Showing 1–6 of 6 results for author: Danaie, M

Characterization of Nanostructural Imperfections in Superconducting Quantum Circuits

Authors: Mohammed Alghadeer, Simone D Fasciati, Shuxiang Cao, Michele Piscitelli, Matthew C. Spink, David G. Hopkinson, Mohsen Danaie, Susannah C. Speller, Peter J. Leek, Mustafa Bakr

Abstract: Decoherence in superconducting quantum circuits, caused by loss mechanisms like material imperfections and two-level system (TLS) defects, remains a major obstacle to improving the performance of quantum devices. In this work, we present atomic-level characterization of cross-sections of a Josephson junction and a spiral resonator to assess the quality of critical interfaces. Employing scanning tr… ▽ More Decoherence in superconducting quantum circuits, caused by loss mechanisms like material imperfections and two-level system (TLS) defects, remains a major obstacle to improving the performance of quantum devices. In this work, we present atomic-level characterization of cross-sections of a Josephson junction and a spiral resonator to assess the quality of critical interfaces. Employing scanning transmission electron microscopy (STEM) combined with energy-dispersive X-ray spectroscopy (EDS) and electron-energy loss spectroscopy (EELS), we identify structural imperfections associated with oxide layer formation and carbon-based contamination, and correlate these imperfections to the patterning and etching steps in the fabrication process and environmental exposure. These results suggest that TLS imperfections at critical interfaces significantly contribute to limiting device performance, emphasizing the need for an improved fabrication process. △ Less

Submitted 28 May, 2025; v1 submitted 24 January, 2025; originally announced January 2025.

Direct TEM observation and quantification of the Gibbs-Thomson effect in a nickel superalloy

Authors: Chryssanthi Papadaki, Wei Li, Christopher S. Allen, Mohsen Danaie, León Romano Brandt, Alexander M. Korsunsky

Abstract: Gibbs-Thompson effect is the general term referring to the influence of interfaces on the course of phase transformations such as precipitation or solidification. Whilst attention is most often focused on the Gibbs-Thomson effect on nucleation, growth and coarsening, the present study considers the reverse process of precipitate dissolution in a nickel-base superalloy during in situ TEM observatio… ▽ More Gibbs-Thompson effect is the general term referring to the influence of interfaces on the course of phase transformations such as precipitation or solidification. Whilst attention is most often focused on the Gibbs-Thomson effect on nucleation, growth and coarsening, the present study considers the reverse process of precipitate dissolution in a nickel-base superalloy during in situ TEM observation. The presence of several distinct populations of gamma-prime precipitates (primary, secondary, tertiary and grain boundary) allows the differences due to particle size to be quantified and interpreted. Important implications arise for the selection of heat treatment schedules for nickel-base superalloys and other alloy systems. △ Less

Submitted 5 October, 2022; originally announced October 2022.

Comments: 9 pages, 4 Figures

The mechanism of twin thickening and the elastic strain state of TWIP steel nanotwins

Authors: T W J Kwok, T P McAuliffe, A K Ackerman, B H Savitzky, M Danaie, C Ophus, D Dye

Abstract: A Twinning Induced Plasticity (TWIP) steel with a nominal composition of Fe-16.4Mn-0.9C-0.5Si-0.05Nb-0.05V was deformed to an engineering strain of 6\%. The strain around the deformation twins were mapped using the 4D-STEM technique. Strain mapping showed a large average elastic strain of approximately 6\% in the directions parallel and perpendicular to the twinning direction. However, the large a… ▽ More A Twinning Induced Plasticity (TWIP) steel with a nominal composition of Fe-16.4Mn-0.9C-0.5Si-0.05Nb-0.05V was deformed to an engineering strain of 6\%. The strain around the deformation twins were mapped using the 4D-STEM technique. Strain mapping showed a large average elastic strain of approximately 6\% in the directions parallel and perpendicular to the twinning direction. However, the large average strain comprised of several hot spots of even larger strains of up to 12\%. These hot spots could be attributed to a high density of sessile Frank dislocations on the twin boundary and correspond to shear stresses of 1--1.5 GPa. The strain and therefore stress fields are significantly larger than other materials known to twin and are speculated to be responsible for the early thickness saturation of TWIP steel nanotwins. The ability to keep twins extremely thin helps improve grain fragmentation, \textit{i.e.} the dynamic Hall-Petch effect, and underpins the large elongations and strain hardening rates in TWIP steels. △ Less

Submitted 30 September, 2022; originally announced September 2022.

