Effects of Proton Irradiation on 60 GHz CMOS Transceiver Chip for Multi-Gbps Communication in High-Energy Physics Experiments
Authors:
Imran Aziz,
Dragos Dancila,
Sebastian Dittmeier,
Alexandre Siligaris,
Cedric Dehos,
Patrick M. De Lurgio,
Zelimir Djurcic,
Gary Drake,
Jose Luis G. Jimenez,
Leif Gustaffson,
Do-Won Kim,
Elizabeth Locci,
Ulrich Pfeiffer,
Pedro Rodriquez Vazquez,
Dieter Röhrich,
Andre Schöning,
Hans K. Soltveit,
Kjetil Ullaland,
Pierre Vincent,
Shiming Yang,
Richard Brenner
Abstract:
This paper presents the experimental results of $17~MeV$ proton irradiation on a $60~GHz$ low power, half-duplex transceiver (TRX) chip implemented in $65~nm$ CMOS technology. It supports short range point-to-point data rate up to $6~Gbps$ by employing on-off keying (OOK). To investigate the irradiation hardness for high energy physics applications, two TRX chips were irradiated with total ionizin…
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This paper presents the experimental results of $17~MeV$ proton irradiation on a $60~GHz$ low power, half-duplex transceiver (TRX) chip implemented in $65~nm$ CMOS technology. It supports short range point-to-point data rate up to $6~Gbps$ by employing on-off keying (OOK). To investigate the irradiation hardness for high energy physics applications, two TRX chips were irradiated with total ionizing doses (TID) of $74~kGy$ and $42~kGy$ and fluence of $1.4~\times$10$^{14}~ N_{eq}/cm^2$ and $0.8~\times$10$^{14}~N_{eq}/cm^2$ for RX and TX modes, respectively. The chips were characterized by pre- and post-irradiation analogue voltage measurements on different circuit blocks as well as through the analysis of wireless transmission parameters like bit error rate (BER), eye diagram, jitter etc. Post-irradiation measurements have shown certain reduction in performance but both TRX chips have been found operational through over the air measurements at $5~Gbps$. Moreover, very small shift in the carrier frequency was observed after the irradiation.
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Submitted 12 June, 2019; v1 submitted 28 October, 2018;
originally announced October 2018.
