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Showing 1–11 of 11 results for author: Findlay, S D

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  1. arXiv:2503.10059  [pdf

    cond-mat.mtrl-sci cond-mat.mes-hall

    Locating the Atoms at the Hard-soft Interface of Gold Nanoparticles

    Authors: Weilun Li, Bryan D. Esser, Wenming Tong, Anchal Yadav, Colin Ophus, Changlin Zheng, Scott D. Findlay, Timothy Petersen, Alison M. Funston, Joanne Etheridge

    Abstract: Surface structure affects the growth, shape and properties of nanoparticles. In wet chemical syntheses, metal additives and surfactants are used to modify surfaces and guide nanocrystal growth. To understand this process, it is critical to understand how the surface structure is modified. However, measuring the type and arrangement of atoms at hard-soft interfaces on nanoscale surfaces, especially… ▽ More

    Submitted 13 March, 2025; originally announced March 2025.

  2. arXiv:2408.02405  [pdf

    cond-mat.mtrl-sci physics.app-ph

    Towards atom counting from first moment STEM images: methodology and possibilities

    Authors: Yansong Hao, Annick De Backer, Scott David Findlay, Sandra Van Aert

    Abstract: Through a simulation-based study we develop a statistical model-based quantification method for atomic resolution first moment scanning transmission electron microscopy (STEM) images. This method uses the uniformly weighted least squares estimator to determine the unknown structure parameters of the images and to isolate contributions from individual atomic columns. In this way, a quantification o… ▽ More

    Submitted 5 August, 2024; originally announced August 2024.

    Comments: 31 pages in total (Supporting info added at the end of manuscript)

  3. arXiv:2406.01141  [pdf, other

    physics.optics cond-mat.mtrl-sci physics.comp-ph

    Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements

    Authors: Marcel Schloz, Thomas C. Pekin, Hamish G. Brown, Dana O. Byrne, Bryan D. Esser, Emmanuel Terzoudis-Lumsden, Takashi Taniguchi, Kenji Watanabe, Scott D. Findlay, Benedikt Haas, Jim Ciston, Christoph T. Koch

    Abstract: A detailed analysis of ptychography for 3D phase reconstructions of thick specimens is performed. We introduce multi-focus ptychography, which incorporates a 4D-STEM defocus series to enhance the quality of 3D reconstructions along the beam direction through a higher overdetermination ratio. This method is compared with established multi-slice ptychography techniques, such as conventional ptychogr… ▽ More

    Submitted 3 June, 2024; originally announced June 2024.

  4. Differential phase contrast from electrons that cause inner shell ionization

    Authors: Michael Deimetry, Timothy C. Petersen, Hamish G. Brown, Matthew Weyland, Scott D. Findlay

    Abstract: Differential Phase Contrast (DPC) imaging, in which deviations in the bright field beam are in proportion to the electric field, has been extensively studied in the context of pure elastic scattering. Here we discuss differential phase contrast formed from core-loss scattered electrons, i.e. those that have caused inner shell ionization of atoms in the specimen, using a transition potential approa… ▽ More

    Submitted 18 August, 2024; v1 submitted 14 May, 2024; originally announced May 2024.

  5. Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detector

    Authors: T. Mawson, D. J. Taplin, H. G. Brown, L. Clark, R. Ishikawa, T. Seki, Y. Ikuhara, N. Shibata, D. M. Paganin, M. J. Morgan, M. Weyland, T. C. Petersen, S. D. Findlay

    Abstract: Quantitative differential phase contrast imaging of materials in atomic-resolution scanning transmission electron microscopy using segmented detectors is limited by various factors, including coherent and incoherent aberrations, detector positioning and uniformity, and scan-distortion. By comparing experimental case studies of monolayer and few-layer graphene with image simulations, we explore whi… ▽ More

    Submitted 19 August, 2021; originally announced August 2021.

    Comments: 16 pages, 9 figures

    Journal ref: Ultramicroscopy 233 (2022) 113457

  6. arXiv:2011.07652  [pdf, other

    cond-mat.mtrl-sci

    A single-projection three-dimensional reconstruction algorithm for scanning transmission electron microscopy data

    Authors: Hamish G. Brown, Philipp M. Pelz, Shang-Lin Hsu, Zimeng Zhang, Ramamoorthy Ramesh, Katherine Inzani, Evan Sheridan, Sinéad M. Griffin, Marcel Schloz, Thomas C. Pekin, Christoph T. Koch, Scott D. Findlay, Leslie J. Allen, Mary C. Scott, Colin Ophus, Jim Ciston

    Abstract: Increasing interest in three-dimensional nanostructures adds impetus to electron microscopy techniques capable of imaging at or below the nanoscale in three dimensions. We present a reconstruction algorithm that takes as input a focal series of four-dimensional scanning transmission electron microscopy (4D-STEM) data. We apply the approach to a lead iridate, Pb$_2$Ir$_2$O$_7$, and yttrium-stabiliz… ▽ More

    Submitted 16 February, 2022; v1 submitted 15 November, 2020; originally announced November 2020.

