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Showing 1–3 of 3 results for author: Saramela, T B

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  1. arXiv:2406.12873  [pdf, other

    physics.ins-det hep-ex nucl-ex

    Evidence for polyimide redeposition and possible correlation with sparks in Gas Electron Multipliers working in CF$_4$ mixtures

    Authors: Thiago B. Saramela, Tiago F. Silva, Marco Bregant, Marcelo G. Munhoz, Tien T. Quach, Richard Hague, Ian S. Gilmore, Clive J. Roberts, Gustavo F. Trindade

    Abstract: Research on aging processes of Gas Electron Multipliers (GEMs) is important to obtain insights on how to increase the detector's longevity, stability, and performance, as highlighted in the latest developments roadmap by the European Council of Future Accelerators (ECFA). One key aspect of the aging process is the deposit formation on the electrodes surfaces. In this work, through the analysis of… ▽ More

    Submitted 25 June, 2024; v1 submitted 28 April, 2024; originally announced June 2024.

    Comments: 19 pages and 10 figures

  2. A data acquisition and reconstruction software for SAMPA-SRS integration

    Authors: G. G. A. de Souza, T. S. Abelha, T. B. Saramela, A. F. V. Cortez, H. N. da Luz, C. G. Penteado, M. Bregant

    Abstract: In this work we present the latest developments in the SAMPA-SRS integration. A software was developed to improve the acquisition configuration, acquisition, and decoding of the data. The complete framework was tested using a triple GEM-based position sensitive detector for X-rays. The detector was operated in Ar/CO$_2$ (70/30) in continuous flow, at atmospheric pressure and made use of a 1 dimens… ▽ More

    Submitted 8 May, 2023; v1 submitted 20 March, 2023; originally announced March 2023.

    Comments: 5 pages (with title page), 3 figures, conference paper (7th international conference on Micro Pattern Gaseous Detectors 2022 - MPGD2022)

  3. arXiv:2205.05680  [pdf

    physics.ins-det physics.app-ph

    Ion beam analysis and big data: How data science can support next-generation instrumentation

    Authors: Tiago F. Silva, Cleber L. Rodrigues, Manfredo H. Tabacniks, Hugo D. C. Pereira, Thiago B. Saramela, Renato O. Guimarães

    Abstract: With a growing demand for accurate ion beam analysis on a large number of samples, it becomes an issue of how to ensure the quality standards and consistency over hundreds or thousands of samples. In this sense, a virtual assistant that checks the data quality, emitting certificates of quality, is highly desired. Even the processing of a massive number of spectra is a problem regarding the consist… ▽ More

    Submitted 10 May, 2022; originally announced May 2022.

    Comments: 9 pages, 4 figures, 2019 Ion Beam Analysis Conference

    Journal ref: Nuclear Inst. and Methods in Physics Research B 478 (2020) 111-115