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Locating the Atoms at the Hard-soft Interface of Gold Nanoparticles
Authors:
Weilun Li,
Bryan D. Esser,
Wenming Tong,
Anchal Yadav,
Colin Ophus,
Changlin Zheng,
Scott D. Findlay,
Timothy Petersen,
Alison M. Funston,
Joanne Etheridge
Abstract:
Surface structure affects the growth, shape and properties of nanoparticles. In wet chemical syntheses, metal additives and surfactants are used to modify surfaces and guide nanocrystal growth. To understand this process, it is critical to understand how the surface structure is modified. However, measuring the type and arrangement of atoms at hard-soft interfaces on nanoscale surfaces, especially…
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Surface structure affects the growth, shape and properties of nanoparticles. In wet chemical syntheses, metal additives and surfactants are used to modify surfaces and guide nanocrystal growth. To understand this process, it is critical to understand how the surface structure is modified. However, measuring the type and arrangement of atoms at hard-soft interfaces on nanoscale surfaces, especially in the presence of surfactants, is extremely challenging. Here, we determine the atomic structure of the hard-soft interface in a metallic nanoparticle by developing low-dose imaging conditions in four-dimensional scanning transmission electron microscopy that are preferentially sensitive to surface adatoms. By revealing experimentally the copper additives and bromide surfactant counterion at the surface of a gold nanocuboid and quantifying their interatomic distances, our direct, low-dose imaging method provides atomic-level understanding of chemically sophisticated nanomaterial surface structures. These measurements of the atomic structure of the hard-soft interface provide the information necessary to understand and quantify surface chemistries and energies and their pivotal role in nanocrystal growth.
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Submitted 13 March, 2025;
originally announced March 2025.
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Towards atom counting from first moment STEM images: methodology and possibilities
Authors:
Yansong Hao,
Annick De Backer,
Scott David Findlay,
Sandra Van Aert
Abstract:
Through a simulation-based study we develop a statistical model-based quantification method for atomic resolution first moment scanning transmission electron microscopy (STEM) images. This method uses the uniformly weighted least squares estimator to determine the unknown structure parameters of the images and to isolate contributions from individual atomic columns. In this way, a quantification o…
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Through a simulation-based study we develop a statistical model-based quantification method for atomic resolution first moment scanning transmission electron microscopy (STEM) images. This method uses the uniformly weighted least squares estimator to determine the unknown structure parameters of the images and to isolate contributions from individual atomic columns. In this way, a quantification of the projected potential per atomic column is achieved. Since the integrated projected potential of an atomic column scales linearly with the number of atoms it contains, it can serve as a basis for atom counting. The performance of atom counting from first moment STEM imaging is compared to that from traditional HAADF STEM in the presence of noise. Through this comparison, we demonstrate the advantage of first moment STEM images to attain more precise atom counts. Finally, we compare the integrated intensities extracted from first-moment images of a wedge-shaped sample to those values from the bulk crystal. The excellent agreement found between these values proves the robustness of using bulk crystal simulations as a reference library. This enables atom counting for samples with different shapes by comparison with these library values.
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Submitted 5 August, 2024;
originally announced August 2024.
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Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements
Authors:
Marcel Schloz,
Thomas C. Pekin,
Hamish G. Brown,
Dana O. Byrne,
Bryan D. Esser,
Emmanuel Terzoudis-Lumsden,
Takashi Taniguchi,
Kenji Watanabe,
Scott D. Findlay,
Benedikt Haas,
Jim Ciston,
Christoph T. Koch
Abstract:
A detailed analysis of ptychography for 3D phase reconstructions of thick specimens is performed. We introduce multi-focus ptychography, which incorporates a 4D-STEM defocus series to enhance the quality of 3D reconstructions along the beam direction through a higher overdetermination ratio. This method is compared with established multi-slice ptychography techniques, such as conventional ptychogr…
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A detailed analysis of ptychography for 3D phase reconstructions of thick specimens is performed. We introduce multi-focus ptychography, which incorporates a 4D-STEM defocus series to enhance the quality of 3D reconstructions along the beam direction through a higher overdetermination ratio. This method is compared with established multi-slice ptychography techniques, such as conventional ptychography, regularized ptychography, and multi-mode ptychography. Additionally, we contrast multi-focus ptychography with an alternative method that uses virtual optical sectioning through a reconstructed scattering matrix ($\mathcal{S}$-matrix), which offers more precise 3D structure information compared to conventional ptychography. Our findings from multiple 3D reconstructions based on simulated and experimental data demonstrate that multi-focus ptychography surpasses other techniques, particularly in accurately reconstructing the surfaces and interface regions of thick specimens.
