Showing 1–8 of 8 results for author: Ræder, T

Dark-Field X-ray Microscopy for 2D and 3D imaging of Microstructural Dynamics at the European X-ray Free Electron Laser

Authors: Sara J. Irvine, Kento Katagiri, Trygve M. Ræder, Ulrike Boesenberg, Darshan Chalise, Jade I. Stanton, Dayeeta Pal, Jörg Hallmann, Gabriele Ansaldi, Felix Brauße, Jon H. Eggert, Lichao Fang, Eric Folsom, Morten Haubro, Theodor S. Holstad, Anders Madsen, Johannes Möller, Martin M. Nielsen, Henning F. Poulsen, Jan-Etienne Pudell, Angel Rodriguez-Fernandez, Frank Schoofs, Frank Seiboth, Yifan Wang, Wonhyuk Jo , et al. (4 additional authors not shown)

Abstract: Dark field X-ray microscopy (DXFM) can visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve sub-μm spatial resolution and <100 fs time resolution simultaneously. In this paper, we demonstrate ultrafast DFXM measurements at the European XFEL to visualize an optically-driven longitudinal strain wav… ▽ More Dark field X-ray microscopy (DXFM) can visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve sub-μm spatial resolution and <100 fs time resolution simultaneously. In this paper, we demonstrate ultrafast DFXM measurements at the European XFEL to visualize an optically-driven longitudinal strain wave propagating through a diamond single crystal. We also present two DFXM scanning modalities that are new to the XFEL sources: spatially 3D and 2D axial-strain scans with sub-μm spatial resolution. With this progress in XFEL-based DFXM, we discuss new opportunities to study multi-timescale spatio-temporal dynamics of microstructures. △ Less

Submitted 18 September, 2024; v1 submitted 7 November, 2023; originally announced November 2023.

Imaging the Electric Field with X-Ray Diffraction Microscopy

Authors: Trygve Magnus Ræder, Urko Petralanda, Thomas Olsen, Hugh Simons

Abstract: The properties of semiconductors and functional dielectrics are defined by their response in electric fields, which may be perturbed by defects and the strain they generate. In this work, we demonstrate how diffraction-based X-ray microscopy techniques may be utilized to image the electric field in insulating crystalline materials. By analysing a prototypical ferro- and piezoelectric material, BaT… ▽ More The properties of semiconductors and functional dielectrics are defined by their response in electric fields, which may be perturbed by defects and the strain they generate. In this work, we demonstrate how diffraction-based X-ray microscopy techniques may be utilized to image the electric field in insulating crystalline materials. By analysing a prototypical ferro- and piezoelectric material, BaTiO$_{3}$, we identify trends that can guide experimental design towards imaging the electric field using any diffraction-based X-ray microscopy technique. We explain these trends in the context of dark-field X-ray microscopy, but the framework is also valid for Bragg scanning probe X-ray microscopy, Bragg coherent diffraction imaging and Bragg X-ray ptychography. The ability to quantify electric field distributions alongside the defects and strain already accessible via these techniques offers a more comprehensive picture of the often complex structure-property relationships that exist in many insulating and semiconducting materials. △ Less

Submitted 31 August, 2023; originally announced August 2023.

Journal ref: Phys. Rev. B 108, 104314 (2023)

Real-time imaging of acoustic waves in bulk materials with X-ray microscopy

Authors: Theodor S. Holstad, Leora E. Dresselhaus-Marais, Trygve Magnus Ræder, Bernard Kozioziemski, Tim van Driel, Matthew Seaberg, Eric Folsom, Jon H. Eggert, Erik Bergbäck Knudsen, Martin Meedom Nielsen, Hugh Simons, Kristoffer Haldrup, Henning Friis Poulsen

Abstract: Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determine properties. Today, 3D movies with ~100-nm resolution of crystalline structure are regularly acquired in minutes to hours using X-ray diffraction based imaging. We present an X-ray microscope that improves this time res… ▽ More Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determine properties. Today, 3D movies with ~100-nm resolution of crystalline structure are regularly acquired in minutes to hours using X-ray diffraction based imaging. We present an X-ray microscope that improves this time resolution to <100 femtoseconds, with images attainable even from a single X-ray pulse. Using this, we resolve the propagation of 18-km/s acoustic waves in mm-sized diamond crystals, and demonstrate how mechanical energy thermalizes from picosecond to microsecond timescales. Our approach unlocks a vast range of new experiments of materials phenomena with intricate structural dynamics at ultrafast timescales. △ Less

Submitted 14 November, 2022; v1 submitted 2 November, 2022; originally announced November 2022.

Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers

Authors: Leora E. Dresselhaus-Marais, Bernard Kozioziemski, Theodor S. Holstad, Trygve Magnus Ræder, Matthew Seaberg, Daewoong Nam, Sangsoo Kim, Sean Breckling, Seonghyuk Choi, Matthieu Chollet, Philip K. Cook, Eric Folsom, Eric Galtier, Arnulfo Gonzalez, Tais Gorhover, Serge Guillet, Kristoffer Haldrup, Marylesa Howard, Kento Katagiri, Seonghan Kim, Sunam Kim, Sungwon Kim, Hyunjung Kim, Erik Bergback Knudsen, Stephan Kuschel , et al. (18 additional authors not shown)

Abstract: The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the str… ▽ More The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, Dark Field X-ray Microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $10^{12}$ photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics. △ Less

Submitted 5 September, 2023; v1 submitted 15 October, 2022; originally announced October 2022.

