Main-Belt Asteroids in the K2 Engineering Field of View
Authors:
R. Szabó,
K. Sárneczky,
Gy. M. Szabó,
A. Pál,
Cs. P. Kiss,
B. Csák,
L. Illés,
G. Rácz,
L. L. Kiss
Abstract:
Unlike NASA's original Kepler Discovery Mission, the renewed K2 Mission will stare at the plane of the Ecliptic, observing each field for approximately 75 days. This will bring new opportunities and challenges, in particular the presence of a large number of main-belt asteroids that will contaminate the photometry. The large pixel size makes K2 data susceptible to the effect of apparent minor plan…
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Unlike NASA's original Kepler Discovery Mission, the renewed K2 Mission will stare at the plane of the Ecliptic, observing each field for approximately 75 days. This will bring new opportunities and challenges, in particular the presence of a large number of main-belt asteroids that will contaminate the photometry. The large pixel size makes K2 data susceptible to the effect of apparent minor planet encounters. Here we investigate the effects of asteroid encounters on photometric precision using a sub-sample of the K2 Engineering data taken in February, 2014. We show examples of asteroid contamination to facilitate their recognition and distinguish these events from other error sources. We conclude that main-belt asteroids will have considerable effects on K2 photometry of a large number of photometric targets during the Mission, that will have to be taken into account. These results will be readily applicable for future space photometric missions applying large-format CCDs, such as TESS and PLATO.
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Submitted 23 January, 2015;
originally announced January 2015.
Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration
Authors:
T. Lohner,
E. Agócs,
P. Petrik,
Z. Zolnai,
E. Szilágyi,
I. Kovács,
Z. Szőkefalvi-Nagy,
L. Tóth,
A. L. Tóth,
L. Illés,
I. Bársony
Abstract:
In this work recently produced and commercially available glazed ceramic object with metallic lustre decoration was studied by using a spectroscopic ellipsometer with rotating compensator. The thickness and metal content of the surface lustre layers are determined by ion beam analytical techniques, i.e., Rutherford backscattering spectrometry and external beam particle-induced X-ray emission and t…
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In this work recently produced and commercially available glazed ceramic object with metallic lustre decoration was studied by using a spectroscopic ellipsometer with rotating compensator. The thickness and metal content of the surface lustre layers are determined by ion beam analytical techniques, i.e., Rutherford backscattering spectrometry and external beam particle-induced X-ray emission and the results were utilized in the construction of multilayer optical models for the evaluation and interpretation of the spectroellipsometric measurements.
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Submitted 13 October, 2014;
originally announced October 2014.