Versatile Domain Mapping Of Scanning Electron Nanobeam Diffraction Datasets Utilising Variational AutoEncoders and Decoder-Assisted Latent-Space Clustering

Authors: Andy Bridger, William I. F. David, Thomas J. Wood, Mohsen Danaie, Keith T. Butler

Abstract: Advancements in fast electron detectors have enabled the statistically significant sampling of crystal structures on the nanometre scale by means of Scanning Electron Nanobeam Diffraction (SEND). Characterisation of structural similarity across this length scale is key to bridging the gap between local atomic structure (using atomic resolution techniques such as High Resolution Scanning Transmissi… ▽ More Advancements in fast electron detectors have enabled the statistically significant sampling of crystal structures on the nanometre scale by means of Scanning Electron Nanobeam Diffraction (SEND). Characterisation of structural similarity across this length scale is key to bridging the gap between local atomic structure (using atomic resolution techniques such as High Resolution Scanning Transmission Electron Microscopy (HR-STEM)) and the macro-scale (using bulk techniques such as powder X-ray and neutron diffraction). The use of SEND technique allows for structural investigation of a broad range of samples, due to the techniques ability to operate with low electron dosage and its tolerance for sample thickness, relative to HR-STEM. This, coupled with the capacity for data collection over a wide areas and the automation of this collection, allows for statistically representative sampling of the microstructure. Also due to these factors, SEND generates large datasets and as a result automated/ semi-automated data processing workflows are required to aid in maximal extraction of useful information. As such, this paper outlines a versatile, data-driven approach for producing domain maps, as well as a statistical approach for assessing their applicability. The production of such domain maps for a dataset can help highlight nuance in the microstructure, as well as improve the manageability of that dataset for further investigation. The workflow outlined utilises a Variational AutoEncoder to identify and learn the sources of variance in the diffraction signal and this, in combination with clustering techniques, is used to produce domain maps for a set of varied example cases. This approach: is agnostic to domain crystallinity; requires no prior knowledge of crystal structure; and does not require the, potentially prohibitive, simulation of a library of appropriate diffraction patterns. △ Less

Submitted 27 July, 2022; originally announced July 2022.

4D-STEM elastic stress state characterisation of a TWIP steel nanotwin

Authors: T P McAuliffe, A K Ackerman, B H Savitzky, T W J Kwok, M Danaie, C Ophus, D Dye

Abstract: We measure the stress state in and around a deformation nanotwin in a twinning-induced plasticity (TWIP) steel. Using four-dimensional scanning transmission electron microscopy (4D-STEM), we measure the elastic strain field in a 68.2-by-83.1 nm area of interest with a scan step of 0.36 nm and a diffraction limit resolution of 0.73 nm. The stress field in and surrounding the twin matches the form e… ▽ More We measure the stress state in and around a deformation nanotwin in a twinning-induced plasticity (TWIP) steel. Using four-dimensional scanning transmission electron microscopy (4D-STEM), we measure the elastic strain field in a 68.2-by-83.1 nm area of interest with a scan step of 0.36 nm and a diffraction limit resolution of 0.73 nm. The stress field in and surrounding the twin matches the form expected from analytical theory and is on the order of 15 GPa, close to the theoretical strength of the material. We infer that the measured back-stress limits twin thickening, providing a rationale for why TWIP steel twins remain thin during deformation, continuously dividing grains to give substantial work hardening. Our results support modern mechanistic understanding of the influence of twinning on crack propagation and embrittlement in TWIP steels. △ Less

Submitted 20 October, 2020; v1 submitted 8 April, 2020; originally announced April 2020.

Comments: After peer review comments and resubmission

Radiation Damage and Thermal Recovery of Perovskite Superconductor Yttrium Barium Copper Oxide

Authors: A. Khobnya, M. E. Pek, G. Greaves, M. Danaie, G. D. Brittles, S. E. Donnelly, F. Schoofs, A. Reilly, P. D. Edmondson, S. Pedrazzini

Abstract: High temperature superconducting materials are being considered to generate the magnetic fields required for the confinement of plasma in fusion reactors. The present study aims to assess the microstructural degradation resulting from ion implantation at room temperature under two implantation conditions in Yttrium Barium Copper Oxide (YBCO) tapes. Xray Diffraction (XRD) and high resolution charac… ▽ More High temperature superconducting materials are being considered to generate the magnetic fields required for the confinement of plasma in fusion reactors. The present study aims to assess the microstructural degradation resulting from ion implantation at room temperature under two implantation conditions in Yttrium Barium Copper Oxide (YBCO) tapes. Xray Diffraction (XRD) and high resolution characterisation techniques including Atom Probe Tomography (APT) and Transmission Electron Microscopy (TEM) analyses were used to correlate alterations in superconducting behaviour measured using a Magnetic Properties Measurement System (MPMS) to amorphization and recovery caused by ion implantation. TEM analysis was performed to depth profile the degree of crystallinity (or lack thereof) on irradiated samples. SRIM predicted the damage depth at 900 nm below the sample surface of the 2 MeV Xe implanted sample and 450 nm beneath the surface of the 0.6 MeV Xe implanted sample. 2 MeV Xe implantation caused the superconducting temperature to decrease by 10 K and the critical current density to display a 10 fold reduction. Post irradiation heat treatments up to 600C caused recrystallisation of the irradiated layer, but also oxygen loss and alterations in grain size. The recrystallised grain orientation was random in TEM lamellae, however, bulk samples re-grew along the original crystal orientation provided that some of the original material was not amorphized (ie if they nucleated on crystalline YBCO). This is extremely promising for the thermal recovery of tokamak components. △ Less

Submitted 10 March, 2020; v1 submitted 24 October, 2018; originally announced October 2018.