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Showing 1–3 of 3 results for author: Miremadi, S

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  1. arXiv:2201.04373  [pdf, other

    cs.AR

    TA-LRW: A Replacement Policy for Error Rate Reduction in STT-MRAM Caches

    Authors: Elham Cheshmikhani, Hamed Farbeh, Seyed Ghassem Miremadi, Hossein Asadi

    Abstract: As technology process node scales down, on-chip SRAM caches lose their efficiency because of their low scalability, high leakage power, and increasing rate of soft errors. Among emerging memory technologies, Spin-Transfer Torque Magnetic RAM (STT-MRAM) is known as the most promising replacement for SRAM-based cache memories. The main advantages of STT-MRAM are its non-volatility, near-zero leakage… ▽ More

    Submitted 12 January, 2022; originally announced January 2022.

  2. arXiv:1910.08306  [pdf, other

    eess.SY

    Enhancing Temporal Logic Falsification with Specification Transformation and Valued Booleans

    Authors: Johan Lidén Eddeland, Koen Claessen, Nicholas Smallbone, Zahra Ramezani, Sajed Miremadi, Knut Åkesson

    Abstract: Cyber-Physical Systems (CPSs) are systems with both physical and software components, for example cars and industrial robots. Since these systems exhibit both discrete and continuous dynamics, they are complex and it is thus difficult to verify that they behave as expected. Falsification of temporal logic properties is an approach to find counterexamples to CPSs by means of simulation. In this pap… ▽ More

    Submitted 18 October, 2019; originally announced October 2019.

  3. arXiv:1901.00568  [pdf, other

    cs.ET cs.AR

    3DCAM: A Low Overhead Crosstalk Avoidance Mechanism for TSV-Based 3D ICs

    Authors: Reza Mirosanlou, Mohammadkazem Taram, Zahra Shirmohammadi, Seyed-Ghassem Miremadi

    Abstract: Three Dimensional Integrated Circuits (3D IC) offer lower power consumption, higher performance, higher bandwidth, and scalability over the conventional two dimensional ICs. Through-Silicon Via (TSV) is one of the fabrication mechanisms that connects stacked dies to each other. The large size of TSVs and the proximity between them lead to undesirable coupling capacitance. This interference causes… ▽ More

    Submitted 2 January, 2019; originally announced January 2019.

    Comments: Initially Accepted to ICCD 2015