Explainable Graph-based Search for Lessons-Learned Documents in the Semiconductor Industry
Authors:
Hasan Abu-Rasheed,
Christian Weber,
Johannes Zenkert,
Roland Krumm,
Madjid Fathi
Abstract:
Industrial processes produce a considerable volume of data and thus information. Whether it is structured sensory data or semi- to unstructured textual data, the knowledge that can be derived from it is critical to the sustainable development of the industrial process. A key challenge of this sustainability is the intelligent management of the generated data, as well as the knowledge extracted fro…
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Industrial processes produce a considerable volume of data and thus information. Whether it is structured sensory data or semi- to unstructured textual data, the knowledge that can be derived from it is critical to the sustainable development of the industrial process. A key challenge of this sustainability is the intelligent management of the generated data, as well as the knowledge extracted from it, in order to utilize this knowledge for improving future procedures. This challenge is a result of the tailored documentation methods and domain-specific requirements, which include the need for quick visibility of the documented knowledge. In this paper, we utilize the expert knowledge documented in chip-design failure reports in supporting user access to information that is relevant to a current chip design. Unstructured, free, textual data in previous failure documentations provides a valuable source of lessons-learned, which expert design-engineers have experienced, solved and documented. To achieve a sustainable utilization of knowledge within the company, not only the inherent knowledge has to be mined from unstructured textual data, but also the relations between the lessons-learned, uncovering potentially unknown links. In this research, a knowledge graph is constructed, in order to represent and use the interconnections between reported design failures. A search engine is developed and applied onto the graph to answer queries. In contrast to mere keyword-based searching, the searchability of the knowledge graph offers enhanced search results beyond direct matches and acts as a mean for generating explainable results and result recommendations. Results are provided to the design engineer through an interactive search interface, in which, the feedback from the user is used to further optimize relations for future iterations of the knowledge graph.
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Submitted 20 June, 2021; v1 submitted 18 May, 2021;
originally announced May 2021.
A Text Extraction-Based Smart Knowledge Graph Composition for Integrating Lessons Learned during the Microchip Design
Authors:
H. Abu-Rasheed,
C. Weber,
J. Zenkert,
P. Czerner,
R. Krumm,
M. Fathi
Abstract:
The production of microchips is a complex and thus well documented process. Therefore, available textual data about the production can be overwhelming in terms of quantity. This affects the visibility and retrieval of a certain piece of information when it is most needed. In this paper, we propose a dynamic approach to interlink the information extracted from multisource production-relevant docume…
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The production of microchips is a complex and thus well documented process. Therefore, available textual data about the production can be overwhelming in terms of quantity. This affects the visibility and retrieval of a certain piece of information when it is most needed. In this paper, we propose a dynamic approach to interlink the information extracted from multisource production-relevant documents through the creation of a knowledge graph. This graph is constructed in order to support searchability and enhance user's access to large-scale production information. Text mining methods are firstly utilized to extract data from multiple documentation sources. Document relations are then mined and extracted for the composition of the knowledge graph. Graph search functionality is then supported with a recommendation use-case to enhance users' access to information that is related to the initial documents. The proposed approach is tailored to and tested on microchip design-relevant documents. It enhances the visibility and findability of previous design-failure-cases during the process of a new chip design.
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Submitted 11 May, 2021;
originally announced May 2021.
