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Evaluating the Performance of LLMs on Technical Language Processing tasks
Authors:
Andrew Kernycky,
David Coleman,
Christopher Spence,
Udayan Das
Abstract:
In this paper we present the results of an evaluation study of the perfor-mance of LLMs on Technical Language Processing tasks. Humans are often confronted with tasks in which they have to gather information from dispar-ate sources and require making sense of large bodies of text. These tasks can be significantly complex for humans and often require deep study including rereading portions of a tex…
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In this paper we present the results of an evaluation study of the perfor-mance of LLMs on Technical Language Processing tasks. Humans are often confronted with tasks in which they have to gather information from dispar-ate sources and require making sense of large bodies of text. These tasks can be significantly complex for humans and often require deep study including rereading portions of a text. Towards simplifying the task of gathering in-formation we evaluated LLMs with chat interfaces for their ability to provide answers to standard questions that a human can be expected to answer based on their reading of a body of text. The body of text under study is Title 47 of the United States Code of Federal Regulations (CFR) which describes regula-tions for commercial telecommunications as governed by the Federal Com-munications Commission (FCC). This has been a body of text of interest be-cause our larger research concerns the issue of making sense of information related to Wireless Spectrum Governance and usage in an automated manner to support Dynamic Spectrum Access. The information concerning this wireless spectrum domain is found in many disparate sources, with Title 47 of the CFR being just one of many. Using a range of LLMs and providing the required CFR text as context we were able to quantify the performance of those LLMs on the specific task of answering the questions below.
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Submitted 21 March, 2024;
originally announced March 2024.
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Classical and semi-classical limits in phase space
Authors:
Clay D. Spence
Abstract:
A semiclassical approximation is derived by using a family of wavepackets to map arbitrary wavefunctions into phase space. If the Hamiltonian can be approximated as linear over each individual wavepacket, as often done when presenting Ehrenfest's theorem, the resulting approximation is a linear first-order partial differential equation on phase space, which will be referred to as the Schrödinger-E…
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A semiclassical approximation is derived by using a family of wavepackets to map arbitrary wavefunctions into phase space. If the Hamiltonian can be approximated as linear over each individual wavepacket, as often done when presenting Ehrenfest's theorem, the resulting approximation is a linear first-order partial differential equation on phase space, which will be referred to as the Schrödinger-Ehrenfest or SE equation. This advectively transports wavefunctions along classical trajectories, so that as a trajectory is followed in time the amplitude remains constant while the phase changes by the action divided by $\hbar$. The wavefunction's squared-magnitude is a plausible phase space density and obeys Liouville's equation for the classical time evolution. This is a derivation of the Koopman-von~Neumann (KvN) formulation of classical mechanics, which previously was postulated but not derived. With the time-independent SE equation, continuity of the wavefunction requires the change of phase around any closed path in the torus covered by a classical trajectory to be an integer multiple of $2π$, giving a standing wave picture of old quantum mechanics. While this applies to any system, for separable systems it gives Bohr-Sommerfeld quantization.
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Submitted 28 April, 2024; v1 submitted 29 May, 2023;
originally announced May 2023.
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Electrical manipulation of a single electron spin in CMOS with micromagnet and spin-valley coupling
Authors:
Bernhard Klemt,
Victor El-Homsy,
Martin Nurizzo,
Pierre Hamonic,
Biel Martinez,
Bruna Cardoso Paz,
Cameron spence,
Matthieu Dartiailh,
Baptiste Jadot,
Emmanuel Chanrion,
Vivien Thiney,
Renan Lethiecq,
Benoit Bertrand,
Heimanu Niebojewski,
Christopher Bäuerle,
Maud Vinet,
Yann-Michel Niquet,
Tristan Meunier,
Matias Urdampilleta
Abstract:
For semiconductor spin qubits, complementary-metal-oxide-semiconductor (CMOS) technology is the ideal candidate for reliable and scalable fabrication. Making the direct leap from academic fabrication to qubits fabricated fully by industrial CMOS standards is difficult without intermediate solutions. With a flexible back-end-of-line (BEOL) new functionalities such as micromagnets or superconducting…
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For semiconductor spin qubits, complementary-metal-oxide-semiconductor (CMOS) technology is the ideal candidate for reliable and scalable fabrication. Making the direct leap from academic fabrication to qubits fabricated fully by industrial CMOS standards is difficult without intermediate solutions. With a flexible back-end-of-line (BEOL) new functionalities such as micromagnets or superconducting circuits can be added in a post-CMOS process to study the physics of these devices or achieve proof of concepts. Once the process is established it can be incorporated in the foundry-compatible process flow. Here, we study a single electron spin qubit in a CMOS device with a micromagnet integrated in the flexible BEOL. We exploit the synthetic spin orbit coupling (SOC) to control the qubit via electric field and we investigate the spin-valley physics in the presence of SOC where we show an enhancement of the Rabi frequency at the spin-valley hotspot. Finally, we probe the high frequency noise in the system using dynamical decoupling pulse sequences and demonstrate that charge noise dominates the qubit decoherence in this range.
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Submitted 8 March, 2023;
originally announced March 2023.
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Probing charge noise in few electron CMOS quantum dots
Authors:
Cameron Spence,
Bruna Cardoso-Paz,
Vincent Michal,
Emmanuel Chanrion,
David J. Niegemann,
Baptiste Jadot,
Pierre-André Mortemousque,
Bernhard Klemt,
Vivien Thiney,
Benoit Bertrand,
Louis Hutin,
Christopher Bäuerle,
Franck Balestro,
Maud Vinet,
Yann-Michel Niquet,
Tristan Meunier,
Matias Urdampilleta
Abstract:
Charge noise is one of the main sources of environmental decoherence for spin qubits in silicon, presenting a major obstacle in the path towards highly scalable and reproducible qubit fabrication.
Here we demonstrate in-depth characterization of the charge noise environment experienced by a quantum dot in a CMOS-fabricated silicon nanowire.
We probe the charge noise for different quantum dot c…
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Charge noise is one of the main sources of environmental decoherence for spin qubits in silicon, presenting a major obstacle in the path towards highly scalable and reproducible qubit fabrication.
Here we demonstrate in-depth characterization of the charge noise environment experienced by a quantum dot in a CMOS-fabricated silicon nanowire.
We probe the charge noise for different quantum dot configurations, finding that it is possible to tune the charge noise over two orders of magnitude, ranging from 1 ueV^2 to 100 ueV^2. In particular, we show that the top interface and the reservoirs are the main sources of charge noise and their effect can be mitigated by controlling the quantum dot extension.
