Nanowire lasers
Authors:
C. Couteau,
A. Larrue,
C. Wilhelm,
C. Soci
Abstract:
We review principles and trends in the use of semiconductor nanowires (NWs) as gain media for stimulated emission and lasing. Semiconductor nanowires have recently been widely studied for use in integrated optoelectronic devices, such as LEDs, solar cells, and transistors. Intensive research has also been conducted on the use of nanowires for sub-wavelength laser systems that take advantage of the…
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We review principles and trends in the use of semiconductor nanowires (NWs) as gain media for stimulated emission and lasing. Semiconductor nanowires have recently been widely studied for use in integrated optoelectronic devices, such as LEDs, solar cells, and transistors. Intensive research has also been conducted on the use of nanowires for sub-wavelength laser systems that take advantage of their quasi-one-dimensional nature, flexibility in material choice and combination, and intrinsic optoelectronic properties. First, we provide an overview on using quasi-one-dimensional nanowire systems to realize sub-wavelength lasers with efficient, directional, and low-threshold emission. We then describe the state-of-the-art for nanowire lasers in terms of materials, geometry, and wavelength tunability. Next, we present the basics of lasing in semiconductor nanowires, define the key parameters for stimulated emission, and introduce the properties of nanowires. We then review advanced nanowire laser designs from the literature. Finally, we present interesting perspectives for low-threshold nanoscale light sources and optical interconnects. We intend to illustrate the potential of nanolasers in many applications, such as nanophotonic devices that integrate electronics and photonics for next-generation optoelectronic devices. For instance, these building blocks for nanoscale photonics can be used for data storage and biomedical applications when coupled to on-chip characterization tools. These nanoscale monochromatic laser light sources promise breakthroughs in nanophotonics, as they can operate at room temperature, potentially be electrically driven, and yield a better understanding of intrinsic nanomaterial properties and surface state effects in low-dimensional semiconductor systems.
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Submitted 5 September, 2018;
originally announced September 2018.
X-ray microtomography of heavy microstructures: the case of Plasma-Sprayed Tungsten and Tungsten-Steel MMC
Authors:
A. Zivelonghi,
T. Weitkamp,
A. Larrue,
J-H. You
Abstract:
In this paper synchrotron microtomography on Plasma Sprayed Tungsten (PS-W) is presented and discussed. PS-W is a challenging material for microtomography since it exhibits a random porous network at different length-scales (from nanometers to micrometers) and is hardly penetrable by X-rays. Furthermore, inner porosity causes strong internal scattering. The key challenges were, firstly, to optimiz…
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In this paper synchrotron microtomography on Plasma Sprayed Tungsten (PS-W) is presented and discussed. PS-W is a challenging material for microtomography since it exhibits a random porous network at different length-scales (from nanometers to micrometers) and is hardly penetrable by X-rays. Furthermore, inner porosity causes strong internal scattering. The key challenges were, firstly, to optimize the beam parameters considering the inherent trade-off between photon energy (penetration depth) and spatial resolution and, secondly, to develop effective signal filtering algorithms. Despite the limited signal-to-noise ratio detected, large volumes of PS-W could be reconstructed with good image quality and micrometric resolution (voxel size = 1.4 μm). As an important result, we report excellent image quality and higher penetration depth by applying the same setup on a ferrous microstructure, namely a 10%W/Steel MMC used as interlayer between PS-W and a ferritic/martensitic steel substrate. The paper reports a detailed 3D morphological analysis of all inclusion types in PS-W and W/Steel, which led to disclosure of a complex connected porous network in both media. The analysis is presented in terms of multiphase volume fraction, ratio of percolation and 3D shape descriptors. 3D percolation patterns are analyzed in detail and sensitivity towards segmentation threshold for the noise-affected PS-W region is discussed. Remarkably, percolation of the porous phase was found throughout the entire coating thickness of PS-W. In W-Steel MMC percolation was found in the perpendicular plane and interpreted as onset of delamination caused by thermomechanical stress.
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Submitted 5 August, 2015; v1 submitted 27 July, 2015;
originally announced July 2015.
