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Hard X-ray grazing incidence ptychography: Large field-of-view nanostructure imaging with ultra-high surface sensitivity
Authors:
P. S. Jørgensen,
L. Besley,
A. M. Slyamov,
A. Diaz,
M. Guizar-Sicairos,
M. Odstrcil,
M. Holler,
C. Silvestre,
B. Chang,
C. Detlefs,
J. W. Andreasen
Abstract:
We demonstrate a technique that allows highly surface sensitive imaging of nanostructures on planar surfaces over large areas, providing a new avenue for research in materials science, especially for \textit{in situ} applications. The capabilities of hard X-ray grazing incidence ptychography combine aspects from imaging, reflectometry and grazing incidence small angle scattering in providing large…
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We demonstrate a technique that allows highly surface sensitive imaging of nanostructures on planar surfaces over large areas, providing a new avenue for research in materials science, especially for \textit{in situ} applications. The capabilities of hard X-ray grazing incidence ptychography combine aspects from imaging, reflectometry and grazing incidence small angle scattering in providing large field-of-view images with high resolution transverse to the beam, horizontally and along the surface normal. Thus, it yields data with resolutions approaching electron microscopy, in two dimensions, but over much larger areas and with a poorer resolution in the third spatial dimension, along the beam propagation direction. Similar to grazing incidence small angle X-ray scattering, this technique facilitates the characterization of nanostructures across statistically significant surface areas or volumes within potentially feasible time frames for \textit{in situ} experiments, while also providing spatial information.
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Submitted 4 July, 2023;
originally announced July 2023.
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Electron ptychography achieves atomic-resolution limits set by lattice vibrations
Authors:
Zhen Chen,
Yi Jiang,
Yu-Tsun Shao,
Megan E. Holtz,
Michal Odstrčil,
Manuel Guizar-Sicairos,
Isabelle Hanke,
Steffen Ganschow,
Darrell G. Schlom,
David A. Muller
Abstract:
Transmission electron microscopes use electrons with wavelengths of a few picometers, potentially capable of imaging individual atoms in solids at a resolution ultimately set by the intrinsic size of an atom. Unfortunately, due to imperfections in the imaging lenses and multiple scattering of electrons in the sample, the image resolution reached is 3 to 10 times worse. Here, by inversely solving t…
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Transmission electron microscopes use electrons with wavelengths of a few picometers, potentially capable of imaging individual atoms in solids at a resolution ultimately set by the intrinsic size of an atom. Unfortunately, due to imperfections in the imaging lenses and multiple scattering of electrons in the sample, the image resolution reached is 3 to 10 times worse. Here, by inversely solving the multiple scattering problem and overcoming the aberrations of the electron probe using electron ptychography to recover a linear phase response in thick samples, we demonstrate an instrumental blurring of under 20 picometers. The widths of atomic columns in the measured electrostatic potential are now no longer limited by the imaging system, but instead by the thermal fluctuations of the atoms. We also demonstrate that electron ptychography can potentially reach a sub-nanometer depth resolution and locate embedded atomic dopants in all three dimensions with only a single projection measurement.
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Submitted 2 January, 2021;
originally announced January 2021.
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Imaging three-dimensional nanoscale magnetization dynamics
Authors:
Claire Donnelly,
Simone Finizio,
Sebastian Gliga,
Mirko Holler,
Aleš Hrabec,
Michal Odstrčil,
Sina Mayr,
Valerio Scagnoli,
Laura J. Heyderman,
Manuel Guizar-Sicairos,
Jörg Raabe
Abstract:
The ability to experimentally map the three-dimensional structure and dynamics in bulk and patterned three-dimensional ferromagnets is essential both for understanding fundamental micromagnetic processes, as well as for investigating technologically-relevant micromagnets whose functions are connected to the presence and dynamics of fundamental micromagnetic structures, such as domain walls and vor…
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The ability to experimentally map the three-dimensional structure and dynamics in bulk and patterned three-dimensional ferromagnets is essential both for understanding fundamental micromagnetic processes, as well as for investigating technologically-relevant micromagnets whose functions are connected to the presence and dynamics of fundamental micromagnetic structures, such as domain walls and vortices. Here, we demonstrate time-resolved magnetic laminography, a technique which offers access to the temporal evolution of a complex three-dimensional magnetic structure with nanoscale resolution. We image the dynamics of the complex three-dimensional magnetization state in a two-phase bulk magnet with a lateral spatial resolution of 50 nm, mapping the transition between domain wall precession and the dynamics of a uniform magnetic domain that is attributed to variations in the magnetization state across the phase boundary. The capability to probe three-dimensional magnetic structures with temporal resolution paves the way for the experimental investigation of novel functionalities arising from dynamic phenomena in bulk and three-dimensional patterned nanomagnets.
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Submitted 22 January, 2020;
originally announced January 2020.
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Pulse-to-pulse wavefront sensing at free-electron lasers using ptychography
Authors:
Simone Sala,
Benedikt J. Daurer,
Michal Odstrcil,
Flavio Capotondi,
Emanuele Pedersoli,
Max F. Hantke,
Michele Manfredda,
N. Duane Loh,
Pierre Thibault,
Filipe R. N. C. Maia
Abstract:
The pressing need for the detailed wavefront properties of ultra-bright and ultra-short pulses produced by free-electron lasers (FELs) has spurred the development of several complementary characterization approaches. Here we present a method based on ptychography that can retrieve full high-resolution complex-valued wave functions of individual pulses. Our technique is demonstrated within experime…
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The pressing need for the detailed wavefront properties of ultra-bright and ultra-short pulses produced by free-electron lasers (FELs) has spurred the development of several complementary characterization approaches. Here we present a method based on ptychography that can retrieve full high-resolution complex-valued wave functions of individual pulses. Our technique is demonstrated within experimental conditions suited for diffraction experiments in their native imaging state. This lensless technique, applicable to many other short-pulse instruments, can achieve diffraction-limited resolution.
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Submitted 25 November, 2019; v1 submitted 24 January, 2019;
originally announced January 2019.
