Showing 1–6 of 6 results for author: Luis, E E M

Universal scaling relation for growth phenomena

Authors: Evandro A. Rodrigues, Edwin E. Mozo Luis, Thiago A. de Assis, Fernando A. Oliveira

Abstract: The Family-Vicsek relation is a seminal universal relation obtained for the global roughness at the interface of two media in the growth process. In this work, we revisit the scaling analysis and, through both analytical and computational means, show that the Family-Vicsek relation can be generalized to a new scaling independent of the size, substrate dimension $d$, and scaling exponents. We use p… ▽ More The Family-Vicsek relation is a seminal universal relation obtained for the global roughness at the interface of two media in the growth process. In this work, we revisit the scaling analysis and, through both analytical and computational means, show that the Family-Vicsek relation can be generalized to a new scaling independent of the size, substrate dimension $d$, and scaling exponents. We use properties of lattice growth models in the Kardar-Parisi-Zhang and Villain-Lai-Das Sarma universality classes for $1 \leq d \leq 3$ to support our claims. △ Less

Submitted 16 March, 2025; originally announced March 2025.

Bifractality in one-dimensional Wolf-Villain model

Authors: Edwin E. Mozo Luis, Silvio C. Ferreira, Thiago A. de Assis

Abstract: We introduce a multifractal optimal detrended fluctuation analysis to study the scaling properties of the one-dimensional Wolf-Villain (WV) model for surface growth. This model produces mounded surface morphologies for long time scales (up to $10^9$ monolayers) and its universality class remains controversial. Our results for the multifractal exponent $τ(q)$ reveal an effective local roughness exp… ▽ More We introduce a multifractal optimal detrended fluctuation analysis to study the scaling properties of the one-dimensional Wolf-Villain (WV) model for surface growth. This model produces mounded surface morphologies for long time scales (up to $10^9$ monolayers) and its universality class remains controversial. Our results for the multifractal exponent $τ(q)$ reveal an effective local roughness exponent consistent with a transient given by the molecular beam epitaxy (MBE) growth regime and Edward-Wilkinson (EW) universality class for negative and positive $q$-values, respectively. Therefore, although the results corroborate that long-wavelength fluctuations belong to the EW class in the hydrodynamic limit, as conjectured in the recent literature, a bifractal signature of the WV model with an MBE regime at short wavelengths was observed. △ Less

Submitted 11 May, 2024; originally announced May 2024.

A geometrical interpretation of critical exponents

Authors: Henrique A. Lima, Edwin E. Mozo Luis, Ismael S. S. Carrasco, Alex Hansen, Fernando A. Oliveira

Abstract: We develop the hypothesis that the dynamics of a given system may lead to the activity being constricted to a subset of space, characterized by a fractal dimension smaller than the space dimension. We also address how the response function might be sensitive to this change in dimensionality. We discuss how this phenomenon is observable in growth processes and near critical points for systems in eq… ▽ More We develop the hypothesis that the dynamics of a given system may lead to the activity being constricted to a subset of space, characterized by a fractal dimension smaller than the space dimension. We also address how the response function might be sensitive to this change in dimensionality. We discuss how this phenomenon is observable in growth processes and near critical points for systems in equilibrium. In particular, we determine the fractal dimension $d_f$ for the Ising model and validate it via computer simulations for two dimensions. △ Less

Submitted 27 December, 2024; v1 submitted 15 February, 2024; originally announced February 2024.

Statistics of adatom diffusion in a model of thin film growth

Authors: Edwin E. Mozo Luis, Ismael S. S. Carrasco, Thiago A. de Assis, Fábio D. A. Aarão Reis

Abstract: We study the statistics of the number of executed hops of adatoms at the surface of films grown with the Clarke-Vvedensky (CV) model in simple cubic lattices. The distributions of this number, $N$, are determined in films with average thicknesses close to $50$ and $100$ monolayers for a broad range of values of the diffusion-to-deposition ratio $R$ and of the probability $ε$ that lowers the diffus… ▽ More We study the statistics of the number of executed hops of adatoms at the surface of films grown with the Clarke-Vvedensky (CV) model in simple cubic lattices. The distributions of this number, $N$, are determined in films with average thicknesses close to $50$ and $100$ monolayers for a broad range of values of the diffusion-to-deposition ratio $R$ and of the probability $ε$ that lowers the diffusion coefficient for each lateral neighbor. The mobility of subsurface atoms and the energy barriers for crossing step edges are neglected. Simulations show that the adatoms execute uncorrelated diffusion during the time in which they move on the film surface. In a low temperature regime, typically with $Rε\lesssim 1$, the attachment to lateral neighbors is almost irreversible, the average number of hops scales as $\langle N\rangle \sim R^{0.38\pm 0.01}$, and the distribution of that number decays approximately as $\exp\left[-\left({N/\langle N\rangle}\right)^{0.80\pm 0.07}\right]$. Similar decay is observed in simulations of random walks in a plane with randomly distributed absorbing traps and the estimated relation between $\langle N\rangle$ and the density of terrace steps is similar to that observed in the trapping problem, which provides a conceptual explanation of that regime. As the temperature increases, $\langle N\rangle$ crosses over to another regime when $Rε^{3.0\pm 0.3}\sim 1$, which indicates high mobility of all adatoms at terrace borders. The distributions $P\left( N\right)$ change to simple exponential decays, due to the constant probability for an adatom to become immobile after being covered by a new deposited layer. At higher temperatures, the surfaces become very smooth and $\langle N\rangle \sim Rε^{1.85\pm 0.15}$, which is explained by an analogy with submonolayer growth. △ Less

