Silicon microcavity arrays with open access and a finesse of half a million
Authors:
G. Wachter,
S. Kuhn,
S. Minniberger,
C. Salter,
P. Asenbaum,
J. Millen,
M. Schneider,
J. Schalko,
U. Schmid,
A. Felgner,
D. Hüser,
M. Arndt,
M. Trupke
Abstract:
Optical resonators are increasingly important tools in science and technology. Their applications range from laser physics, atomic clocks, molecular spectroscopy, and single-photon generation to the detection, trapping and cooling of atoms or nano-scale objects. Many of these applications benefit from strong mode confinement and high optical quality factors, making small mirrors of high surface-qu…
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Optical resonators are increasingly important tools in science and technology. Their applications range from laser physics, atomic clocks, molecular spectroscopy, and single-photon generation to the detection, trapping and cooling of atoms or nano-scale objects. Many of these applications benefit from strong mode confinement and high optical quality factors, making small mirrors of high surface-quality desirable. Building such devices in silicon yields ultra-low absorption at telecom wavelengths and enables integration of micro-structures with mechanical, electrical and other functionalities. Here, we push optical resonator technology to new limits by fabricating lithographically aligned silicon mirrors with ultra-smooth surfaces, small and wellcontrolled radii of curvature, ultra-low loss and high reflectivity. We build large arrays of microcavities with finesse greater than F = 500,000 and a mode volume of 330 femtoliters at wavelengths near 1550 nm. Such high-quality micro-mirrors open up a new regime of optics and enable unprecedented explorations of strong coupling between light and matter.
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Submitted 16 January, 2019;
originally announced April 2019.
Procedure to Approximately Estimate the Uncertainty of Material Ratio Parameters due to Inhomogeneity of Surface Roughness
Authors:
Dorothee Hüser,
Jonathan Hüser,
Sebastian Rief,
Jörg Seewig,
Peter Thomsen-Schmidt
Abstract:
Roughness parameters that characterize contacting surfaces with regard to friction and wear are commonly stated without uncertainties, or with an uncertainty only taking into account a very limited amount of aspects such as repeatability of reproducibility (homogeneity) of the specimen. This makes it difficult to discriminate between different values of single roughness parameters.
Therefore unc…
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Roughness parameters that characterize contacting surfaces with regard to friction and wear are commonly stated without uncertainties, or with an uncertainty only taking into account a very limited amount of aspects such as repeatability of reproducibility (homogeneity) of the specimen. This makes it difficult to discriminate between different values of single roughness parameters.
Therefore uncertainty assessment methods are required that take all relevant aspects into account. In the literature this is scarcely performed and examples specific for parameters used in friction and wear are not yet given.
We propose a procedure to derive the uncertainty from a single profile employing a statistical method that is based on the statistical moments of the amplitude distribution and the autocorrelation length of the profile. To show the possibilities and the limitations of this method we compare the uncertainty derived from a single profile with that derived from a high statistics experiment.
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Submitted 9 April, 2016; v1 submitted 2 March, 2016;
originally announced March 2016.