Additionally, we demonstrate a novel method for the measurement of the charge noise experienced by a quantum dot in the few electron regime.
We measure a comparatively higher charge noise value of 40 ueV^2 at the first electron, and demonstrate that the charge noise is highly dependent on the electron occupancy of the quantum dot.
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Submitted 5 September, 2022;
originally announced September 2022.
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Effects of Mixed Distribution Statistical Flood Frequency Models on Dam Safety Assessments: A Case Study of the Pueblo Dam, USA
Authors:
K. J. Roop-Eckart,
Sanjib Sharma,
Mahkameh Zarekarizi,
Ben Seiyon Lee,
Caitlin Spence,
Tess Russo,
Klaus Keller
Abstract:
Statistical flood frequency analysis coupled with hydrograph scaling is commonly used to generate design floods to assess dam safety assessment. The safety assessments can be highly sensitive to the choice of the statistical flood frequency model. Standard dam safety assessments are typically based on a single distribution model of flood frequency, often the Log Pearson Type III or Generalized Ext…
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Statistical flood frequency analysis coupled with hydrograph scaling is commonly used to generate design floods to assess dam safety assessment. The safety assessments can be highly sensitive to the choice of the statistical flood frequency model. Standard dam safety assessments are typically based on a single distribution model of flood frequency, often the Log Pearson Type III or Generalized Extreme Value distributions. Floods, however, may result from multiple physical processes such as rain on snow, snowmelt or rainstorms. This can result in a mixed distribution of annual peak flows, according to the cause of each flood. Engineering design choices based on a single distribution statistical model are vulnerable to the effects of this potential structural model error. To explore the practicality and potential value of implementing mixed distribution statistical models in engineering design, we compare the goodness of fit of several single- and mixed-distribution peak flow models, as well as the contingent dam safety assessment at Pueblo, Colorado as a didactic example. Summer snowmelt and intense summer rainstorms are both key drivers of annual peak flow at Pueblo. We analyze the potential implications for the annual probability of overtopping-induced failure of the Pueblo Dam as a didactic example. We address the temporal and physical cause separation problems by building on previous work with mixed distributions. We find a Mixed Generalized Extreme Value distribution model best fits peak flows observed in the gaged record, historical floods, and paleo floods at Pueblo. Finally, we show that accounting for mixed distributions in the safety assessment at Pueblo Dam increases the assessed risk of overtopping.
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Submitted 3 November, 2021;
originally announced November 2021.
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Spin-valley coupling anisotropy and noise in CMOS quantum dots
Authors:
Cameron Spence,
Bruna Cardoso Paz,
Bernhard Klemt,
Emmanuel Chanrion,
David J. Niegemann,
Baptiste Jadot,
Vivien Thiney,
Benoit Bertrand,
Heimanu Niebojewski,
Pierre-André Mortemousque,
Xavier Jehl,
Romain Maurand,
Silvano De Franceschi,
Maud Vinet,
Franck Balestro,
Christopher Bäuerle,
Yann-Michel Niquet,
Tristan Meunier,
Matias Urdampilleta
Abstract:
One of the main advantages of silicon spin qubits over other solid-state qubits is their inherent scalability and compatibility with the 300 mm CMOS fabrication technology that is already widely used in the semiconductor industry, whilst maintaining high readout and gate fidelities. We demonstrate detection of a single electron spin using energy-selective readout in a CMOS-fabricated nanowire devi…
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One of the main advantages of silicon spin qubits over other solid-state qubits is their inherent scalability and compatibility with the 300 mm CMOS fabrication technology that is already widely used in the semiconductor industry, whilst maintaining high readout and gate fidelities. We demonstrate detection of a single electron spin using energy-selective readout in a CMOS-fabricated nanowire device with an integrated charge detector. We measure a valley splitting of 0.3 meV and 0.16 meV in two similar devices. The anisotropy of the spin-valley mixing is measured and shown to follow the dependence expected from the symmetry of the local confinement, indicating low disorder in the region of the quantum dot. Finally the charge noise in the spin-valley coupling regime is investigated and found to induce fluctuations in the qubit energy in the range of $0.6GHz/\sqrt{Hz}$.
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Submitted 28 September, 2021;
originally announced September 2021.
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Unsupervised learning approaches to characterize heterogeneous samples using X-ray single particle imaging
Authors:
Yulong Zhuang,
Salah Awel,
Anton Barty,
Richard Bean,
Johan Bielecki,
Martin Bergemann,
Benedikt J. Daurer,
Tomas Ekeberg,
Armando D. Estillore,
Hans Fangohr,
Klaus Giewekemeyer,
Mark S. Hunter,
Mikhail Karnevskiy,
Richard A. Kirian,
Henry Kirkwood,
Yoonhee Kim,
Jayanath Koliyadu,
Holger Lange,
Romain Letrun,
Jannik Lübke,
Abhishek Mall,
Thomas Michelat,
Andrew J. Morgan,
Nils Roth,
Amit K. Samanta
, et al. (17 additional authors not shown)
Abstract:
One of the outstanding analytical problems in X-ray single particle imaging (SPI) is the classification of structural heterogeneity, which is especially difficult given the low signal-to-noise ratios of individual patterns and that even identical objects can yield patterns that vary greatly when orientation is taken into consideration. We propose two methods which explicitly account for this orien…
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One of the outstanding analytical problems in X-ray single particle imaging (SPI) is the classification of structural heterogeneity, which is especially difficult given the low signal-to-noise ratios of individual patterns and that even identical objects can yield patterns that vary greatly when orientation is taken into consideration. We propose two methods which explicitly account for this orientation-induced variation and can robustly determine the structural landscape of a sample ensemble. The first, termed common-line principal component analysis (PCA) provides a rough classification which is essentially parameter-free and can be run automatically on any SPI dataset. The second method, utilizing variation auto-encoders (VAEs) can generate 3D structures of the objects at any point in the structural landscape. We implement both these methods in combination with the noise-tolerant expand-maximize-compress (EMC) algorithm and demonstrate its utility by applying it to an experimental dataset from gold nanoparticles with only a few thousand photons per pattern and recover both discrete structural classes as well as continuous deformations. These developments diverge from previous approaches of extracting reproducible subsets of patterns from a dataset and open up the possibility to move beyond studying homogeneous sample sets and study open questions on topics such as nanocrystal growth and dynamics as well as phase transitions which have not been externally triggered.
