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Observation of Fundamental Limit of Light Localization
Authors:
Farbod Shafiei,
Massoud R. Masir,
Tommaso Orzali,
Alexey Vert,
Man Hoi Wong,
Gennadi Bersuker,
Michael C. Downer
Abstract:
In disordered media light can be localized in the spaces between scattering sites which average to an optical mean free path (MFP). However the fundamental question of the smallest MFP that can support Anderson localization of light remains unanswered due to fabrication complexity of a scattering medium with controlled nano-scale gaps and lack of required resolution by far-field methods. Here we u…
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In disordered media light can be localized in the spaces between scattering sites which average to an optical mean free path (MFP). However the fundamental question of the smallest MFP that can support Anderson localization of light remains unanswered due to fabrication complexity of a scattering medium with controlled nano-scale gaps and lack of required resolution by far-field methods. Here we use scanning probe microscopy technique to collect localized light created at gaps between scattering crystallographic defects in a large variety set of nano-gap III-V medium. No localized spots correlated to MFP below ~14.5 nm is observed at second-harmonic collection at 390 nm. Experiment and simulation resulted in the first direct observation of suppression of Anderson light localization correlated to ~13 nm optical MFP that reveals a fundamental constraint in electromagnetism and photonics.
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Submitted 2 December, 2022; v1 submitted 5 November, 2022;
originally announced November 2022.
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Collection of Propagating Electromagnetic Fields by Uncoated Probe
Authors:
Farbod Shafiei,
Michael C. Downer
Abstract:
Understanding light-matter interaction at the nanoscale by observation of fine details of electromagnetic fields is achieved by bringing nanoscale probes into the nearfield of light sources, capturing information that is lost in the far field. Although metal coated probes are often used for nearfield microscopy, they strongly perturb the electromagnetic fields under study. Here, through experiment…
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Understanding light-matter interaction at the nanoscale by observation of fine details of electromagnetic fields is achieved by bringing nanoscale probes into the nearfield of light sources, capturing information that is lost in the far field. Although metal coated probes are often used for nearfield microscopy, they strongly perturb the electromagnetic fields under study. Here, through experiment and simulation, we detail light collection by uncoated fiber probes, which minimize such perturbation. Second-harmonic light from intensely-irradiated sub-wavelength sub-surface features was imaged to avoid otherwise dominating fundamental light background, yielding clear nearfield details through a 50 nm aperture uncoated probe with ~23 nm optical resolution. Simulations shows how a metallic coating distorts optical nearfields and limits optical coupling into the probe in comparison to an uncoated probe.
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Submitted 22 September, 2021;
originally announced September 2021.
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Automatic Standardization of Colloquial Persian
Authors:
Mohammad Sadegh Rasooli,
Farzane Bakhtyari,
Fatemeh Shafiei,
Mahsa Ravanbakhsh,
Chris Callison-Burch
Abstract:
The Iranian Persian language has two varieties: standard and colloquial. Most natural language processing tools for Persian assume that the text is in standard form: this assumption is wrong in many real applications especially web content. This paper describes a simple and effective standardization approach based on sequence-to-sequence translation. We design an algorithm for generating artificia…
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The Iranian Persian language has two varieties: standard and colloquial. Most natural language processing tools for Persian assume that the text is in standard form: this assumption is wrong in many real applications especially web content. This paper describes a simple and effective standardization approach based on sequence-to-sequence translation. We design an algorithm for generating artificial parallel colloquial-to-standard data for learning a sequence-to-sequence model. Moreover, we annotate a publicly available evaluation data consisting of 1912 sentences from a diverse set of domains. Our intrinsic evaluation shows a higher BLEU score of 62.8 versus 61.7 compared to an off-the-shelf rule-based standardization model in which the original text has a BLEU score of 46.4. We also show that our model improves English-to-Persian machine translation in scenarios for which the training data is from colloquial Persian with 1.4 absolute BLEU score difference in the development data, and 0.8 in the test data.
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Submitted 10 December, 2020;
originally announced December 2020.
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Atomic-Scale Defect Detection by Nonlinear Light Scattering and Localization
Authors:
Farbod Shafiei,
Tommaso Orzali,
Alexey Vert,
Mohammad-Ali Miri,
P. Y. Hung,
Man Hoi Wong,
Andrea Alù,
Gennadi Bersuker,
Michael C. Downer
Abstract:
Hetero-epitaxial crystalline films underlie many electronic and optical technologies but are prone to forming defects at their hetero-interfaces. Atomic-scale defects such as threading dislocations that propagate into a film impede the flow of charge carriers and light degrading electrical-optical performance of devices. Diagnosis of subsurface defects traditionally requires time consuming invasiv…
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Hetero-epitaxial crystalline films underlie many electronic and optical technologies but are prone to forming defects at their hetero-interfaces. Atomic-scale defects such as threading dislocations that propagate into a film impede the flow of charge carriers and light degrading electrical-optical performance of devices. Diagnosis of subsurface defects traditionally requires time consuming invasive techniques such as cross sectional transmission electron microscopy. Using III-V films grown on Si, we have demonstrated noninvasive, bench-top diagnosis of sub-surface defects by optical second-harmonic scanning probe microscope. We observed a high-contrast pattern of sub-wavelength hot spots caused by scattering and localization of fundamental light by defect scattering sites. Size of these observed hotspots are strongly correlated to the density of dislocation defects. Our results not only demonstrate a global and versatile method for diagnosing sub-surface scattering sites but uniquely elucidate optical properties of disordered media. An extension to third harmonics would enable irregularities detection in non-X(2) materials making the technique universally applicable.
