High Entropy Alloy CrFeNiCoCu sputtered films
Authors:
J. Mayandi,
M. Schrade,
P. Vajeeston,
M. Stange,
A. M. Lind,
M. F. Sunding,
J. Deuermeier,
E. Fortunato,
O. M. Løvvik,
A. G. Ulyashin,
S. Diplas,
P. A. Carvalho,
T. G. Finstad
Abstract:
High entropy alloy(HEA) films of CrFeCoNiCu were prepared by sputtering, their structure was characterized, and their electric properties measured by temperature dependent Hall and Seebeck measurement. The HEA films show a solid solution with fcc structure, and a 111 texture with columnar grains of widths 15-30 nm extending through film thickness with very many twins. The residual electrical resis…
▽ More
High entropy alloy(HEA) films of CrFeCoNiCu were prepared by sputtering, their structure was characterized, and their electric properties measured by temperature dependent Hall and Seebeck measurement. The HEA films show a solid solution with fcc structure, and a 111 texture with columnar grains of widths 15-30 nm extending through film thickness with very many twins. The residual electrical resistivity of the films is around 140 μΩcm and the temperature dependence of the resistivity is metal-like. The temperature coefficient of resistivity (TCR) is small (2 ppm/K). The Hall coefficient is positive while the Seebeck coefficients is negative. This is interpreted as arising from an electronic structure where the Fermi level passes through band states having both holes and electrons as indicated by band structure calculations. The HEA structure appears stable for annealing in vacuum, while annealing in an oxygen containing atmosphere causes the surface to oxidize and grow a Cr-rich oxide on the surface. This is then accompanied by demixing of the HEA solid solution and a decrease in residual resistance of the film.
△ Less
Submitted 21 December, 2021; v1 submitted 18 August, 2021;
originally announced August 2021.
Composition and structure of Pd nanoclusters in SiO$_x$ thin film
Authors:
Annett Thøgersen,
Jeyanthinath Mayandi,
Lasse Vines,
Martin F. Sunding,
Arne Olsen,
Spyros Diplas,
Masanori Mitome,
Yoshio Bando
Abstract:
The nucleation, distribution, composition and structure of Pd nanocrystals in SiO$_2$ multilayers containing Ge, Si, and Pd are studied using High Resolution Transmission Electron Microscopy (HRTEM) and X-ray Photoelectron Spectroscopy (XPS), before and after heat treatment. The Pd nanocrystals in the as deposited sample seem to be capped by a layer of PdO$_x$. A 1-2 eV shift in binding energy was…
▽ More
The nucleation, distribution, composition and structure of Pd nanocrystals in SiO$_2$ multilayers containing Ge, Si, and Pd are studied using High Resolution Transmission Electron Microscopy (HRTEM) and X-ray Photoelectron Spectroscopy (XPS), before and after heat treatment. The Pd nanocrystals in the as deposited sample seem to be capped by a layer of PdO$_x$. A 1-2 eV shift in binding energy was found for the Pd-3d XPS peak, due to initial state Pd to O charge transfer in this layer. The heat treatment results in a decomposition of PdO and Pd into pure Pd nanocrystals and SiO$_2$.
△ Less
Submitted 28 September, 2012;
originally announced October 2012.