Journal ref: Scientific Reports, 13, 17573 (2023)

Simulating dark-field x-ray microscopy images with wave front propagation techniques

Authors: Mads Carlsen, Carsten Detlefs, Can Yildirim, Trygve Ræder, Hugh Simons

Abstract: Dark-Field X-ray Microscopy (DFXM) is a diffraction-based synchrotron imaging techique capable of imaging defects in the bulk of extended crystalline samples. We present numerical simulations of image-formation in such a microscope using numerical integration of the dynamical Takagi-Taupin Equations (TTE) and wave front propagation. We validate our approach by comparing simulated images to experim… ▽ More Dark-Field X-ray Microscopy (DFXM) is a diffraction-based synchrotron imaging techique capable of imaging defects in the bulk of extended crystalline samples. We present numerical simulations of image-formation in such a microscope using numerical integration of the dynamical Takagi-Taupin Equations (TTE) and wave front propagation. We validate our approach by comparing simulated images to experimental data from a near-perfect single crystal of diamond containing a single stacking fault defect in the illuminated volume. △ Less

Submitted 23 February, 2022; v1 submitted 19 January, 2022; originally announced January 2022.

X-ray Free Electron Laser based Dark-Field X-ray Microscopy

Authors: Theodor Secanell Holstad, Trygve Magnus Raeder, Mads Allerup Carlsen, Erik Bergback Knudsen, Leora Dresselhaus-Marais, Kristoffer Haldrup, Hugh Simons, Martin Meedom Nielsen, Henning Friis Poulsen

Abstract: Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three dimensional mapping of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an objective lens in the diffracted beam, giving a magnified projection image. So far, the method has been applied with a time resolution of milliseconds to hours. In th… ▽ More Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three dimensional mapping of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an objective lens in the diffracted beam, giving a magnified projection image. So far, the method has been applied with a time resolution of milliseconds to hours. In this work, we consider the feasibility of DFXM at the picosecond time scale using an X-ray free electron laser source and a pump-probe scheme. We combine thermomechanical strain wave simulations with geometrical optics and wavefront propagation optics to simulate DFXM images of phonon dynamics in a diamond single crystal. Using the specifications of the XCS instrument at the Linac Coherent Light Source (LCLS) as an example results in simulated DFXM images clearly showing the propagation of a strain wave. △ Less

Submitted 2 November, 2021; originally announced November 2021.

Consensus in Blockchain Systems with Low Network Throughput: A Systematic Mapping Study

Authors: Henrik Knudsen, Jakob Svennevik Notland, Peter Halland Haro, Truls Bakkejord Ræder, Jingyue Li

Abstract: Blockchain technologies originate from cryptocurrencies. Thus, most blockchain technologies assume an environment with a fast and stable network. However, in some blockchain-based systems, e.g., supply chain management (SCM) systems, some Internet of Things (IOT) nodes can only rely on the low-quality network sometimes to achieve consensus. Thus, it is critical to understand the applicability of e… ▽ More Blockchain technologies originate from cryptocurrencies. Thus, most blockchain technologies assume an environment with a fast and stable network. However, in some blockchain-based systems, e.g., supply chain management (SCM) systems, some Internet of Things (IOT) nodes can only rely on the low-quality network sometimes to achieve consensus. Thus, it is critical to understand the applicability of existing consensus algorithms in such environments. We performed a systematic mapping study to evaluate and compare existing consensus mechanisms' capability to provide integrity and security with varying network properties. Our study identified 25 state-of-the-art consensus algorithms from published and preprint literature. We categorized and compared the consensus algorithms qualitatively based on established performance and integrity metrics and well-known blockchain security issues. Results show that consensus algorithms rely on the synchronous network for correctness cannot provide the expected integrity. Such consensus algorithms may also be vulnerable to distributed-denial-of-service (DDOS) and routing attacks, given limited network throughput. Conversely, asynchronous consensus algorithms, e.g., Honey-BadgerBFT, are deemed more robust against many of these attacks and may provide high integrity in asynchrony events. △ Less

Submitted 4 March, 2021; originally announced March 2021.

Predictors of short-term decay of cell phone contacts in a large scale communication network

Authors: Troy Raeder, Omar Lizardo, David Hachen, Nitesh V. Chawla

Abstract: Under what conditions is an edge present in a social network at time t likely to decay or persist by some future time t + Delta(t)? Previous research addressing this issue suggests that the network range of the people involved in the edge, the extent to which the edge is embedded in a surrounding structure, and the age of the edge all play a role in edge decay. This paper uses weighted data from a… ▽ More Under what conditions is an edge present in a social network at time t likely to decay or persist by some future time t + Delta(t)? Previous research addressing this issue suggests that the network range of the people involved in the edge, the extent to which the edge is embedded in a surrounding structure, and the age of the edge all play a role in edge decay. This paper uses weighted data from a large-scale social network built from cell-phone calls in an 8-week period to determine the importance of edge weight for the decay/persistence process. In particular, we study the relative predictive power of directed weight, embeddedness, newness, and range (measured as outdegree) with respect to edge decay and assess the effectiveness with which a simple decision tree and logistic regression classifier can accurately predict whether an edge that was active in one time period continues to be so in a future time period. We find that directed edge weight, weighted reciprocity and time-dependent measures of edge longevity are highly predictive of whether we classify an edge as persistent or decayed, relative to the other types of factors at the dyad and neighborhood level. △ Less

Submitted 11 February, 2011; v1 submitted 8 February, 2011; originally announced February 2011.