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Submitted 13 September, 2021;
originally announced September 2021.
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A new solution to the curved Ewald sphere problem for 3D image reconstruction in electron microscopy
Authors:
J. P. J. Chen,
K. E. Schmidt,
J. C. H. Spence,
R. A. Kirian
Abstract:
We develop an algorithm capable of imaging a three-dimensional object given a collection of two-dimensional images of that object that are significantly influenced by the curvature of the Ewald sphere. These two-dimensional images cannot be approximated as projections of the object. Such an algorithm is useful in cryo-electron microscopy where larger samples, higher resolution, or lower energy ele…
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We develop an algorithm capable of imaging a three-dimensional object given a collection of two-dimensional images of that object that are significantly influenced by the curvature of the Ewald sphere. These two-dimensional images cannot be approximated as projections of the object. Such an algorithm is useful in cryo-electron microscopy where larger samples, higher resolution, or lower energy electron beams are desired, all of which contribute to the significance of Ewald curvature.
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Submitted 7 February, 2021; v1 submitted 4 January, 2021;
originally announced January 2021.
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3D diffractive imaging of nanoparticle ensembles using an X-ray laser
Authors:
Kartik Ayyer,
P. Lourdu Xavier,
Johan Bielecki,
Zhou Shen,
Benedikt J. Daurer,
Amit K. Samanta,
Salah Awel,
Richard Bean,
Anton Barty,
Tomas Ekeberg,
Armando D. Estillore,
Klaus Giewekemeyer,
Mark S. Hunter,
Richard A. Kirian,
Henry Kirkwood,
Yoonhee Kim,
Jayanath Koliyadu,
Holger Lange,
Romain Letruin,
Jannik Lübke,
Andrew J. Morgan,
Nils Roth,
Tokushi Sato,
Marcin Sikorski,
Florian Schulz
, et al. (12 additional authors not shown)
Abstract:
We report the 3D structure determination of gold nanoparticles (AuNPs) by X-ray single particle imaging (SPI). Around 10 million diffraction patterns from gold nanoparticles were measured in less than 100 hours of beam time, more than 100 times the amount of data in any single prior SPI experiment, using the new capabilities of the European X-ray free electron laser which allow measurements of 150…
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We report the 3D structure determination of gold nanoparticles (AuNPs) by X-ray single particle imaging (SPI). Around 10 million diffraction patterns from gold nanoparticles were measured in less than 100 hours of beam time, more than 100 times the amount of data in any single prior SPI experiment, using the new capabilities of the European X-ray free electron laser which allow measurements of 1500 frames per second. A classification and structural sorting method was developed to disentangle the heterogeneity of the particles and to obtain a resolution of better than 3 nm. With these new experimental and analytical developments, we have entered a new era for the SPI method and the path towards close-to-atomic resolution imaging of biomolecules is apparent.
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Submitted 17 July, 2020;
originally announced July 2020.
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Charge detection in an array of CMOS quantum dots
Authors:
Emmanuel Chanrion,
David J. Niegemann,
Benoit Bertrand,
Cameron Spence,
Baptiste Jadot,
Jing Li,
Pierre-André Mortemousque,
Louis Hutin,
Romain Maurand,
Xavier Jehl,
Marc Sanquer,
Silvano De Franceschi,
Christopher Bäuerle,
Franck Balestro,
Yann-Michel Niquet,
Maud Vinet,
Tristan Meunier,
Matias Urdampilleta
Abstract:
The recent development of arrays of quantum dots in semiconductor nanostructures highlights the progress of quantum devices toward large scale. However, how to realize such arrays on a scalable platform such as silicon is still an open question. One of the main challenge resides in the detection of charges within the array. It is a prerequisite functionality to initialize a desired charge state an…
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The recent development of arrays of quantum dots in semiconductor nanostructures highlights the progress of quantum devices toward large scale. However, how to realize such arrays on a scalable platform such as silicon is still an open question. One of the main challenge resides in the detection of charges within the array. It is a prerequisite functionality to initialize a desired charge state and readout spins through spin-to-charge conversion mechanisms. In this paper, we use two methods based on either a single-lead charge detector, or a reprogrammable single electron transistor. Thanks to these methods, we study the charge dynamics and sensitivity by performing single shot detection of the charge. Finally, we can probe the charge stability at any node of a linear array and assess the Coulomb disorder in the structure. We find an electrochemical potential fluctuation induced by charge noise comparable to that reported in other silicon quantum dots.
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Submitted 3 April, 2020; v1 submitted 2 April, 2020;
originally announced April 2020.
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Gate reflectometry for probing charge and spin states in linear Si MOS split-gate arrays
Authors:
L. Hutin,
B. Bertrand,
E. Chanrion,
H. Bohuslavskyi,
F. Ansaloni,
T. -Y. Yang,
J. Michniewicz,
D. J. Niegemann,
C. Spence,
T. Lundberg,
A. Chatterjee,
A. Crippa,
J. Li,
R. Maurand,
X. Jehl,
M. Sanquer,
M. F. Gonzalez-Zalba,
F. Kuemmeth,
Y. -M. Niquet,
S. De Franceschi,
M. Urdampilleta,
T. Meunier,
M. Vinet
Abstract:
We fabricated linear arrangements of multiple splitgate devices along an SOI mesa, thus forming a 2xN array of individually controllable Si quantum dots (QDs) with nearest neighbor coupling. We implemented two different gate reflectometry-based readout schemes to either probe spindependent charge movements by a coupled electrometer with single-shot precision, or directly sense a spin-dependent qua…
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We fabricated linear arrangements of multiple splitgate devices along an SOI mesa, thus forming a 2xN array of individually controllable Si quantum dots (QDs) with nearest neighbor coupling. We implemented two different gate reflectometry-based readout schemes to either probe spindependent charge movements by a coupled electrometer with single-shot precision, or directly sense a spin-dependent quantum capacitance. These results bear significance for fast, high-fidelity single-shot readout of large arrays of foundrycompatible Si MOS spin qubits.
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Submitted 20 December, 2019;
originally announced December 2019.