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Submitted 3 June, 2024;
originally announced June 2024.
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Differential phase contrast from electrons that cause inner shell ionization
Authors:
Michael Deimetry,
Timothy C. Petersen,
Hamish G. Brown,
Matthew Weyland,
Scott D. Findlay
Abstract:
Differential Phase Contrast (DPC) imaging, in which deviations in the bright field beam are in proportion to the electric field, has been extensively studied in the context of pure elastic scattering. Here we discuss differential phase contrast formed from core-loss scattered electrons, i.e. those that have caused inner shell ionization of atoms in the specimen, using a transition potential approa…
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Differential Phase Contrast (DPC) imaging, in which deviations in the bright field beam are in proportion to the electric field, has been extensively studied in the context of pure elastic scattering. Here we discuss differential phase contrast formed from core-loss scattered electrons, i.e. those that have caused inner shell ionization of atoms in the specimen, using a transition potential approach for which we study the number of final states needed for a converged calculation. In the phase object approximation, we show formally that differential phase contrast formed from core-loss scattered electrons is mainly a result of preservation of elastic contrast. Through simulation we demonstrate that whether the inelastic DPC images show element selective contrast depends on the spatial range of the ionization interaction, and specifically that when the energy loss is low the delocalisation can lead to contributions to the contrast from atoms other than that ionized. We further show that inelastic DPC images remain robustly interpretable to larger thicknesses than is the case for elastic DPC images, owing to the incoherence of the inelastic wavefields, though subtleties due to channelling remain. Lastly, we show that while a very high dose will be needed for sufficient counting statistics to discern differential phase contrast from core-loss scattered electrons, there is some enhancement of signal-to-noise ratio with thickness that makes inelastic DPC imaging more achievable for thicker samples.
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Submitted 18 August, 2024; v1 submitted 14 May, 2024;
originally announced May 2024.
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Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detector
Authors:
T. Mawson,
D. J. Taplin,
H. G. Brown,
L. Clark,
R. Ishikawa,
T. Seki,
Y. Ikuhara,
N. Shibata,
D. M. Paganin,
M. J. Morgan,
M. Weyland,
T. C. Petersen,
S. D. Findlay
Abstract:
Quantitative differential phase contrast imaging of materials in atomic-resolution scanning transmission electron microscopy using segmented detectors is limited by various factors, including coherent and incoherent aberrations, detector positioning and uniformity, and scan-distortion. By comparing experimental case studies of monolayer and few-layer graphene with image simulations, we explore whi…
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Quantitative differential phase contrast imaging of materials in atomic-resolution scanning transmission electron microscopy using segmented detectors is limited by various factors, including coherent and incoherent aberrations, detector positioning and uniformity, and scan-distortion. By comparing experimental case studies of monolayer and few-layer graphene with image simulations, we explore which parameters require the most precise characterisation for reliable and quantitative interpretation of the reconstructed phases. Coherent and incoherent lens aberrations are found to have the most significant impact. For images over a large field of view, the impact of noise and non-periodic boundary conditions are appreciable, but in this case study have less of an impact than artefacts introduced by beam deflections coupling to beam scanning (imperfect tilt-shift purity).
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Submitted 19 August, 2021;
originally announced August 2021.
