In-situ uniaxial pressure cell for X-ray and neutron scattering experiments
Authors:
G. Simutis,
A. Bollhalder,
M. Zolliker,
J. Küspert,
Q. Wang,
D. Das,
F. Van Leeuwen,
O. Ivashko,
O. Gutowski,
J. Philippe,
T. Kracht,
P. Glaevecke,
T. Adachi,
M. Von Zimmermann,
S. Van Petegem,
H. Luetkens,
Z. Guguchia,
J. Chang,
Y. Sassa,
M. Bartkowiak,
M. Janoschek
Abstract:
We present an in-situ uniaxial pressure device optimized for small angle X-ray and neutron scattering experiments at low-temperatures and high magnetic fields. A stepper motor generates force, which is transmitted to the sample via a rod with integrated transducer that continuously monitors the force. The device has been designed to generate forces up to 200 N in both compressive and tensile confi…
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We present an in-situ uniaxial pressure device optimized for small angle X-ray and neutron scattering experiments at low-temperatures and high magnetic fields. A stepper motor generates force, which is transmitted to the sample via a rod with integrated transducer that continuously monitors the force. The device has been designed to generate forces up to 200 N in both compressive and tensile configurations and a feedback control allows operating the system in a continuous-pressure mode as the temperature is changed. The uniaxial pressure device can be used for various instruments and multiple cryostats through simple and exchangeable adapters. It is compatible with multiple sample holders, which can be easily changed depending on the sample properties and the desired experiment and allow rapid sample changes.
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Submitted 26 July, 2022;
originally announced July 2022.
X-ray ptychographic topography, a new tool for strain imaging
Authors:
Mariana Verezhak,
Steven Van Petegem,
Angel Rodriguez-Fernandez,
Pierre Godard,
Klaus Wakonig,
Dmitry Karpov,
Vincent L. R. Jacques,
Andreas Menzel,
Ludovic Thilly,
Ana Diaz
Abstract:
Strain and defects in crystalline materials are responsible for the distinct mechanical, electric and magnetic properties of a desired material, making their study an essential task in material characterization, fabrication and design. Existing techniques for the visualization of strain fields, such as transmission electron microscopy and diffraction, are destructive and limited to thin slices of…
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Strain and defects in crystalline materials are responsible for the distinct mechanical, electric and magnetic properties of a desired material, making their study an essential task in material characterization, fabrication and design. Existing techniques for the visualization of strain fields, such as transmission electron microscopy and diffraction, are destructive and limited to thin slices of the materials. On the other hand, non-destructive X-ray imaging methods either have a reduced resolution or are not robust enough for a broad range of applications. Here we present X-ray ptychographic topography, a new method for strain imaging, and demonstrate its use on an InSb micro-pillar after micro-compression, where the strained region is visualized with a spatial resolution of 30 nm. Thereby, X-ray ptychographic topography proves itself as a robust non-destructive approach for the imaging of strain fields within bulk crystalline specimens with a spatial resolution of a few tens of nanometers.
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Submitted 6 December, 2020;
originally announced December 2020.
