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Statistics > Methodology

arXiv:1704.07865 (stat)
[Submitted on 25 Apr 2017]

Title:Robust Estimators and Test-Statistics for One-Shot Device Testing Under the Exponential Distribution

Authors:N. Balakrishnan, E. Castilla, N. Martin, L.Pardo
View a PDF of the paper titled Robust Estimators and Test-Statistics for One-Shot Device Testing Under the Exponential Distribution, by N. Balakrishnan and 2 other authors
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Abstract:This paper develops a new family of estimators, the minimum density power divergence estimators (MDPDEs), for the parameters of the one-shot device model as well as a new family of test statistics, Z-type test statistics based on MDPDEs, for testing the corresponding model parameters. The family of MDPDEs contains as a particular case the maximum likelihood estimator (MLE) considered in Balakrishnan and Ling (2012). Through a simulation study, it is shown that some MDPDEs have a better behavior than the MLE in relation to robustness. At the same time, it can be seen that some Z-type tests based on MDPDEs have a better behavior than the classical Z-test statistic also in terms of robustness.
Subjects: Methodology (stat.ME)
Cite as: arXiv:1704.07865 [stat.ME]
  (or arXiv:1704.07865v1 [stat.ME] for this version)
  https://doi.org/10.48550/arXiv.1704.07865
arXiv-issued DOI via DataCite

Submission history

From: Nirian Martín [view email]
[v1] Tue, 25 Apr 2017 19:02:21 UTC (50 KB)
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