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A single-projection three-dimensional reconstruction algorithm for scanning transmission electron microscopy data
Authors:
Hamish G. Brown,
Philipp M. Pelz,
Shang-Lin Hsu,
Zimeng Zhang,
Ramamoorthy Ramesh,
Katherine Inzani,
Evan Sheridan,
Sinéad M. Griffin,
Marcel Schloz,
Thomas C. Pekin,
Christoph T. Koch,
Scott D. Findlay,
Leslie J. Allen,
Mary C. Scott,
Colin Ophus,
Jim Ciston
Abstract:
Increasing interest in three-dimensional nanostructures adds impetus to electron microscopy techniques capable of imaging at or below the nanoscale in three dimensions. We present a reconstruction algorithm that takes as input a focal series of four-dimensional scanning transmission electron microscopy (4D-STEM) data. We apply the approach to a lead iridate, Pb$_2$Ir$_2$O$_7$, and yttrium-stabiliz…
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Increasing interest in three-dimensional nanostructures adds impetus to electron microscopy techniques capable of imaging at or below the nanoscale in three dimensions. We present a reconstruction algorithm that takes as input a focal series of four-dimensional scanning transmission electron microscopy (4D-STEM) data. We apply the approach to a lead iridate, Pb$_2$Ir$_2$O$_7$, and yttrium-stabilized zirconia,Y$_{0.095}$Zr$_{0.905}$O$_2$ , heterostructure from data acquired with the specimen in a single plan-view orientation, with the epitaxial layers stacked along the beam direction. We demonstrate that Pb-Ir atomic columns are visible in the uppermost layers of the reconstructed volume. We compare this approach to the alternative techniques of depth sectioning using differential phase contrast scanning transmission electron microscopy (DPC-STEM) and multislice ptychographic reconstruction.
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Submitted 16 February, 2022; v1 submitted 15 November, 2020;
originally announced November 2020.
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Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone
Authors:
Philipp M Pelz,
Hamish G Brown,
Jim Ciston,
Scott D Findlay,
Yaqian Zhang,
Mary Scott,
Colin Ophus
Abstract:
Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailability of wavefront shaping optics, and the highly nonlinear inversion required from intensity-only measurements. In this work, we present a new algorithm using the scattering matrix formalism to solve the scattering from a…
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Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailability of wavefront shaping optics, and the highly nonlinear inversion required from intensity-only measurements. In this work, we present a new algorithm using the scattering matrix formalism to solve the scattering from a non-crystalline medium from scanning diffraction measurements, and recover the illumination aberrations. Our method will enable 3D imaging and materials characterization at high resolution for a wide range of materials.
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Submitted 28 August, 2020;
originally announced August 2020.
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Suppressing dynamical diffraction artefacts in differential phase contrast scanning transmission electron microscopy of long-range electromagnetic fields via precession
Authors:
T. Mawson,
A. Nakamura,
T. C. Petersen,
N. Shibata,
H. Sasaki,
D. M. Paganin,
M. J. Morgan,
S. D. Findlay
Abstract:
In differential phase contrast scanning transmission electron microscopy (DPC-STEM), variability in dynamical diffraction resulting from changes in sample thickness and local crystal orientation (due to sample bending) can produce contrast comparable to that arising from the long-range electromagnetic fields probed by this technique. Through simulation we explore the scale of these dynamical diffr…
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In differential phase contrast scanning transmission electron microscopy (DPC-STEM), variability in dynamical diffraction resulting from changes in sample thickness and local crystal orientation (due to sample bending) can produce contrast comparable to that arising from the long-range electromagnetic fields probed by this technique. Through simulation we explore the scale of these dynamical diffraction artefacts and introduce a metric for the magnitude of their confounding contribution to the contrast. We show that precession over an angular range of a few milliradian can suppress this confounding contrast by one-to-two orders of magnitude. Our exploration centres around a case study of GaAs near the [011] zone-axis orientation using a probe-forming aperture semiangle on the order of 0.1 mrad at 300 keV, but the trends found and methodology used are expected to apply more generally.