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Megahertz single-particle imaging at the European XFEL
Authors:
Egor Sobolev,
Serguey Zolotarev,
Klaus Giewekemeyer,
Johan Bielecki,
Kenta Okamoto,
Hemanth K. N. Reddy,
Jakob Andreasson,
Kartik Ayyer,
Imrich Barak,
Sadia Bari,
Anton Barty,
Richard Bean,
Sergey Bobkov,
Henry N. Chapman,
Grzegorz Chojnowski,
Benedikt J. Daurer,
Katerina Dörner,
Tomas Ekeberg,
Leonie Flückiger,
Oxana Galzitskaya,
Luca Gelisio,
Steffen Hauf,
Brenda G. Hogue,
Daniel A. Horke,
Ahmad Hosseinizadeh
, et al. (38 additional authors not shown)
Abstract:
The emergence of high repetition-rate X-ray free-electron lasers (XFELs) powered by superconducting accelerator technology enables the measurement of significantly more experimental data per day than was previously possible. The European XFEL will soon provide 27,000 pulses per second, more than two orders of magnitude more than any other XFEL. The increased pulse rate is a key enabling factor for…
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The emergence of high repetition-rate X-ray free-electron lasers (XFELs) powered by superconducting accelerator technology enables the measurement of significantly more experimental data per day than was previously possible. The European XFEL will soon provide 27,000 pulses per second, more than two orders of magnitude more than any other XFEL. The increased pulse rate is a key enabling factor for single-particle X-ray diffractive imaging, which relies on averaging the weak diffraction signal from single biological particles. Taking full advantage of this new capability requires that all experimental steps, from sample preparation and delivery to the acquisition of diffraction patterns, are compatible with the increased pulse repetition rate. Here, we show that single-particle imaging can be performed using X-ray pulses at megahertz repetition rates. The obtained results pave the way towards exploiting high repetition-rate X-ray free-electron lasers for single-particle imaging at their full repetition rate.
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Submitted 14 December, 2019;
originally announced December 2019.
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Towards scalable silicon quantum computing
Authors:
M. Vinet,
L. Hutin,
B. Bertrand,
S. Barraud,
J. -M. Hartmann,
Y. -J. Kim,
V. Mazzocchi,
A. Amisse,
H. Bohuslavskyi,
L. Bourdet,
A. Crippa,
X. Jehl,
R. Maurand,
Y. -M. Niquet,
M. Sanquer,
B. Venitucci,
B. Jadot,
E. Chanrion,
P. -A. Mortemousque,
C. Spence,
M. Urdampilleta,
S. De Franceschi,
T. Meunier
Abstract:
We report the efforts and challenges dedicated towards building a scalable quantum computer based on Si spin qubits. We review the advantages of relying on devices fabricated in a thin film technology as their properties can be in situ tuned by the back gate voltage, which prefigures tuning capabilities in scalable qubits architectures.
We report the efforts and challenges dedicated towards building a scalable quantum computer based on Si spin qubits. We review the advantages of relying on devices fabricated in a thin film technology as their properties can be in situ tuned by the back gate voltage, which prefigures tuning capabilities in scalable qubits architectures.
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Submitted 20 December, 2019;
originally announced December 2019.
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Nanopatterned electron beams for temporal coherence and deterministic phase control of x-ray free-electron lasers
Authors:
W. S. Graves,
S. L. Y. Chang,
D. Dwyer,
P. Fromme,
M. Holl,
B. D. A. Levin,
L. E. Malin,
J. L. Vincent,
J. C. H. Spence,
E. A. Nanni,
R. K. Li,
X. Shen,
S. Weathersby,
A. Sandhu
Abstract:
We demonstrate the ability to create electron beams with high-contrast, nanometer-scale density modulations as a first step toward developing full control of the phase fronts of an x-ray free-electron laser. The nanopatterned electron beams are produced by diffracting electrons through thin single-crystal silicon membranes that are lithographically patterned to different thicknesses. For transform…
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We demonstrate the ability to create electron beams with high-contrast, nanometer-scale density modulations as a first step toward developing full control of the phase fronts of an x-ray free-electron laser. The nanopatterned electron beams are produced by diffracting electrons through thin single-crystal silicon membranes that are lithographically patterned to different thicknesses. For transform-limited x-ray production the desired pattern is a series of regularly spaced lines (i.e. a grating) that generate uniformly spaced nanobunches of electrons, however nearly any pattern can be etched in the silicon, such as frequency-chirps or multiple patterns of different colors or line spacings. When these patterns are transferred from the spatial to the temporal dimension by accelerator electromagnetic optics they will control the phase fronts of coherent x-rays, giving unprecedented deterministic control over the phase of ultrashort x-ray pulses. In short, this method allows the time-structure for a fully coherent x-ray beam to be generated from a pattern written on a semiconductor wafer by lithography.
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Submitted 4 June, 2019;
originally announced June 2019.
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Theoretical and experimental electron diffraction intensity maps for single crystal silicon from an ultrafast source
Authors:
L. E. Malin,
W. S. Graves,
M. Holl,
J. C. H. Spence,
E. A. Nanni,
R. K. Li,
X. Shen,
S. Weathersby
Abstract:
Electron diffraction through a thin patterned silicon membrane can be used to create complex spatial modulations in electron distributions by varying the intensity of different reflections using parameters such as crystallographic orientation and wafer thickness, then selecting specific spots in the diffraction plane using apertures. The patterned electron beams can be used to control phase and am…
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Electron diffraction through a thin patterned silicon membrane can be used to create complex spatial modulations in electron distributions by varying the intensity of different reflections using parameters such as crystallographic orientation and wafer thickness, then selecting specific spots in the diffraction plane using apertures. The patterned electron beams can be used to control phase and amplitude of subsequent x-ray emission, enabling novel coherent x-ray methods. The electrons themselves can also be used for femtosecond time resolved diffraction and microscopy. As a first step toward patterned beams, we demonstrate experimentally and through simulation the ability to accurately predict and control diffraction spot intensities. We simulate MeV transmission electron diffraction patterns using the multislice method for various crystallographic orientations of a single crystal Si(100) membrane near beam normal. The resulting intensity maps of the Bragg reflections are compared to experimental results obtained at the Accelerator Structure Test Area Ultrafast Electron Diffraction (ASTA UED) facility at SLAC. Furthermore, the fraction of inelastic and elastic scattering of the initial charge is estimated along with the absorption of the membrane to determine the contrast that would be seen in a patterned version of the Si(100) membrane.
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Submitted 28 May, 2019; v1 submitted 17 May, 2019;
originally announced May 2019.
