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Showing 1–2 of 2 results for author: De Smet, K

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  1. arXiv:2011.11719  [pdf, other

    eess.IV cs.CV

    Explainable-by-design Semi-Supervised Representation Learning for COVID-19 Diagnosis from CT Imaging

    Authors: Abel Díaz Berenguer, Hichem Sahli, Boris Joukovsky, Maryna Kvasnytsia, Ine Dirks, Mitchel Alioscha-Perez, Nikos Deligiannis, Panagiotis Gonidakis, Sebastián Amador Sánchez, Redona Brahimetaj, Evgenia Papavasileiou, Jonathan Cheung-Wai Chana, Fei Li, Shangzhen Song, Yixin Yang, Sofie Tilborghs, Siri Willems, Tom Eelbode, Jeroen Bertels, Dirk Vandermeulen, Frederik Maes, Paul Suetens, Lucas Fidon, Tom Vercauteren, David Robben , et al. (15 additional authors not shown)

    Abstract: Our motivating application is a real-world problem: COVID-19 classification from CT imaging, for which we present an explainable Deep Learning approach based on a semi-supervised classification pipeline that employs variational autoencoders to extract efficient feature embedding. We have optimized the architecture of two different networks for CT images: (i) a novel conditional variational autoenc… ▽ More

    Submitted 2 September, 2021; v1 submitted 23 November, 2020; originally announced November 2020.

  2. arXiv:2010.04103  [pdf

    cond-mat.mtrl-sci

    Towards twin-free molecular beam epitaxy of 2D chalcogenides explained by stronger interlayer van der Waals coupling

    Authors: Wouter Mortelmans, Karel De Smet, Ruishen Meng, Michel Houssa, Stefan De Gendt, Marc Heyns, Clement Merckling

    Abstract: Defect-free epitaxial growth of 2D materials is one of the holy grails for a successful integration of van der Waals (vdW) materials in the semiconductor industry. The large-area (quasi-)vdW epitaxy of layered 2D chalcogenides is consequently carefully being researched since these materials hold very promising properties for future nanoelectronic applications. The formation of defects such as stac… ▽ More

    Submitted 8 October, 2020; originally announced October 2020.