Showing 1–1 of 1 results for author: Kupinski, M
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Mueller matrix maps of dichroic filters reveal polarization aberrations
Authors:
James Heath,
Meredith Kupinski,
Ewan Douglas,
Kira Hart,
James Breckinridge
Abstract:
Dichroic filters are used by instrument designers to split a field of view into different optical paths for simultaneous measurement of different spectral bands. Quantifying the polarization aberrations of a dichroic is relevant for predicting the incident polarization states downstream, which could affect the performance of diffraction limited systems. One important application is the fore-optics…
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Dichroic filters are used by instrument designers to split a field of view into different optical paths for simultaneous measurement of different spectral bands. Quantifying the polarization aberrations of a dichroic is relevant for predicting the incident polarization states downstream, which could affect the performance of diffraction limited systems. One important application is the fore-optics of exoplanet imaging coronagraphs. In this work, the polarization properties of the Edmund #69-205 650 nm roll-off dichroic are measured using a rotating retarder Mueller matrix imaging polarimeter. The polarization properties of this commercial dichroic are compared at normal and 45$^{\circ}$ angle of incidence. The normal incidence measurements verify the instrument calibration since no polarization aberrations were observed. Transmission measurements at 680 nm and 45$^{\circ}$ yield a 2.9 rad magnitude of retardance and 0.95 diattenuation. Effectively, at 630 nm the dichroic is a $λ$/4 waveplate with a horizontal fast-axis.
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Submitted 22 December, 2020;
originally announced December 2020.