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Gate-Based High Fidelity Spin Read-out in a CMOS Device
Authors:
Matias Urdampilleta,
David J. Niegemann,
Emmanuel Chanrion,
Baptiste Jadot,
Cameron Spence,
Pierre-André Mortemousque,
1 Christopher Bäuerle,
Louis Hutin,
Benoit Bertrand,
Sylvain Barraud,
Romain Maurand,
Marc Sanquer,
Xavier Jehl,
Silvano De Franceschi,
Maud Vinet,
Tristan Meunier
Abstract:
The engineering of electron spin qubits in a compact unit cell embedding all quantum functionalities is mandatory for large scale integration. In particular, the development of a high-fidelity and scalable spin readout method remains an open challenge. Here we demonstrate high-fidelity and robust spin readout based on gate reflectometry in a CMOS device comprising one qubit dot and one ancillary d…
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The engineering of electron spin qubits in a compact unit cell embedding all quantum functionalities is mandatory for large scale integration. In particular, the development of a high-fidelity and scalable spin readout method remains an open challenge. Here we demonstrate high-fidelity and robust spin readout based on gate reflectometry in a CMOS device comprising one qubit dot and one ancillary dot coupled to an electron reservoir to perform readout. This scalable method allows us to read out a spin with a fidelity above 99% for 1 ms integration time. To achieve such fidelity, we exploit a latched spin blockade mechanism that requires electron exchange between the ancillary dot and the reservoir. We show that the demonstrated high read-out fidelity is fully preserved up to 0.5 K. This results holds particular relevance for the future co-integration of spin qubits and classical control electronics.
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Submitted 12 September, 2018;
originally announced September 2018.
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X-ray diffraction from isolated and strongly aligned gas-phase molecules with a free-electron laser
Authors:
Jochen Küpper,
Stephan Stern,
Lotte Holmegaard,
Frank Filsinger,
Arnaud Rouzée,
Artem Rudenko,
Per Johnsson,
Andrew V. Martin,
Marcus Adolph,
Andrew Aquila,
Saša Bajt,
Anton Barty,
Christoph Bostedt,
John Bozek,
Carl Caleman,
Ryan Coffee,
Nicola Coppola,
Tjark Delmas,
Sascha Epp,
Benjamin Erk,
Lutz Foucar,
Tais Gorkhover,
Lars Gumprecht,
Andreas Hartmann,
Robert Hartmann
, et al. (30 additional authors not shown)
Abstract:
We report experimental results on x-ray diffraction of quantum-state-selected and strongly aligned ensembles of the prototypical asymmetric rotor molecule 2,5-diiodobenzonitrile using the Linac Coherent Light Source. The experiments demonstrate first steps toward a new approach to diffractive imaging of distinct structures of individual, isolated gas-phase molecules. We confirm several key ingredi…
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We report experimental results on x-ray diffraction of quantum-state-selected and strongly aligned ensembles of the prototypical asymmetric rotor molecule 2,5-diiodobenzonitrile using the Linac Coherent Light Source. The experiments demonstrate first steps toward a new approach to diffractive imaging of distinct structures of individual, isolated gas-phase molecules. We confirm several key ingredients of single molecule diffraction experiments: the abilities to detect and count individual scattered x-ray photons in single shot diffraction data, to deliver state-selected, e. g., structural-isomer-selected, ensembles of molecules to the x-ray interaction volume, and to strongly align the scattering molecules. Our approach, using ultrashort x-ray pulses, is suitable to study ultrafast dynamics of isolated molecules.
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Submitted 28 January, 2014; v1 submitted 17 July, 2013;
originally announced July 2013.
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A pump-probe XFEL particle injector for hydrated samples
Authors:
U. Weierstall,
R. B. Doak,
J. C. H. Spence
Abstract:
We have developed a liquid jet injector system that can be used for hydrated sample delivery at X-ray Free Electron Laser (XFEL) sources and 3rd generation synchrotron sources. The injector is based on the Gas Dynamic Virtual Nozzle (GDVN), which generates a liquid jet with diameter ranging from 300 nm to 20 μm without the clogging problems associated with conventional Rayleigh jets. An improved n…
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We have developed a liquid jet injector system that can be used for hydrated sample delivery at X-ray Free Electron Laser (XFEL) sources and 3rd generation synchrotron sources. The injector is based on the Gas Dynamic Virtual Nozzle (GDVN), which generates a liquid jet with diameter ranging from 300 nm to 20 μm without the clogging problems associated with conventional Rayleigh jets. An improved nozzle design is presented here. A differential pumping system protects the vacuum chamber and an in-vacuum microscope allows observation of the liquid jet for diagnostics while it is being exposed to the X-ray beam. A fiber optically coupled pump laser illuminating the jet is incorporated for pump-probe experiments. First results with this injector system have been obtained at the LCLS.
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Submitted 11 May, 2011;
originally announced May 2011.
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Tomographic femtosecond X-ray diffractive imaging
Authors:
K. E. Schmidt,
J. C. H. Spence,
U. Weierstall,
R. Kirian,
X. Wang,
D. Starodub,
H. N. Chapman,
M. R. Howells,
R. B. Doak
Abstract:
A method is proposed for obtaining three simultaneous projections of a target from a single radiation pulse, which also allows the relative orientation of successive targets to be determined. The method has application to femtosecond X-ray diffraction, and does not require solution of the phase problem. We show that the principle axes of a compact charge-density distribution can be obtained from…
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A method is proposed for obtaining three simultaneous projections of a target from a single radiation pulse, which also allows the relative orientation of successive targets to be determined. The method has application to femtosecond X-ray diffraction, and does not require solution of the phase problem. We show that the principle axes of a compact charge-density distribution can be obtained from projections of its autocorrelation function, which is directly accessible in diffraction experiments. The results may have more general application to time resolved tomographic pump-probe experiments and time-series imaging.
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Submitted 27 May, 2009; v1 submitted 9 June, 2008;
originally announced June 2008.
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Gas Dynamic Virtual Nozzle for Generation of Microscopic Droplet Streams
Authors:
D. P. DePonte,
U. Weierstall,
D. Starodub,
K. Schmidt,
J. C. H. Spence,
R. B. Doak
Abstract:
As shown by Ganan-Calvo and co-workers, a free liquid jet can be compressed in iameter through gas-dynamic forces exerted by a co-flowing gas, obviating the need for a solid nozzle to form a microscopic liquid jet and thereby alleviating the clogging problems that plague conventional droplet sources of small diameter. We describe in this paper a novel form of droplet beam source based on this pr…
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As shown by Ganan-Calvo and co-workers, a free liquid jet can be compressed in iameter through gas-dynamic forces exerted by a co-flowing gas, obviating the need for a solid nozzle to form a microscopic liquid jet and thereby alleviating the clogging problems that plague conventional droplet sources of small diameter. We describe in this paper a novel form of droplet beam source based on this principle. The source is miniature, robust, dependable, easily fabricated, and eminently suitable for delivery of microscopic liquid droplets, including hydrated biological samples, into vacuum for analysis using vacuum instrumentation. Monodisperse, single file droplet streams are generated by triggering the device with a piezoelectric actuator. The device is essentially immune to clogging.