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Submitted 4 February, 2020;
originally announced February 2020.
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Structure retrieval at atomic resolution in the presence of multiple scattering of the electron probe
Authors:
Hamish G. Brown,
Zhen Chen,
Matthew Weyland,
Colin Ophus,
Jim Ciston,
Les J. Allen,
Scott D. Findlay
Abstract:
The projected electrostatic potential of a thick crystal is reconstructed at atomic-resolution from experimental scanning transmission electron microscopy data recorded using a new generation fast- readout electron camera. This practical and deterministic inversion of the equations encapsulating multiple scattering that were written down by Bethe in 1928 removes the restriction of established meth…
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The projected electrostatic potential of a thick crystal is reconstructed at atomic-resolution from experimental scanning transmission electron microscopy data recorded using a new generation fast- readout electron camera. This practical and deterministic inversion of the equations encapsulating multiple scattering that were written down by Bethe in 1928 removes the restriction of established methods to ultrathin ($\lesssim 50$ Å) samples. Instruments already coming on-line can overcome the remaining resolution-limiting effects in this method due to finite probe-forming aperture size, spatial incoherence and residual lens aberrations.
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Submitted 26 September, 2018;
originally announced September 2018.
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Probing the limits of the rigid-intensity-shift model in differential phase contrast scanning transmission electron microscopy
Authors:
L. Clark,
H. G. Brown,
D. M. Paganin,
M. J. Morgan,
T. Matsumoto,
N. Shibata,
T. C. Petersen,
S. D. Findlay
Abstract:
The rigid-intensity-shift model of differential phase contrast scanning transmission electron microscopy (DPC-STEM) imaging assumes that the phase gradient imposed on the probe by the sample causes the diffraction pattern intensity to shift rigidly by an amount proportional to that phase gradient. This behaviour is seldom realised exactly in practice. Through a combination of experimental results,…
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The rigid-intensity-shift model of differential phase contrast scanning transmission electron microscopy (DPC-STEM) imaging assumes that the phase gradient imposed on the probe by the sample causes the diffraction pattern intensity to shift rigidly by an amount proportional to that phase gradient. This behaviour is seldom realised exactly in practice. Through a combination of experimental results, analytical modelling and numerical calculations, we explore the breakdown of the rigid-intensity-shift behaviour and how this depends on the magnitude of the phase gradient and the relative scale of features in the phase profile and the probe size. We present guidelines as to when the rigid-intensity-shift model can be applied for quantitative phase reconstruction using segmented detectors, and propose probe-shaping strategies to further improve the accuracy.
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Submitted 18 January, 2018;
originally announced January 2018.
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Spectroscopic imaging of single atoms within a bulk solid
Authors:
M. Varela,
S. D. Findlay,
A. R. Lupini,
H. M. Christen,
A. Y. Borisevich,
N. Dellby,
O. L. Krivanek,
P. D. Nellist,
M. P. Oxley,
L. J. Allen,
S. J. Pennycook,
.
Abstract:
The ability to localize, identify and measure the electronic environment of individual atoms will provide fundamental insights into many issues in materials science, physics and nanotechnology. We demonstrate, using an aberration-corrected scanning transmission microscope, the spectroscopic imaging of single La atoms inside CaTiO3. Dynamical simulations confirm that the spectroscopic information…
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The ability to localize, identify and measure the electronic environment of individual atoms will provide fundamental insights into many issues in materials science, physics and nanotechnology. We demonstrate, using an aberration-corrected scanning transmission microscope, the spectroscopic imaging of single La atoms inside CaTiO3. Dynamical simulations confirm that the spectroscopic information is spatially confined around the scattering atom. Furthermore we show how the depth of the atom within the crystal may be estimated.
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Submitted 28 January, 2004; v1 submitted 9 January, 2004;
originally announced January 2004.
