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Computer Science > Computer Vision and Pattern Recognition

arXiv:2504.00270 (cs)
[Submitted on 31 Mar 2025]

Title:NeRF-Based defect detection

Authors:Tianqi (Kirk)Ding, Dawei Xiang, Yijiashun Qi, Ze Yang, Zunduo Zhao, Tianyao Sun, Pengbin Feng, Haoyu Wang
View a PDF of the paper titled NeRF-Based defect detection, by Tianqi (Kirk) Ding and 7 other authors
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Abstract:The rapid growth of industrial automation has highlighted the need for precise and efficient defect detection in large-scale machinery. Traditional inspection techniques, involving manual procedures such as scaling tall structures for visual evaluation, are labor-intensive, subjective, and often hazardous. To overcome these challenges, this paper introduces an automated defect detection framework built on Neural Radiance Fields (NeRF) and the concept of digital twins. The system utilizes UAVs to capture images and reconstruct 3D models of machinery, producing both a standard reference model and a current-state model for comparison. Alignment of the models is achieved through the Iterative Closest Point (ICP) algorithm, enabling precise point cloud analysis to detect deviations that signify potential defects. By eliminating manual inspection, this method improves accuracy, enhances operational safety, and offers a scalable solution for defect detection. The proposed approach demonstrates great promise for reliable and efficient industrial applications.
Comments: 6 pages, 11 figures, 2025 2nd International Conference on Remote Sensing, Mapping and Image Processing (RSMIP 2025)
Subjects: Computer Vision and Pattern Recognition (cs.CV)
Cite as: arXiv:2504.00270 [cs.CV]
  (or arXiv:2504.00270v1 [cs.CV] for this version)
  https://doi.org/10.48550/arXiv.2504.00270
arXiv-issued DOI via DataCite

Submission history

From: Tianqi Ding [view email]
[v1] Mon, 31 Mar 2025 22:27:51 UTC (508 KB)
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