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Submitted 28 March, 2008;
originally announced March 2008.
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Ultrafast, ultrabright, X-ray holography using a uniformly-redundant array
Authors:
S. Marchesini,
S. Boutet,
A. E. Sakdinawat,
M. J. Bogan,
S. Bajt,
A. Barty,
H. N. Chapman,
M. Frank,
S. P. Hau-Riege,
A. Szoke,
C. Cui,
M. R. Howells,
D. A. Shapiro,
J. C. H. Spence,
J. W. Shaevitz,
J. Y. Lee,
J. Hajdu,
M. M. Seibert
Abstract:
Advances in the development of free-electron lasers offer the realistic prospect of high-resolution imaging to study the nanoworld on the time-scale of atomic motions. We identify X-ray Fourier Transform holography, (FTH) as a promising but, so far, inefficient scheme to do this. We show that a uniformly redundant array (URA) placed next to the sample, multiplies the efficiency of X-ray FTH by m…
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Advances in the development of free-electron lasers offer the realistic prospect of high-resolution imaging to study the nanoworld on the time-scale of atomic motions. We identify X-ray Fourier Transform holography, (FTH) as a promising but, so far, inefficient scheme to do this. We show that a uniformly redundant array (URA) placed next to the sample, multiplies the efficiency of X-ray FTH by more than one thousand (approaching that of a perfect lens) and provides holographic images with both amplitude- and phase-contrast information. The experiments reported here demonstrate this concept by imaging a nano-fabricated object at a synchrotron source, and a bacterial cell at a soft X-ray free-electron-laser, where illumination by a single 15 fs pulse was successfully used in producing the holographic image. We expect with upcoming hard X-ray lasers to achieve considerably higher spatial resolution and to obtain ultrafast movies of excited states of matter.
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Submitted 8 February, 2008; v1 submitted 31 January, 2008;
originally announced January 2008.
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Three-dimensional coherent X-ray diffraction imaging of a ceramic nanofoam: determination of structural deformation mechanisms
Authors:
A. Barty,
S. Marchesini,
H. N. Chapman,
C. Cui,
M. R. Howells,
D. A. Shapiro,
A. M. Minor,
J. C. H. Spence,
U. Weierstall,
J. Ilavsky,
A. Noy,
S. P. Hau-Riege,
A. B. Artyukhin,
T. Baumann,
T. Willey,
J. Stolken,
T. van Buuren,
J. H. Kinney
Abstract:
Ultra-low density polymers, metals, and ceramic nanofoams are valued for their high strength-to-weight ratio, high surface area and insulating properties ascribed to their structural geometry. We obtain the labrynthine internal structure of a tantalum oxide nanofoam by X-ray diffractive imaging. Finite element analysis from the structure reveals mechanical properties consistent with bulk samples…
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Ultra-low density polymers, metals, and ceramic nanofoams are valued for their high strength-to-weight ratio, high surface area and insulating properties ascribed to their structural geometry. We obtain the labrynthine internal structure of a tantalum oxide nanofoam by X-ray diffractive imaging. Finite element analysis from the structure reveals mechanical properties consistent with bulk samples and with a diffusion limited cluster aggregation model, while excess mass on the nodes discounts the dangling fragments hypothesis of percolation theory.
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Submitted 25 June, 2008; v1 submitted 30 August, 2007;
originally announced August 2007.
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Dose, exposure time, and resolution in Serial X-ray Crystallography
Authors:
D. Starodub,
P. Rez,
G. Hembree,
M. Howells,
D. Shapiro,
H. N. Chapman,
P. Fromme,
K. Schmidt,
U. Weierstall,
R. B. Doak,
J. C. H. Spence
Abstract:
The resolution of X-ray diffraction microscopy is limited by the maximum dose that can be delivered prior to sample damage. In the proposed Serial Crystallography method, the damage problem is addressed by distributing the total dose over many identical hydrated macromolecules running continuously in a single-file train across a continuous X-ray beam, and resolution is then limited only by the a…
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The resolution of X-ray diffraction microscopy is limited by the maximum dose that can be delivered prior to sample damage. In the proposed Serial Crystallography method, the damage problem is addressed by distributing the total dose over many identical hydrated macromolecules running continuously in a single-file train across a continuous X-ray beam, and resolution is then limited only by the available molecular and X-ray fluxes and molecular alignment. Orientation of the diffracting molecules is achieved by laser alignment. We evaluate the incident X-ray fluence (energy/area) required to obtain a given resolution from (1) an analytical model, giving the count rate at the maximum scattering angle for a model protein, (2) explicit simulation of diffraction patterns for a GroEL-GroES protein complex, and (3) the frequency cut off of the transfer function following iterative solution of the phase problem, and reconstruction of an electron density map in the projection approximation. These calculations include counting shot noise and multiple starts of the phasing algorithm. The results indicate counting time and the number of proteins needed within the beam at any instant for a given resolution and X-ray flux. We confirm an inverse fourth power dependence of exposure time on resolution, with important implications for all coherent X-ray imaging. We find that multiple single-file protein beams will be needed for sub-nanometer resolution on current third generation synchrotrons, but not on fourth generation designs, where reconstruction of secondary protein structure at a resolution of 0.7 nm should be possible with short exposures.
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Submitted 22 June, 2007;
originally announced June 2007.
