Showing 1–2 of 2 results for author: Fodor, P S
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320-Channel Dual Phase Lock-in Optical Spectrometer
Authors:
P. S. Fodor,
S. Rothenberger,
J. Levy
Abstract:
The development of a multiple-channel lock-in optical spectrometer (LIOS) is presented, which enables parallel phase-sensitive detection at the output of an optical spectrometer. The light intensity from a spectrally broad source is modulated at the reference frequency, and focused into a high-resolution imaging spectrometer. The height at which the light enters the spectrometer is controlled by…
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The development of a multiple-channel lock-in optical spectrometer (LIOS) is presented, which enables parallel phase-sensitive detection at the output of an optical spectrometer. The light intensity from a spectrally broad source is modulated at the reference frequency, and focused into a high-resolution imaging spectrometer. The height at which the light enters the spectrometer is controlled by an acousto-optic deflector, and the height information is preserved at the output focal plane. A two-dimensional InGaAs focal plane array collects light that has been dispersed in wavelength along the horizontal direction, and in time along the vertical direction. The data is demodulated using a high performance computer-based digital signal processor. This parallel approach greatly enhances (by more than 100x) the speed at which spectrally resolved lock-in data can be acquired. The noise performance of a working system optimized for the 1300 nm wavelength range is analyzed using a laser diode light source. Time-resolved absorption traces are obtained for InAs quantum dots embedded in a GaAs matrix, and for dispersed films of PbSe nanocrystals.
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Submitted 4 May, 2004;
originally announced May 2004.
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Variable - temperature scanning optical and force microscope
Authors:
P. S. Fodor,
H. Zhu,
N. G. Patil,
J. Levy
Abstract:
The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional helium flow cryostats. In AFM mode, the distance between the sample and an etched tungsten tip is controlled by a self - sensing piezoelectric tuning fork. The…
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The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional helium flow cryostats. In AFM mode, the distance between the sample and an etched tungsten tip is controlled by a self - sensing piezoelectric tuning fork. The vertical position of both the AFM head and microscope objective can be accurately controlled using piezoelectric coarse approach motors. The scanning is performed using a compact XYZ stage, while the AFM and optical head are kept fixed, allowing scanning probe and optical measurements to be acquired simultaneously and in concert. The free optical axis of the microscope enables both reflection and transmission experiments to be performed.
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Submitted 6 March, 2004;
originally announced March 2004.