Submitted 24 July, 2020; originally announced July 2020.

Journal ref: Physical Review E 102, 012805 (2020)

Local roughness exponent in the nonlinear molecular-beam-epitaxy universality class in one-dimension

Authors: Edwin E. Mozo Luis, Thiago A. de Assis, Silvio C. Ferreira, Roberto F. S. Andrade

Abstract: We report local roughness exponents, $α_{\text{loc}}$, for three interface growth models in one dimension which are believed to belong the non-linear molecular-beam-epitaxy (nMBE) universality class represented by the Villain-Lais-Das Sarma (VLDS) stochastic equation. We applied an optimum detrended fluctuation analysis (ODFA) [Luis et al., Phys. Rev. E 95, 042801 (2017)] and compared the outcomes… ▽ More We report local roughness exponents, $α_{\text{loc}}$, for three interface growth models in one dimension which are believed to belong the non-linear molecular-beam-epitaxy (nMBE) universality class represented by the Villain-Lais-Das Sarma (VLDS) stochastic equation. We applied an optimum detrended fluctuation analysis (ODFA) [Luis et al., Phys. Rev. E 95, 042801 (2017)] and compared the outcomes with standard detrending methods. We observe in all investigated models that ODFA outperforms the standard methods providing exponents in the narrow interval $α_{\text{loc}}\in[0.96,0.98]$ consistent with renormalization group predictions for the VLDS equation. In particular, these exponent values are calculated for the Clarke-Vvdensky and Das Sarma-Tamborenea models characterized by very strong corrections to the scaling, for which large deviations of these values had been reported. Our results strongly support the absence of anomalous scaling in the nMBE universality class and the existence of corrections in the form $α_{\text{loc}}=1-ε$ of the one-loop renormalization group analysis of the VLDS equation. △ Less

Submitted 7 December, 2018; originally announced December 2018.

Journal ref: Phys. Rev. E 99, 022801 (2019)

Optimal detrended fluctuation analysis as a tool for the determination of the roughness exponent of the mounded surfaces

Authors: Edwin E. Mozo Luis, Thiago A. de Assis, Silvio C. Ferreira

Abstract: We present an optimal detrended fluctuation analysis (DFA) and applied it to evaluate the local roughness exponent in non-equilibrium surface growth models with mounded morphology. Our method consists in analyzing the height fluctuations computing the shortest distance of each point of the profile to a detrending curved that fits the surface within the investigated interval. We compare the optimal… ▽ More We present an optimal detrended fluctuation analysis (DFA) and applied it to evaluate the local roughness exponent in non-equilibrium surface growth models with mounded morphology. Our method consists in analyzing the height fluctuations computing the shortest distance of each point of the profile to a detrending curved that fits the surface within the investigated interval. We compare the optimal DFA (ODFA) with both the standard DFA and nondetrended analysis. We validate the ODFA method considering a one-dimensional model in the Kardar-Parisi-Zhang universality class starting from a mounded initial condition. We applied the methods to the Clarke-Vvdensky (CV) model in $2+1$ dimensions with thermally activated surface diffusion and absence of step barriers. It is expected that this model belongs to the nonlinear Molecular Beam Epitaxy (nMBE) universality class. However, an explicit observation of the roughness exponent in agreement with the nMBE class was still missing. The effective roughness exponent obtained with ODFA agrees with the value expected for nMBE class whereas using the other methods it does not. We also characterized the transient anomalous scaling of the CV model and obtained that the corresponding exponent is in agreement with the value reported for other nMBE models with weaker corrections to the scaling. △ Less

Submitted 21 March, 2017; v1 submitted 15 December, 2016; originally announced December 2016.

Comments: To appear in Physical Review E

Journal ref: Phys. Rev. E 95, 042801 (2017)