Computing virtual dark-field X-ray microscopy images of complex discrete dislocation structures from large-scale molecular dynamics simulations
Authors:
Yifan Wang,
Nicolas Bertin,
Dayeeta Pal,
Sara J. Irvine,
Kento Katagiri,
Robert E. Rudd,
Leora E. Dresselhaus-Marais
Abstract:
Dark-field X-ray Microscopy (DFXM) is a novel diffraction-based imaging technique that non-destructively maps the local deformation from crystalline defects in bulk materials. While studies have demonstrated that DFXM can spatially map 3D defect geometries, it is still challenging to interpret DFXM images of the high dislocation density systems relevant to macroscopic crystal plasticity. This work…
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Dark-field X-ray Microscopy (DFXM) is a novel diffraction-based imaging technique that non-destructively maps the local deformation from crystalline defects in bulk materials. While studies have demonstrated that DFXM can spatially map 3D defect geometries, it is still challenging to interpret DFXM images of the high dislocation density systems relevant to macroscopic crystal plasticity. This work develops a scalable forward model to calculate virtual DFXM images for complex discrete dislocation (DD) structures obtained from atomistic simulations. Our new DD-DFXM model integrates a non-singular formulation for calculating the local strain from the DD structures and an efficient geometrical optics algorithm for computing the DFXM image from the strain. We apply the model to complex DD structures obtained from a large-scale molecular dynamics (MD) simulation of compressive loading on a single-crystal silicon. Simulated DFXM images exhibit prominent feature contrast for dislocations between the multiple slip systems, demonstrating the DFXM's potential to resolve features from dislocation multiplication. The integrated DD-DFXM model provides a toolbox for DFXM experimental design and image interpretation in the context of bulk crystal plasticity for the breadth of measurements across shock plasticity and the broader materials science community.
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Submitted 20 September, 2024; v1 submitted 2 September, 2024;
originally announced September 2024.
Dark-Field X-ray Microscopy for 2D and 3D imaging of Microstructural Dynamics at the European X-ray Free Electron Laser
Authors:
Sara J. Irvine,
Kento Katagiri,
Trygve M. Ræder,
Ulrike Boesenberg,
Darshan Chalise,
Jade I. Stanton,
Dayeeta Pal,
Jörg Hallmann,
Gabriele Ansaldi,
Felix Brauße,
Jon H. Eggert,
Lichao Fang,
Eric Folsom,
Morten Haubro,
Theodor S. Holstad,
Anders Madsen,
Johannes Möller,
Martin M. Nielsen,
Henning F. Poulsen,
Jan-Etienne Pudell,
Angel Rodriguez-Fernandez,
Frank Schoofs,
Frank Seiboth,
Yifan Wang,
Wonhyuk Jo
, et al. (4 additional authors not shown)
Abstract:
Dark field X-ray microscopy (DXFM) can visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve sub-μm spatial resolution and <100 fs time resolution simultaneously. In this paper, we demonstrate ultrafast DFXM measurements at the European XFEL to visualize an optically-driven longitudinal strain wav…
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Dark field X-ray microscopy (DXFM) can visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve sub-μm spatial resolution and <100 fs time resolution simultaneously. In this paper, we demonstrate ultrafast DFXM measurements at the European XFEL to visualize an optically-driven longitudinal strain wave propagating through a diamond single crystal. We also present two DFXM scanning modalities that are new to the XFEL sources: spatially 3D and 2D axial-strain scans with sub-μm spatial resolution. With this progress in XFEL-based DFXM, we discuss new opportunities to study multi-timescale spatio-temporal dynamics of microstructures.
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Submitted 18 September, 2024; v1 submitted 7 November, 2023;
originally announced November 2023.