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Submitted 2 August, 2020; v1 submitted 2 July, 2020;
originally announced July 2020.
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Minimum edge cuts of distance-regular and strongly regular digraphs
Authors:
S. Ashkboos,
G. R. Omidi,
F. Shafiei,
K. Tajbakhsh
Abstract:
In this paper, we show that the edge connectivity of a distance-regular digraph $Γ$ with valency $k$ is $k$ and for $k>2$, any minimum edge cut of $Γ$ is the set of all edges going into (or coming out of) a single vertex. Moreover we show that the same result holds for strongly regular digraphs. These results extend the same known results for undirected case with quite different proofs.
In this paper, we show that the edge connectivity of a distance-regular digraph $Γ$ with valency $k$ is $k$ and for $k>2$, any minimum edge cut of $Γ$ is the set of all edges going into (or coming out of) a single vertex. Moreover we show that the same result holds for strongly regular digraphs. These results extend the same known results for undirected case with quite different proofs.
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Submitted 4 February, 2017;
originally announced February 2017.
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Analytic height correlation function of rough surfaces derived from light scattering
Authors:
M. Zamani,
F. Shafiei,
S. M. Fazeli,
M. C. Downer,
G. R. Jafari
Abstract:
We derive an analytic expression for the height correlation function of a rough surface based on the inverse wave scattering method of Kirchhoff theory. The expression directly relates the height correlation function to diffuse scattered intensity along a linear path at fixed polar angle. We test the solution by measuring the angular distribution of light scattered from rough silicon surfaces, and…
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We derive an analytic expression for the height correlation function of a rough surface based on the inverse wave scattering method of Kirchhoff theory. The expression directly relates the height correlation function to diffuse scattered intensity along a linear path at fixed polar angle. We test the solution by measuring the angular distribution of light scattered from rough silicon surfaces, and comparing extracted height correlation functions to those derived from atomic force microscopy (AFM). The results agree closely with AFM over a wider range of roughness parameters than previous formulations of the inverse scattering problem, while relying less on large-angle scatter data. Our expression thus provides an accurate analytical equation for the height correlation function of a wide range of surfaces based on measurements using a simple, fast experimental procedure.
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Submitted 24 June, 2016; v1 submitted 2 July, 2015;
originally announced July 2015.
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From Self-Assembly to Controlled-Assembly, From Optical Manipulation to AFM Manipulation
Authors:
Farbod Shafiei
Abstract:
Moving nanoparticles/atoms to study the nearfield interaction between them is one of the many approaches to explore the optical and electrical properties of these assemblies. Traditional approach included the self assembly by spinning or drying nanoparticles in aqua on the substrate is well practiced. Lithography technique is another popular approach to deposit limited nano/micro patterns on subst…
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Moving nanoparticles/atoms to study the nearfield interaction between them is one of the many approaches to explore the optical and electrical properties of these assemblies. Traditional approach included the self assembly by spinning or drying nanoparticles in aqua on the substrate is well practiced. Lithography technique is another popular approach to deposit limited nano/micro patterns on substrates. Later optical and mechanical manipulations were used to have more control over moving individual elements of nano and microstructures and even atoms. Optical tweezers, optical trapping and AFM manipulation are examples of these precise approaches.
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Submitted 31 December, 2014;
originally announced January 2015.
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Measurement of the separation dependence of resonant energy transfer between CdSe/ZnS core/shell nanocrystallite quantum dots
Authors:
Farbod Shafiei,
Sannah P. Ziama,
Eric D. Curtis,
Ricardo S. Decca
Abstract:
The separation dependence of the interaction between two resonant groups of CdSe/ZnS nanocrystallite quantum dots is studied at room temperature. A near-field scanning optical microscope is used to bring a group of mono-disperse ~6.5 nm diameter nanocrystallite quantum dots which are attached to the microscope probe, into close proximity of `~8.5 nm diameter group of nanocrystallite quantum dots w…
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The separation dependence of the interaction between two resonant groups of CdSe/ZnS nanocrystallite quantum dots is studied at room temperature. A near-field scanning optical microscope is used to bring a group of mono-disperse ~6.5 nm diameter nanocrystallite quantum dots which are attached to the microscope probe, into close proximity of `~8.5 nm diameter group of nanocrystallite quantum dots which are deposited on a solid immersion lens. Information extracted from photoluminescence, photoluminescence excitation and absorption curves as well as numerical calculations of the energy levels, show that the third excited excitonic energy level of the large quantum dots nearly matches the ground excitonic energy level for the small quantum dots. Quenching of the small quantum dots photoluminescence signal has been observed as they approach the large quantum dots. On average, the separation between microscope probe and solid immersion lens changed in the 15-50 nm range. The transition probability between these two groups of quantum dots is calculated to be (2.60 x 10-47 m6)/R6, within the (0.70 x 10-47 m6)/R6 - (11.0 x 10-47 m6)/R6 experimentally obtained range of transition probabilities. The Förster radius, as a signature of energy transfer efficiency, is experimentally found to be in the 14-22 nm range.
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Submitted 31 May, 2011;
originally announced May 2011.