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Droplet beams for serial crystallography of proteins
Authors:
U. Weierstall,
R. B. Doak,
J. C. H. Spence,
D. Starodub,
D. Shapiro,
P. Kennedy,
J. Warner,
G. G. Hembree,
P. Fromme,
H. Chapman
Abstract:
Serial diffraction of proteins requires an injection method to deliver protein molecules - preferably uncharged, fully hydrated, spatially oriented, and with high flux - into the crossed beams of an alignment laser and a focused probe beam of electrons or X-rays of typically only a few tens of microns diameter. The aim of this work has been to examine several potential droplet sources as to thei…
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Serial diffraction of proteins requires an injection method to deliver protein molecules - preferably uncharged, fully hydrated, spatially oriented, and with high flux - into the crossed beams of an alignment laser and a focused probe beam of electrons or X-rays of typically only a few tens of microns diameter. The aim of this work has been to examine several potential droplet sources as to their suitability for this task. We compare Rayleigh droplet sources, electrospray sources, nebulizers and aerojet-focused droplet sources using time-resolved optical images of the droplet beams. Shrinkage of droplets by evaporation as a means of removing most of the water surrounding the proteins is discussed. Experimental measurements of droplet size, conformation of proteins after passing through a Rayleigh jet, and triboelectric charging are presented and conclusions are drawn about the source configuration for serial diffraction. First experimental X-ray diffraction patterns from Rayleigh droplet beams doped with 100nm gold balls are shown.
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Submitted 11 January, 2007;
originally announced January 2007.
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Using binding free energy to guide ligand design
Authors:
Charles F. F. Karney,
Jason E. Ferrara,
Clay D. Spence
Abstract:
The molecular distributions obtained from canonical Monte Carlo simulations can be used to find an approximate interaction energy. This serves as the basis of a method for estimating the binding free energy for a ligand to a protein which enables the free energy to be used to direct the design of ligands which bind to a protein with high affinity.
The molecular distributions obtained from canonical Monte Carlo simulations can be used to find an approximate interaction energy. This serves as the basis of a method for estimating the binding free energy for a ligand to a protein which enables the free energy to be used to direct the design of ligands which bind to a protein with high affinity.
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Submitted 7 November, 2005;
originally announced November 2005.
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Phase Aberrations in Diffraction Microscopy
Authors:
S. Marchesini,
H. N. Chapman,
A. Barty,
C. Cui,
M. R. Howells,
J. C. H. Spence,
U. Weierstall,
A. M. Minor
Abstract:
In coherent X-ray diffraction microscopy the diffraction pattern generated by a sample illuminated with coherent x-rays is recorded, and a computer algorithm recovers the unmeasured phases to synthesize an image. By avoiding the use of a lens the resolution is limited, in principle, only by the largest scattering angles recorded. However, the imaging task is shifted from the experiment to the co…
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In coherent X-ray diffraction microscopy the diffraction pattern generated by a sample illuminated with coherent x-rays is recorded, and a computer algorithm recovers the unmeasured phases to synthesize an image. By avoiding the use of a lens the resolution is limited, in principle, only by the largest scattering angles recorded. However, the imaging task is shifted from the experiment to the computer, and the algorithm's ability to recover meaningful images in the presence of noise and limited prior knowledge may produce aberrations in the reconstructed image. We analyze the low order aberrations produced by our phase retrieval algorithms. We present two methods to improve the accuracy and stability of reconstructions.
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Submitted 6 October, 2005; v1 submitted 4 October, 2005;
originally announced October 2005.
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Progress in Three-Dimensional Coherent X-Ray Diffraction Imaging
Authors:
S. Marchesini,
H. N. Chapman,
A. Barty,
A. Noy,
S. P. Hau-Riege,
J. M. Kinney,
C. Cui,
M. R. Howells,
R. Rosen,
J. C. H. Spence,
U. Weierstall,
D. Shapiro,
T. Beetz,
C. Jacobsen,
E. Lima,
A. M. Minor,
H. He
Abstract:
The Fourier inversion of phased coherent diffraction patterns offers images without the resolution and depth-of-focus limitations of lens-based tomographic systems. We report on our recent experimental images inverted using recent developments in phase retrieval algorithms, and summarize efforts that led to these accomplishments. These include ab-initio reconstruction of a two-dimensional test p…
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The Fourier inversion of phased coherent diffraction patterns offers images without the resolution and depth-of-focus limitations of lens-based tomographic systems. We report on our recent experimental images inverted using recent developments in phase retrieval algorithms, and summarize efforts that led to these accomplishments. These include ab-initio reconstruction of a two-dimensional test pattern, infinite depth of focus image of a thick object, and its high-resolution (~10 nm resolution) three-dimensional image. Developments on the structural imaging of low density aerogel samples are discussed.
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Submitted 6 October, 2005; v1 submitted 4 October, 2005;
originally announced October 2005.
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High-resolution ab initio three-dimensional X-ray diffraction microscopy
Authors:
H. N. Chapman,
A. Barty,
S. Marchesini,
A. Noy,
C. Cui,
M. R. Howells,
R. Rosen,
H. He,
J. C. H. Spence,
U. Weierstall,
T. Beetz,
C. Jacobsen,
D. Shapiro
Abstract:
Coherent X-ray diffraction microscopy is a method of imaging non-periodic isolated objects at resolutions only limited, in principle, by the largest scattering angles recorded. We demonstrate X-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the 3D diffraction data u…
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Coherent X-ray diffraction microscopy is a method of imaging non-periodic isolated objects at resolutions only limited, in principle, by the largest scattering angles recorded. We demonstrate X-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the 3D diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a non-periodic object. We also construct 2D images of thick objects with infinite depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution using X-ray undulator radiation, and establishes the techniques to be used in atomic-resolution ultrafast imaging at X-ray free-electron laser sources.
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Submitted 8 September, 2005;
originally announced September 2005.
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An assessment of the resolution limitation due to radiation-damage in x-ray diffraction microscopy
Authors:
M. R. Howells,
T. Beetz,
H. N. Chapman,
C. Cui,
J. M. Holton,
C. J. Jacobsen,
J. Kirz E. Lima,
S. Marchesini,
H. Miao,
D. Sayre,
D. A. Shapiro,
J. C. H. Spence
Abstract:
X-ray diffraction microscopy (XDM) is a new form of x-ray imaging that is being practiced at several third-generation synchrotron-radiation x-ray facilities. Although only five years have elapsed since the technique was first introduced, it has made rapid progress in demonstrating high-resolution threedimensional imaging and promises few-nm resolution with much larger samples than can be imaged…
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X-ray diffraction microscopy (XDM) is a new form of x-ray imaging that is being practiced at several third-generation synchrotron-radiation x-ray facilities. Although only five years have elapsed since the technique was first introduced, it has made rapid progress in demonstrating high-resolution threedimensional imaging and promises few-nm resolution with much larger samples than can be imaged in the transmission electron microscope. Both life- and materials-science applications of XDM are intended, and it is expected that the principal limitation to resolution will be radiation damage for life science and the coherent power of available x-ray sources for material science. In this paper we address the question of the role of radiation damage. We use a statistical analysis based on the so-called "dose fractionation theorem" of Hegerl and Hoppe to calculate the dose needed to make an image of a lifescience sample by XDM with a given resolution. We conclude that the needed dose scales with the inverse fourth power of the resolution and present experimental evidence to support this finding. To determine the maximum tolerable dose we have assembled a number of data taken from the literature plus some measurements of our own which cover ranges of resolution that are not well covered by reports in the literature. The tentative conclusion of this study is that XDM should be able to image frozen-hydrated protein samples at a resolution of about 10 nm with "Rose-criterion" image quality.