    Comments: 27 pages, 6 figures in main manuscript. 6 pages, 5 figures in supplementary. All computer code for electron microscopy simulation and reconstruction included in directory anc. Submitted to Microscopy & Microanalysis

  7. arXiv:2008.12768  [pdf, other

    physics.comp-ph math.OC

    Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone

    Authors: Philipp M Pelz, Hamish G Brown, Jim Ciston, Scott D Findlay, Yaqian Zhang, Mary Scott, Colin Ophus

    Abstract: Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailability of wavefront shaping optics, and the highly nonlinear inversion required from intensity-only measurements. In this work, we present a new algorithm using the scattering matrix formalism to solve the scattering from a… ▽ More

    Submitted 28 August, 2020; originally announced August 2020.

    Journal ref: Phys. Rev. Research 3, 023159 (2021)

  8. arXiv:2002.01595  [pdf, other

    cond-mat.mtrl-sci

    Suppressing dynamical diffraction artefacts in differential phase contrast scanning transmission electron microscopy of long-range electromagnetic fields via precession

    Authors: T. Mawson, A. Nakamura, T. C. Petersen, N. Shibata, H. Sasaki, D. M. Paganin, M. J. Morgan, S. D. Findlay

    Abstract: In differential phase contrast scanning transmission electron microscopy (DPC-STEM), variability in dynamical diffraction resulting from changes in sample thickness and local crystal orientation (due to sample bending) can produce contrast comparable to that arising from the long-range electromagnetic fields probed by this technique. Through simulation we explore the scale of these dynamical diffr… ▽ More

    Submitted 4 February, 2020; originally announced February 2020.

    Comments: 12 pages, 9 figures, submitted to Ultramicroscopy

  9. Structure retrieval at atomic resolution in the presence of multiple scattering of the electron probe

    Authors: Hamish G. Brown, Zhen Chen, Matthew Weyland, Colin Ophus, Jim Ciston, Les J. Allen, Scott D. Findlay

    Abstract: The projected electrostatic potential of a thick crystal is reconstructed at atomic-resolution from experimental scanning transmission electron microscopy data recorded using a new generation fast- readout electron camera. This practical and deterministic inversion of the equations encapsulating multiple scattering that were written down by Bethe in 1928 removes the restriction of established meth… ▽ More

    Submitted 26 September, 2018; originally announced September 2018.

    Comments: 6 pages, 3 figures

    Journal ref: Phys. Rev. Lett. 121, 266102 (2018)

  10. Probing the limits of the rigid-intensity-shift model in differential phase contrast scanning transmission electron microscopy

    Authors: L. Clark, H. G. Brown, D. M. Paganin, M. J. Morgan, T. Matsumoto, N. Shibata, T. C. Petersen, S. D. Findlay

    Abstract: The rigid-intensity-shift model of differential phase contrast scanning transmission electron microscopy (DPC-STEM) imaging assumes that the phase gradient imposed on the probe by the sample causes the diffraction pattern intensity to shift rigidly by an amount proportional to that phase gradient. This behaviour is seldom realised exactly in practice. Through a combination of experimental results,… ▽ More

    Submitted 18 January, 2018; originally announced January 2018.

    Comments: 13 pages

    Journal ref: Phys. Rev. A 97, 043843 (2018)

  11. Spectroscopic imaging of single atoms within a bulk solid

    Authors: M. Varela, S. D. Findlay, A. R. Lupini, H. M. Christen, A. Y. Borisevich, N. Dellby, O. L. Krivanek, P. D. Nellist, M. P. Oxley, L. J. Allen, S. J. Pennycook, .

    Abstract: The ability to localize, identify and measure the electronic environment of individual atoms will provide fundamental insights into many issues in materials science, physics and nanotechnology. We demonstrate, using an aberration-corrected scanning transmission microscope, the spectroscopic imaging of single La atoms inside CaTiO3. Dynamical simulations confirm that the spectroscopic information… ▽ More

    Submitted 28 January, 2004; v1 submitted 9 January, 2004; originally announced January 2004.

    Comments: 4 pages and 3 figures. Accepted in Phys.Rev.Lett