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Showing 1–6 of 6 results for author: Baeuerle, S

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  1. arXiv:2505.03560  [pdf, other

    cs.LG cs.AI

    Rapid AI-based generation of coverage paths for dispensing applications

    Authors: Simon Baeuerle, Ian F. Mendonca, Kristof Van Laerhoven, Ralf Mikut, Andreas Steimer

    Abstract: Coverage Path Planning of Thermal Interface Materials (TIM) plays a crucial role in the design of power electronics and electronic control units. Up to now, this is done manually by experts or by using optimization approaches with a high computational effort. We propose a novel AI-based approach to generate dispense paths for TIM and similar dispensing applications. It is a drop-in replacement for… ▽ More

    Submitted 6 May, 2025; originally announced May 2025.

  2. arXiv:2405.13512  [pdf, other

    eess.SY cs.LG

    Coverage Path Planning for Thermal Interface Materials

    Authors: Simon Baeuerle, Andreas Steimer, Ralf Mikut

    Abstract: Thermal management of power electronics and Electronic Control Units is crucial in times of increasing power densities and limited assembly space. Electric and autonomous vehicles are a prominent application field. Thermal Interface Materials are used to transfer heat from a semiconductor to a heatsink. They are applied along a dispense path onto the semiconductor and spread over its entire surfac… ▽ More

    Submitted 22 May, 2024; originally announced May 2024.

  3. arXiv:2404.15436  [pdf, other

    cs.CV

    Iterative Cluster Harvesting for Wafer Map Defect Patterns

    Authors: Alina Pleli, Simon Baeuerle, Michel Janus, Jonas Barth, Ralf Mikut, Hendrik P. A. Lensch

    Abstract: Unsupervised clustering of wafer map defect patterns is challenging because the appearance of certain defect patterns varies significantly. This includes changing shape, location, density, and rotation of the defect area on the wafer. We present a harvesting approach, which can cluster even challenging defect patterns of wafer maps well. Our approach makes use of a well-known, three-step procedure… ▽ More

    Submitted 23 April, 2024; originally announced April 2024.

  4. arXiv:2309.15521  [pdf, other

    cs.LG cs.CV eess.IV

    MLOps for Scarce Image Data: A Use Case in Microscopic Image Analysis

    Authors: Angelo Yamachui Sitcheu, Nils Friederich, Simon Baeuerle, Oliver Neumann, Markus Reischl, Ralf Mikut

    Abstract: Nowadays, Machine Learning (ML) is experiencing tremendous popularity that has never been seen before. The operationalization of ML models is governed by a set of concepts and methods referred to as Machine Learning Operations (MLOps). Nevertheless, researchers, as well as professionals, often focus more on the automation aspect and neglect the continuous deployment and monitoring aspects of MLOps… ▽ More

    Submitted 4 October, 2023; v1 submitted 27 September, 2023; originally announced September 2023.

    Comments: 21 pages, 5 figures , 33. Workshop on Computational Intelligence Berlin Germany

  5. arXiv:2208.04045  [pdf, other

    cs.LG

    Rapid Flow Behavior Modeling of Thermal Interface Materials Using Deep Neural Networks

    Authors: Simon Baeuerle, Marius Gebhardt, Jonas Barth, Andreas Steimer, Ralf Mikut

    Abstract: Thermal Interface Materials (TIMs) are widely used in electronic packaging. Increasing power density and limited assembly space pose high demands on thermal management. Large cooling surfaces need to be covered efficiently. When joining the heatsink, previously dispensed TIM spreads over the cooling surface. Recommendations on the dispensing pattern exist only for simple surface geometries such as… ▽ More

    Submitted 9 August, 2022; v1 submitted 8 August, 2022; originally announced August 2022.

    Comments: This work has been submitted to the IEEE for possible publication

  6. arXiv:2009.12312  [pdf, other

    cs.CV

    CAD2Real: Deep learning with domain randomization of CAD data for 3D pose estimation of electronic control unit housings

    Authors: Simon Baeuerle, Jonas Barth, Elton Renato Tavares de Menezes, Andreas Steimer, Ralf Mikut

    Abstract: Electronic control units (ECUs) are essential for many automobile components, e.g. engine, anti-lock braking system (ABS), steering and airbags. For some products, the 3D pose of each single ECU needs to be determined during series production. Deep learning approaches can not easily be applied to this problem, because labeled training data is not available in sufficient numbers. Thus, we train sta… ▽ More

    Submitted 25 September, 2020; originally announced September 2020.

    Comments: Proc. 30. Workshop Computational Intelligence, Berlin, 2020

    ACM Class: I.2.10; I.4.8