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Submitted 10 February, 2005;
originally announced February 2005.
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Use of extended and prepared reference objects in experimental Fourier transform X-ray holography
Authors:
H. He,
M. Howells,
S. Marchesini,
H. N. Chapman,
U. Weierstall,
H. A. Padmore,
J. C. H. Spence
Abstract:
The use of one or more gold nanoballs as reference objects for Fourier Transform holography (FTH) is analysed using experimental soft X-ray diffraction from objects consisting of separated clusters of these balls. The holograms are deconvoluted against ball reference objects to invert to images, in combination with a Wiener filter to control noise. A resolution of ~30nm, smaller than one ball, i…
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The use of one or more gold nanoballs as reference objects for Fourier Transform holography (FTH) is analysed using experimental soft X-ray diffraction from objects consisting of separated clusters of these balls. The holograms are deconvoluted against ball reference objects to invert to images, in combination with a Wiener filter to control noise. A resolution of ~30nm, smaller than one ball, is obtained even if a large cluster of balls is used as the reference, giving the best resolution yet obtained by X-ray FTH. Methods of dealing with missing data due to a beamstop are discussed. Practical prepared objects which satisfy the FTH condition are suggested, and methods of forming them described.
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Submitted 7 May, 2004;
originally announced May 2004.
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Phasing diffuse scattering. Application of the SIR2002 algorithm to the non-crystallographic phase problem
Authors:
B. Carrozzini,
G. L. Cascarano,
L. De Caro,
C. Giacovazzo,
S. Marchesini,
H. N. Chapman,
H. He,
M. R. Howells,
J. S. Wu,
U. Weierstall,
J. C. H. Spence
Abstract:
A new phasing algorithm has been used to determine the phases of diffuse elastic X-ray scattering from a non-periodic array of gold balls of 50 nm diameter. Two-dimensional real-space images, showing the charge-density distribution of the balls, have been reconstructed at 50 nm resolution from transmission diffraction patterns recorded at 550 eV energy. The reconstructed image fits well with sca…
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A new phasing algorithm has been used to determine the phases of diffuse elastic X-ray scattering from a non-periodic array of gold balls of 50 nm diameter. Two-dimensional real-space images, showing the charge-density distribution of the balls, have been reconstructed at 50 nm resolution from transmission diffraction patterns recorded at 550 eV energy. The reconstructed image fits well with scanning electron microscope (SEM) image of the same sample. The algorithm, which uses only the density modification portion of the SIR2002 program, is compared with the results obtained via the Gerchberg-Saxton-Fienup HIO algorithm. In this way the relationship between density modification in crystallography and the HiO algorithm used in signal and image processing is elucidated.
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Submitted 15 April, 2004;
originally announced April 2004.
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SPEDEN: Reconstructing single particles from their diffraction patterns
Authors:
S. P. Hau-Riege,
H. Szoke,
H. N. Chapman,
A. Szoke,
S. Marchesini,
A. Noy,
H. He,
M. R. Howells,
U. Weierstall,
J. C. H. Spence
Abstract:
Speden is a computer program that reconstructs the electron density of single particles from their x-ray diffraction patterns, using a single-particle adaptation of the Holographic Method in crystallography. (Szoke, A., Szoke, H., and Somoza, J.R., 1997. Acta Cryst. A53, 291-313.) The method, like its parent, is unique that it does not rely on ``back'' transformation from the diffraction pattern…
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Speden is a computer program that reconstructs the electron density of single particles from their x-ray diffraction patterns, using a single-particle adaptation of the Holographic Method in crystallography. (Szoke, A., Szoke, H., and Somoza, J.R., 1997. Acta Cryst. A53, 291-313.) The method, like its parent, is unique that it does not rely on ``back'' transformation from the diffraction pattern into real space and on interpolation within measured data. It is designed to deal successfully with sparse, irregular, incomplete and noisy data. It is also designed to use prior information for ensuring sensible results and for reliable convergence. This article describes the theoretical basis for the reconstruction algorithm, its implementation and quantitative results of tests on synthetic and experimentally obtained data. The program could be used for determining the structure of radiation tolerant samples and, eventually, of large biological molecular structures without the need for crystallization.
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Submitted 18 March, 2004;
originally announced March 2004.
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Coherent X-ray Diffractive Imaging; applications and limitations
Authors:
S. Marchesini,
H. N. Chapman,
S. P. Hau-Riege,
R. A. London,
A. Szoke,
H. He,
M. R. Howells,
H. Padmore,
R. Rosen,
J. C. H. Spence,
U. Weierstall
Abstract:
The inversion of a diffraction pattern offers aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems, the only limitation being radiation damage. We review our experimental results, discuss the fundamental limits of this technique and future plans.
The inversion of a diffraction pattern offers aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems, the only limitation being radiation damage. We review our experimental results, discuss the fundamental limits of this technique and future plans.
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Submitted 15 August, 2003;
originally announced August 2003.
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X-ray image reconstruction from a diffraction pattern alone
Authors:
S. Marchesini,
H. He,
H. N. Chapman,
S. P. Hau-Riege,
A. Noy,
M. R. Howells,
U. Weierstall,
J. C. H. Spence
Abstract:
A solution to the inversion problem of scattering would offer aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems. Powerful algorithms are increasingly being used to act as lenses to form such images. Current image reconstruction methods, however, require the knowledge of the shape of the object and the low spatial…
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A solution to the inversion problem of scattering would offer aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems. Powerful algorithms are increasingly being used to act as lenses to form such images. Current image reconstruction methods, however, require the knowledge of the shape of the object and the low spatial frequencies unavoidably lost in experiments. Diffractive imaging has thus previously been used to increase the resolution of images obtained by other means. We demonstrate experimentally here a new inversion method, which reconstructs the image of the object without the need for any such prior knowledge.
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Submitted 12 September, 2003; v1 submitted 24 June, 2003;
originally announced June 2003.