Pressure dependence of intra- and interlayer excitons in 2H-MoS$_2$ bilayers
Authors:
Paul Steeger,
Jan-Hauke Graalmann,
Robert Schmidt,
Ilya Kupenko,
Carmen Sanchez-Valle,
Philipp Marauhn,
Thorsten Deilmann,
Steffen Michaelis de Vasconcellos,
Michael Rohlfing,
Rudolf Bratschitsch
Abstract:
The optical and electronic properties of multilayer transition metal dichalcogenides differ significantly from their monolayer counterparts due to interlayer interactions. The separation of individual layers can be tuned in a controlled way by applying pressure. Here, we use a diamond anvil cell to compress bilayers of 2H-MoS$_2$ in the gigapascal range. By measuring optical transmission spectra,…
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The optical and electronic properties of multilayer transition metal dichalcogenides differ significantly from their monolayer counterparts due to interlayer interactions. The separation of individual layers can be tuned in a controlled way by applying pressure. Here, we use a diamond anvil cell to compress bilayers of 2H-MoS$_2$ in the gigapascal range. By measuring optical transmission spectra, we find that increasing pressure leads to a decrease in the energy splitting between the A and interlayer exciton. Comparing our experimental findings with ab initio calculations, we conclude that the observed changes are not due to the commonly assumed hydrostatic compression. This effect is attributed to the MoS$_2$ bilayer adhering to the diamond, which reduces in-plane compression. Moreover, we demonstrate that the distinct real-space distributions and resulting contributions from the valence band account for the different pressure dependencies of the inter- and intralayer excitons in compressed MoS$_2$ bilayers.
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Submitted 27 June, 2023;
originally announced June 2023.
Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2
Authors:
Yue Niu,
Sergio Gonzalez-Abad,
Riccardo Frisenda,
Philipp Marauhn,
Matthias Drüppel,
Patricia Gant,
Robert Schmidt,
Najme S. Taghavi,
David Barcons,
Aday J. Molina-Mendoza,
Steffen Michaelis de Vasconcellos,
Rudolf Bratschitsch,
David Perez De Lara,
Michael Rohlfing,
Andres Castellanos-Gomez
Abstract:
The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques opened the door to study the optical properties of these nanomaterials. We presented a comprehensive study of the differential reflectance spectra of 2D semicond…
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The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques opened the door to study the optical properties of these nanomaterials. We presented a comprehensive study of the differential reflectance spectra of 2D semiconducting transition metal dichalcogenides (TMDCs), MoS2, MoSe2, WS2, and WSe2, with thickness ranging from one layer up to six layers. We analyzed the thickness-dependent energy of the different excitonic features, indicating the change in the band structure of the different TMDC materials with the number of layers. Our work provided a route to employ differential reflectance spectroscopy for determining the number of layers of MoS2, MoSe2, WS2, and WSe2.
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Submitted 10 October, 2018;
originally announced October 2018.
