Development of a High Rate Front-end ASIC for X-ray Spectroscopy and Diffraction Applications
Authors:
Emerson Vernon,
Gianluigi De Geronimo,
Jonathan Baldwin,
Wei Chen,
Jack Fried,
Gabriele Giacomini,
Anthony Kuczewski,
John Kuczewski,
Joe Mead,
Antonino Miceli,
John S. Okasinski,
Don Pinelli,
Orlando Quaranta,
Abdul K. Rumaiz,
Peter Siddons,
Graham Smith,
Milutin Stanacevic,
Russell Woods
Abstract:
We developed a new front-end application specific integrated circuit (ASIC) for the upgrade of the Maia x-ray microprobe. The ASIC instruments 32 configurable front-end channels that perform either positive or negative charge amplification, pulse shaping, peak amplitude and time extraction along with buffered analog storage. At a gain of 3.6 V/fC, 1 $μ$s peaking time and a temperature of 248 K, an…
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We developed a new front-end application specific integrated circuit (ASIC) for the upgrade of the Maia x-ray microprobe. The ASIC instruments 32 configurable front-end channels that perform either positive or negative charge amplification, pulse shaping, peak amplitude and time extraction along with buffered analog storage. At a gain of 3.6 V/fC, 1 $μ$s peaking time and a temperature of 248 K, an electronic resolution of 13- and 10 electrons rms was measured with and without a SDD sensor respectively. A spectral resolution of 170 eV FWHM at 5.9 keV was obtained with an $^{55}$Fe source. The channel linearity was better than $\pm$ 1 % with rate capabilities up to 40 kcps. The ASIC was fabricated in a commercial 250 nm process with a footprint of 6.3 mm x 3.9 mm and dissipates 167 mW of static power.
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Submitted 13 May, 2019;
originally announced May 2019.
Isothermal Annealing of Shocked Zirconium: Stability of the Two-phase $α/ω$ Microstructure
Authors:
Thaddeus Song En Low,
Donald W. Brown,
Brian A. Welk,
Ellen K. Cerreta,
Jon S. Okasinski,
Stephen R. Niezgoda
Abstract:
Under high pressure conditions, Zr undergoes a phase transformation from its ambient equilibrium hexagonal close packed $α$ phase to hexagonal $ω$ phase. Upon returning to ambient conditions, the material displays hysteretic behavior, retaining a significant amount of metastable $ω$ phase. This study presents an in-situ synchrotron X-ray diffraction analysis of Zr samples shock-loaded to compressi…
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Under high pressure conditions, Zr undergoes a phase transformation from its ambient equilibrium hexagonal close packed $α$ phase to hexagonal $ω$ phase. Upon returning to ambient conditions, the material displays hysteretic behavior, retaining a significant amount of metastable $ω$ phase. This study presents an in-situ synchrotron X-ray diffraction analysis of Zr samples shock-loaded to compressive peak stresses of 8 and 10.5 GPa and then annealed at temperatures of 443, 463, 483, and 503K. The evolution of the $α$ phase volume fraction was tracked quantitatively, and the dislocation densities in both phases were tracked qualitatively during annealing. Upon heating, the reverse transformation of $ω\toα$ does not go to completion, but instead reaches a new metastable state. The initial rate of transformation is faster at higher temperatures. Samples shock-loaded to higher peak pressures experienced higher initial transformation rates and more extensive transformation. Dislocation content in both phases was observed to be high in the as-shocked samples. Annealing the samples reduces the dislocation content in both phases, with the reduction being lesser in the $ω$ phase, leading to the postulation that transformation from $ω\toα$ is restricted by the pinning effect of dislocation structures within the $ω$ phase. Electron backscatter diffraction analysis affirmed that the expected $(0\;0\;0\;1)_α\parallel(1\;0\;\overline{1}\;1)_ω$ and $[1\;0\;\overline{1}\;0]_α\parallel[1\;1\;\overline{2}\;\overline{3}]_ω$ orientation relationship is maintained during nucleation and growth of the $α$ phase during the annealing. \end{abstract}
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Submitted 13 March, 2015; v1 submitted 12 November, 2014;
originally announced November 2014.
