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Showing 1–3 of 3 results for author: Madadzada, A

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  1. arXiv:2309.02795  [pdf

    physics.ins-det physics.app-ph

    A compact and sustainable electronic module for silicon photomultipliers

    Authors: A. Sadigov, S. Nuruyev, R. Akbarov, D. B. Berikov, A. Madadzada, A. Mammadli

    Abstract: This article presents the development of a cost-effective and efficient electronic module for silicon photomultipliers (SiPM). The electronic module combines essential functionalities, such as a high voltage power supply, a preamplifier, and a signal comparator, into a compact circuit. A high voltage power supply with a range of 30 to 140 V provides a stable bias voltage with 0.01 V accuracy for t… ▽ More

    Submitted 6 September, 2023; originally announced September 2023.

    Comments: an article, 9 pages, 6 figures

  2. arXiv:2304.13612  [pdf

    physics.ins-det nucl-ex

    Portable neutron/gamma scintillation detector for status monitoring of accelerator-driven neutron source IREN

    Authors: S. Nuruyev, D. Berikov, R. Akbarov, G. Ahmadov, F. Ahmadov, A. Sadigov, M. Holik, J. Naghiyev, A. Madadzada, K. Udovichenko

    Abstract: Accelerator-driven system (ADS) facilities world-wide opens new opportunities for nuclear physics investigations, so that a high flux of neutrons through spallation reactions can be produced at these facilities. It is known that the measurement, continuous monitoring and optimization of the particle accelerator beam intensity are among the most important actions in the operation of such facilities… ▽ More

    Submitted 26 April, 2023; originally announced April 2023.

    Comments: 8 pages, 7 figures

  3. arXiv:2009.01733  [pdf

    cond-mat.mtrl-sci

    Variation of TiO2/SiO2 mixed layers induced by different Xe+ ion energies

    Authors: Tran Van Phuc, Miroslaw Kulik, Afag Madadzada, Dorota. Kolodynska, Le Hong Khiem, Phan Luong Tuan, Nguyen Ngoc Anh

    Abstract: The broadening and optical parameters of TiO2/SiO2 transition layers depending on the ion energy have been investigated using the Rutherford Backscattering Spectrometry (RBS) and Ellipstrometry Spectroscopy (ES) methods. The TiO2/SiO2 samples were irradiated by Xe+ ions with energies of 100, 150, 200 and 250 keV. The depth profiles of the elements determined by the RBS spectra show the structure a… ▽ More

    Submitted 3 September, 2020; originally announced September 2020.

    Comments: 20 pages, 9 figures