Effects of resonances and surface texturing on light emission in emerging thin-film devices
Authors:
Pyry Kivisaari,
Mikko Partanen,
Jani Oksanen
Abstract:
Recent developments in thin-film fabrication and processing open up interesting possibilities for both established and emerging optics technologies. There, one of the key questions requiring more complete understanding is by how much one can improve the performance of thin-film devices by utilizing resonance effects and surface texturation. In this work, we report on our recent theoretical investi…
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Recent developments in thin-film fabrication and processing open up interesting possibilities for both established and emerging optics technologies. There, one of the key questions requiring more complete understanding is by how much one can improve the performance of thin-film devices by utilizing resonance effects and surface texturation. In this work, we report on our recent theoretical investigations around two aspects of this question: (1) how much the overall (=angle and energy-integrated) emission of extremely thin ($\sim10$ nm) layers can be enhanced through cavity effects, and (2) how much resonances affect the emission of moderately thin ($>100$ nm) layers in a typical device interacting with free space (in this case an ultra-thin solar cell). Beginning with topic (1), we find that the total emission of active layers with thicknesses $<50$ nm in particular can be boosted through resonant effects by placing them in a cavity. For topic (2), the results indicate that a radiative transfer approach (i.e., one not accounting for resonant effects) can give very accurate predictions of the total emission of moderately thin layers in a thin-film device, as long as the reflectances of the device's outer boundaries are known, and the emitting layer is not very close to optical elements supporting direct evanescent coupling (such as metal mirrors). Finally, we demonstrate that extending the self-consistent radiative transfer--drift-diffusion approach for diffusive scattering presents an interesting tool to optimize thin-film devices even with textured surfaces.
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Submitted 2 January, 2025; v1 submitted 10 January, 2024;
originally announced January 2024.
Interplay of photons and charge carriers in thin-film devices
Authors:
Pyry Kivisaari,
Mikko Partanen,
Toufik Sadi,
Jani Oksanen
Abstract:
Thin films are gaining ground in photonics and optoelectronics, promising improvements in their efficiency and functionality as well as decreased material usage as compared to bulk technologies. However, proliferation of thin films would benefit not only from continuous improvements in their fabrication, but also from a unified and accurate theoretical framework of the interplay of photons and cha…
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Thin films are gaining ground in photonics and optoelectronics, promising improvements in their efficiency and functionality as well as decreased material usage as compared to bulk technologies. However, proliferation of thin films would benefit not only from continuous improvements in their fabrication, but also from a unified and accurate theoretical framework of the interplay of photons and charge carriers. In particular, such a framework would need to account quantitatively and self-consistently for photon recycling and interference effects. To this end, here we combine the drift-diffusion formalism of charge carrier dynamics and the fluctuational electrodynamics of photon transport self-consistently using the recently introduced interference-extended radiative transfer equations. The resulting equation system can be solved numerically using standard simulation tools, and as an example, here we apply it to study well-known GaAs thin-film solar cells. In addition to obtaining the expected device characteristics, we analyze the underlying complex photon transport and recombination-generation processes, demonstrating the physical insight provided for unevenly excited structures through the direct and self-consistent description of photons and charge carriers. The methodology proposed in this work is general and can be used to obtain accurate physical insight into a wide range of planar optoelectronic devices, of which the thin-film single-junction solar cells studied here are only one example.
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Submitted 11 November, 2021; v1 submitted 25 February, 2021;
originally announced February 2021.
