Mid-infrared dispersion relations in InP based photonic crystal slabs revealed by Fourier-transform angle-resolved reflection spectroscopy
Authors:
Siti Chalimah,
Yuanzhao Yao,
Naoki Ikeda,
Kei Kaneko,
Rei Hashimoto,
Tsutomu Kakuno,
Shinji Saito,
Takashi Kuroda,
Yoshimasa Sugimoto,
Kazuaki Sakoda
Abstract:
Photonic crystals (PCs) offer unique ways to control light-matter interactions. The measurement of dispersion relations is a fundamental prerequisite if we are to create novel functionalities in PC devices. Angle-resolved spectroscopic techniques are commonly used for characterizing PCs that work in the visible and near-infrared regions. However, the techniques cannot be applied to the mid- and lo…
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Photonic crystals (PCs) offer unique ways to control light-matter interactions. The measurement of dispersion relations is a fundamental prerequisite if we are to create novel functionalities in PC devices. Angle-resolved spectroscopic techniques are commonly used for characterizing PCs that work in the visible and near-infrared regions. However, the techniques cannot be applied to the mid- and long-wavelength infrared regions due to the limited sensitivity of infrared detectors. Here, we propose an alternative approach to measuring infrared dispersion relations. We construct a high-precision angle-resolved setup compatible with a Fourier-transform spectrometer with an angle resolution as high as 0.3 degrees. Hence, the reflection spectra are mapped to the 2D photonic band structures of In(Ga,Al)As/InP based PC slabs, which are designed as mid-infrared PC surface-emitting lasers. We identify complex PC modes with the aid of polarization selection rules derived by the group theory. Spectral analysis makes it possible to evaluate the mode quality (Q) factors. Therefore, angle-resolved reflection is a useful way of optimizing 2D PC parameters for mid-infrared devices.
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Submitted 3 June, 2021;
originally announced June 2021.
Apparatus for high-precision angle-resolved reflection spectroscopy in the mid-infrared region
Authors:
Takashi Kuroda,
Siti Chalimah,
Yuanzhao Yao,
Naoki Ikeda,
Yoshimasa Sugimoto,
Kazuaki Sakoda
Abstract:
Fourier transform (FT) spectroscopy is a versatile technique for studying the infrared (IR) optical response of solid-, liquid-, and gas-phase samples. In standard FT-IR spectrometers, a light beam passing through a Michelson interferometer is focused onto a sample with condenser optics. This design enables us to examine relatively small samples, but the large solid angle of the focused infrared b…
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Fourier transform (FT) spectroscopy is a versatile technique for studying the infrared (IR) optical response of solid-, liquid-, and gas-phase samples. In standard FT-IR spectrometers, a light beam passing through a Michelson interferometer is focused onto a sample with condenser optics. This design enables us to examine relatively small samples, but the large solid angle of the focused infrared beam makes it difficult to analyze angle-dependent characteristics. Here we design and construct a high-precision angle-resolved reflection setup compatible with a commercial FT-IR spectrometer. Our setup converts the focused beam into an achromatically collimated beam with an angle dispersion as high as 0.25$^\circ$. The setup also permits us to scan the incident angle over ~8$^\circ$ across zero (normal incidence). The beam diameter can be reduced to ~1 mm, which is limited by the sensitivity of an HgCdTe detector. The small-footprint apparatus is easily installed in an FT-IR sample chamber. As a demonstration of the capability of our reflection setup we measure the angle-dependent mid-infrared reflectance of two-dimensional photonic crystal slabs and determine the in-plane dispersion relation in the vicinity of the $Γ$ point in momentum space. We observe the formation of photonic Dirac cones, i.e., linear dispersions with an accidental degeneracy at $Γ$, in an ideally designed sample. Our apparatus is useful for characterizing various systems that have a strong in-plane anisotropy, including photonic crystal waveguides, plasmonic metasurfaces, and molecular crystalline films.
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Submitted 27 April, 2020;
originally announced April 2020.