Infrared Transmissometer to Measure the Thickness of NbN Thin Films
Authors:
Kristen A. Sunter,
Andrew E. Dane,
Christopher I. Lang,
Karl K. Berggren
Abstract:
We present an optical setup that can be used to characterize the thicknesses of thin NbN films to screen samples for fabrication and to better model the performance of the resulting superconducting nanowire single photon detectors. The infrared transmissometer reported here is easy to use, gives results within minutes and is non-destructive. Thus, the thickness measurement can be easily integrated…
▽ More
We present an optical setup that can be used to characterize the thicknesses of thin NbN films to screen samples for fabrication and to better model the performance of the resulting superconducting nanowire single photon detectors. The infrared transmissometer reported here is easy to use, gives results within minutes and is non-destructive. Thus, the thickness measurement can be easily integrated into the workflow of deposition and characterization. Comparison to a similar visible-wavelength transmissometer is provided.
△ Less
Submitted 24 March, 2015;
originally announced March 2015.
Universal scaling of the critical temperature for thin films near the superconducting-to-insulating transition
Authors:
Yachin Ivry,
Chung-Soo Kim,
Andrew E. Dane,
Domenico De Fazio,
Adam McCaughan,
Kristen A. Sunter,
Qingyuan Zhao,
Karl K. Berggren
Abstract:
Thin superconducting films form a unique platform for geometrically-confined, strongly-interacting electrons. They allow an inherent competition between disorder and superconductivity, which in turn enables the intriguing superconducting-to-insulator transition and believed to facilitate the comprehension of high-Tc superconductivity. Furthermore, understanding thin film superconductivity is techn…
▽ More
Thin superconducting films form a unique platform for geometrically-confined, strongly-interacting electrons. They allow an inherent competition between disorder and superconductivity, which in turn enables the intriguing superconducting-to-insulator transition and believed to facilitate the comprehension of high-Tc superconductivity. Furthermore, understanding thin film superconductivity is technologically essential e.g. for photo-detectors, and quantum-computers. Consequently, the absence of an established universal relationships between critical temperature ($T_c$), film thickness ($d$) and sheet resistance ($R_s$) hinders both our understanding of the onset of the superconductivity and the development of miniaturised superconducting devices. We report that in thin films, superconductivity scales as $d^.$$T_c(R_s)$. We demonstrated this scaling by analysing the data published over the past 46 years for different materials (and facilitated this database for further analysis). Moreover, we experimentally confirmed the discovered scaling for NbN films, quantified it with a power law, explored its possible origin and demonstrated its usefulness for superconducting film-based devices.
△ Less
Submitted 15 September, 2014; v1 submitted 22 July, 2014;
originally announced July 2014.
