report observations of the diffraction of an extremely intense 32 fs nanofocused X-ray pulses by a powder sample of crystalline C60. We find that the diffraction pattern at the highest available incident power exhibits significant structural signatures that are absent in data obtained at both third-generation synchrotron sources or from XFEL sources operating at low output power. These signatures are consistent with a highly ordered structure that does not correspond with any previously known phase of crystalline C60. We argue that these data indicate the formation of a transient phase that is formed by a dynamic electronic distortion induced by inner-shell ionisation of at least one carbon atom in each C60 molecule.
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Submitted 24 September, 2012;
originally announced September 2012.
