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Toward volume manufacturing of high-performance soft x-ray critical-angle transmission gratings
Authors:
Ralf K. Heilmann,
Alexander R. Bruccoleri,
Jungki Song,
Matthew T. Cook,
James A. Gregory,
Renee D. Lambert,
Dimitri A. Shapiro,
Douglas J. Young,
Miranda Bradshaw,
Vadim Burwitz,
Gisela D. Hartner,
Andreas Langmeier,
Randall K. Smith,
Mark L. Schattenburg
Abstract:
High-resolution ($R = λ/Δλ> 2000$) x-ray absorption and emission line spectroscopy in the soft x-ray band is a crucial diagnostic for the exploration of the properties of ubiquitous warm and hot plasmas and their dynamics in the cosmic web, galaxy clusters, galaxy halos, intragalactic space, and star atmospheres. Soft x-ray grating spectroscopy with $R > 10{,}000$ has been demonstrated with critic…
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High-resolution ($R = λ/Δλ> 2000$) x-ray absorption and emission line spectroscopy in the soft x-ray band is a crucial diagnostic for the exploration of the properties of ubiquitous warm and hot plasmas and their dynamics in the cosmic web, galaxy clusters, galaxy halos, intragalactic space, and star atmospheres. Soft x-ray grating spectroscopy with $R > 10{,}000$ has been demonstrated with critical-angle transmission (CAT) gratings. CAT gratings combine the relaxed alignment and temperature tolerances and low mass of transmission gratings with high diffraction efficiency blazed in high orders. They are an enabling technology for the proposed Arcus grating explorer and were selected for the Lynx design reference mission grating spectrometer instrument. Both Arcus and Lynx require the manufacture of hundreds to perhaps $\approx 2000$ large-area CAT gratings. We are developing new patterning and fabrication process sequences that are conducive to large-format volume processing on state-of-the-art 200 mm wafer tools. Recent x-ray tests on 200 nm-period gratings patterned using e-beam-written masks and 4x projection lithography in conjunction with silicon pore focusing optics demonstrated $R \approx 10^4$ at 1.49 keV. Extending the grating depth from 4 $μ$m to 6 $μ$m is predicted to lead to significant improvements in diffraction efficiency and is part of our current efforts using a combination of deep reactive-ion etching and wet etching in KOH solution. We describe our recent progress in grating fabrication and report our latest diffraction efficiency and modeling results.
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Submitted 8 December, 2020;
originally announced December 2020.
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Performance Testing of a Novel Off-plane Reflection Grating and Silicon Pore Optic Spectrograph at PANTER
Authors:
Hannah Marlowe,
Randall L. McEntaffer,
Ryan Allured,
Casey DeRoo,
Drew M. Miles,
Benjamin D. Donovan,
James H. Tutt,
Vadim Burwitz,
Benedikt Menz,
Gisela D. Hartner,
Randall K. Smith,
Ramses Günther,
Alex Yanson,
Giuseppe Vacanti,
Marcelo Ackermann
Abstract:
An X-ray spectrograph consisting of radially ruled off-plane reflection gratings and silicon pore optics was tested at the Max Planck Institute for extraterrestrial Physics PANTER X-ray test facility. The silicon pore optic (SPO) stack used is a test module for the Arcus small explorer mission, which will also feature aligned off-plane reflection gratings. This test is the first time two off-plane…
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An X-ray spectrograph consisting of radially ruled off-plane reflection gratings and silicon pore optics was tested at the Max Planck Institute for extraterrestrial Physics PANTER X-ray test facility. The silicon pore optic (SPO) stack used is a test module for the Arcus small explorer mission, which will also feature aligned off-plane reflection gratings. This test is the first time two off-plane gratings were actively aligned to each other and with a SPO to produce an overlapped spectrum. The gratings were aligned using an active alignment module which allows for the independent manipulation of subsequent gratings to a reference grating in three degrees of freedom using picomotor actuators which are controllable external to the test chamber. We report the line spread functions of the spectrograph and the actively aligned gratings, and plans for future development.
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Submitted 19 March, 2015;
originally announced March 2015.
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The Swift X-ray Telescope
Authors:
David N. Burrows,
J. E. Hill,
J. A. Nousek,
J. A. Kennea,
A. Wells,
J. P. Osborne,
A. F. Abbey,
A. Beardmore,
K Mukerjee,
A. D. T. Short,
G. Chincarini,
S. Campana,
O. Citterio,
A. Moretti,
C. Pagani,
G. Tagliaferri,
P. Giommi,
M. Capalbi,
F. Tamburelli,
L. Angelini,
G. Cusumano,
H. W. Braeuninger,
W. Burkert,
G. D. Hartner
Abstract:
The Swift Gamma-Ray Explorer is designed to make prompt multiwavelength observations of Gamma-Ray Bursts (GRBs) and GRB afterglows. The X-ray Telescope (XRT) enables Swift to determine GRB positions with a few arcseconds accuracy within 100 seconds of the burst onset.
The XRT utilizes a mirror set built for JET-X and an XMM/EPIC MOS CCD detector to provide a sensitive broad-band (0.2-10 keV) X…
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The Swift Gamma-Ray Explorer is designed to make prompt multiwavelength observations of Gamma-Ray Bursts (GRBs) and GRB afterglows. The X-ray Telescope (XRT) enables Swift to determine GRB positions with a few arcseconds accuracy within 100 seconds of the burst onset.
The XRT utilizes a mirror set built for JET-X and an XMM/EPIC MOS CCD detector to provide a sensitive broad-band (0.2-10 keV) X-ray imager with effective area of > 120 cm^2 at 1.5 keV, field of view of 23.6 x 23.6 arcminutes, and angular resolution of 18 arcseconds (HPD). The detection sensitivity is 2x10^-14 erg cm^-2 s^-1 in 10^4 seconds. The instrument is designed to provide automated source detection and position reporting within 5 seconds of target acquisition. It can also measure the redshifts of GRBs with Fe line emission or other spectral features. The XRT operates in an auto-exposure mode, adjusting the CCD readout mode automatically to optimize the science return for each frame as the source intensity fades. The XRT will measure spectra and lightcurves of the GRB afterglow beginning about a minute after the burst and will follow each burst for days or weeks.
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Submitted 2 August, 2005;
originally announced August 2005.
