On-chip calibrated radio-frequency measurement at cryogenic temperatures for determination of SrTiO3-based capacitor properties
Authors:
Akitomi Shirachi,
Motoya Shinozaki,
Yasuhide Tomioka,
Hisashi Inoue,
Kenta Itoh,
Yusuke Kozuka,
Takanobu Watanabe,
Shoichi Sato,
Takeshi Kumasaka,
Tomohiro Otsuka
Abstract:
Quantum computing has emerged as a promising technology for next-generation information processing, utilizing semiconductor quantum dots as one of the candidates for quantum bits. Radio-frequency (rf) reflectometry plays an important role in the readout of quantum dots but requires a precise rf measurement technique at cryogenic temperatures. While cryogenic calibration techniques, essential for r…
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Quantum computing has emerged as a promising technology for next-generation information processing, utilizing semiconductor quantum dots as one of the candidates for quantum bits. Radio-frequency (rf) reflectometry plays an important role in the readout of quantum dots but requires a precise rf measurement technique at cryogenic temperatures. While cryogenic calibration techniques, essential for rf reflectometry, have been developed, on-chip calibration near the device remains an important challenge. In this study, we develop an on-chip calibrated rf measurement system operating at 4K for characterizing SrTiO3-based varactors, which are promising components for tunable impedance matching circuits. Our system enables accurate measurements by eliminating errors associated with long rf circuit lines. We investigate the effects of annealing conditions, crystal orientation, and Ca doping of SrTiO3 crystals on the varactor properties in the frequency range for rf reflectometry. Our results provide insights for optimizing these components for cryogenic rf applications in quantum information processing systems.
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Submitted 28 April, 2025;
originally announced April 2025.
RFSoC-based radio-frequency reflectometry in gate-defined bilayer graphene quantum devices
Authors:
Motoya Shinozaki,
Tomoya Johmen,
Aruto Hosaka,
Takumi Seo,
Shunsuke Yashima,
Akitomi Shirachi,
Kosuke Noro,
Shoichi Sato,
Takashi Kumasaka,
Tsuyoshi Yoshida,
Tomohiro Otsuka
Abstract:
Quantum computers require both scalability and high performance for practical applications. While semiconductor quantum dots are promising candidates for quantum bits, the complexity of measurement setups poses an important challenge for scaling up these devices. Here, radio-frequency system-on-chip (RFSoC) technology is exepcted for a promising approach that combines scalability with flexibility.…
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Quantum computers require both scalability and high performance for practical applications. While semiconductor quantum dots are promising candidates for quantum bits, the complexity of measurement setups poses an important challenge for scaling up these devices. Here, radio-frequency system-on-chip (RFSoC) technology is exepcted for a promising approach that combines scalability with flexibility. In this paper, we demonstrate RF reflectometry in gate-defined bilayer graphene quantum devices using RFSoC-based measurement architecture. By controlling the confinement strength through gate voltages, we achieve both Fabry-Pérot interferometer and quantum dot operations in a single device. Although impedance matching conditions currently limit the measurement sensitivity, we identify pathways for optimization through tunnel barrier engineering and resonator design. These results represent a step toward integrating high-bandwidth measurements with scalable quantum devices.
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Submitted 21 February, 2025;
originally announced February 2025.
