Transient lensing from a photoemitted electron gas imaged by ultrafast electron microscopy
Authors:
Omid Zandi,
Allan E Sykes,
Ryan D Cornelius,
Frank M Alcorn,
Brandon Zerbe,
Phillip M Duxbury,
Bryan W Reed,
Renske M van der Veen
Abstract:
Understanding and controlling ultrafast non-equilibrium charge carrier dynamics is of fundamental importance in diverse fields of (quantum) science and technology. Here, we create a three-dimensional hot electron gas through two-photon photoemission from a copper surface in vacuum. We employ an ultrafast electron microscope to record movies of the subsequent electron dynamics on the picosecond-nan…
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Understanding and controlling ultrafast non-equilibrium charge carrier dynamics is of fundamental importance in diverse fields of (quantum) science and technology. Here, we create a three-dimensional hot electron gas through two-photon photoemission from a copper surface in vacuum. We employ an ultrafast electron microscope to record movies of the subsequent electron dynamics on the picosecond-nanosecond time scale. After a prompt Coulomb explosion, the subsequent dynamics is characterized by a rapid oblate-to-prolate shape transformation of the electron gas, and exceptionally periodic and long-lived electron cyclotron oscillations inside the magnetic field of the objective lens. In this regime, the collective behavior of the oscillating electrons causes a transient, mean-field lensing effect and pronounced distortions in the images. We derive an analytical expression for the time-dependent focal length of the electron-gas lens, and perform numerical electron dynamics and probe image simulations to determine the role of Coulomb self-fields and image charges. This work paves the way for the direct visualization of cyclotron oscillations inside two-dimensional electron-gas materials and the elucidation of electron/plasma dynamics and properties that could benefit the development of high-brightness electron and X-ray sources.
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Submitted 5 January, 2020;
originally announced January 2020.
