Experimental N V and Ne VIII low-temperature dielectronic recombination rate coefficients
Authors:
S. Boehm,
A. Mueller,
S. Schippers,
W. Shi,
M. Fogle,
P. Glans,
R. Schuch,
H. Danared
Abstract:
The dielectronic recombination rate coefficients of N V and Ne VIII ions have been measured at a heavy-ion storage ring. The investigated energy ranges covered all dielectronic recombination resonances attached to 2s -> 2p (Delta n=0) core excitations. The rate coefficients in a plasma are derived and parameterized by using a convenient fit formula. The experimentally derived rate coefficients a…
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The dielectronic recombination rate coefficients of N V and Ne VIII ions have been measured at a heavy-ion storage ring. The investigated energy ranges covered all dielectronic recombination resonances attached to 2s -> 2p (Delta n=0) core excitations. The rate coefficients in a plasma are derived and parameterized by using a convenient fit formula. The experimentally derived rate coefficients are compared with theoretical data by Colgan et al. (2004, A&A, 417, 1183) and Nahar & Pradhan (1997, ApJ, 111, 339) as well as with the recommended rate coefficients by Mazzotta et al. (1998, A&A, 133, 403). The data of Colgan et al. and Nahar & Pradhan reproduce the experiment very well over the temperature ranges where N V and Ne VIII are expected to exist in photoionized as well as in collisionally ionized plasmas. In contrast, the recommendation of Mazzotta et al. agrees with the experimental rate coefficient only in the temperature range of collisional ionization. At lower temperatures it deviates from the measured rate coefficient by orders of magnitude. In addition the influence of external electric fields with field strengths up to 1300 V/cm on the dielectronic recombination rate coefficient has been investigated.
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Submitted 9 March, 2005;
originally announced March 2005.
